Automatic test system and method of chip

An automatic test system and automatic test technology, applied in the direction of electronic circuit test, measuring electricity, measuring device, etc., can solve the problems of inaccurate test results, long test cycle, time-consuming and labor-intensive inspection of results, etc., and achieve a clear test process Clear, time-saving, and easy-to-operate effects

Pending Publication Date: 2021-06-25
INVENTEC PUDONG TECH CORPOARTION +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In view of the above-mentioned shortcomings of the prior art, the purpose of the present invention is to provide a chip automatic test system and method, which is used to solve the p

Method used

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  • Automatic test system and method of chip
  • Automatic test system and method of chip
  • Automatic test system and method of chip

Examples

Experimental program
Comparison scheme
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Example Embodiment

[0034] Example one

[0035] This embodiment provides an automatic test system of a chip, including:

[0036] The client is used to transmit test instructions for the chip;

[0037] The server, including the motherboard and the chip connected thereto;

[0038] Wherein, the motherboard is configured to receive the test instruction, convert the test instruction into a test file, and transmit the test file to the chip;

[0039] The chip is used to trigger test items related to the test file after receiving the test file, generating the functional test result of the chip, and shares the function test result of the chip to the client through the motherboard. .

[0040] The automatic test system of the chip provided in this embodiment will be described in conjunction with the illustration. See figure 2 Schematic diagram of the principle of automatic test system showing the chip in an embodiment. Such as figure 2 As shown, the automatic test system 2 of the chip includes a client 3 and a ...

Example Embodiment

[0067] Example 2

[0068] This embodiment provides an automatic test method of a chip, an automated test system for a chip, including a client, a server connected to a client, the server includes a motherboard and a chip connected thereto. The automatic test method of the chip includes:

[0069] The client sends a test instruction for the chip;

[0070] The motherboard receives the test instruction, converts the test instruction into a test file, and transmits the test file to the chip;

[0071] After receiving the test file, the chip triggers test items related to the test file, generating the function test result of the chip;

[0072] The motherboard shares the functional test results of the chip to the client.

[0073] The simultaneous test method of the chip provided in this embodiment will be described in detail below. See image 3 The flow schematic of the automatic test method of the chip is shown in an embodiment. The automatic test method of the chip of the present embodim...

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Abstract

The invention provides an automatic test system and method for a chip. The system comprises a client which is used for transmitting a test instruction for the chip, and a server which comprises a mainboard and the chip connected with the mainboard, wherein the mainboard is used for receiving the test instruction, converting the test instruction into a test file, and transmitting the test file to the chip; and the chip is used for triggering a test item related to the test file after receiving the test file, generating a function test result of the chip, and sharing the function test result of the chip to the client through the mainboard. According to the invention, an existing test method is abandoned, the reliability of a chip test result is improved, and the test time is saved.

Description

technical field [0001] The invention belongs to the technical field of chip testing, and relates to a testing system and method, in particular to a chip automatic testing system and method. Background technique [0002] In the server system, the chip occupies a very special position. There are more and more signals interacting with the chip such as the motherboard CPU, PCH, BMC&VRMS, and the number of control modules inside the chip is also increasing rapidly. In this way, the test of the chip function becomes more and more complicated, such as figure 1 The existing test method shown relies on an oscilloscope to measure signals sequentially, and requires skilled engineers to understand the working mode of the corresponding system before testing can be performed. This method not only tests the ability of the test engineer, but also lengthens the test cycle and takes time to check the results. exhausting. [0003] Therefore, how to provide an automatic chip testing system an...

Claims

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Application Information

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IPC IPC(8): G01R31/28
CPCG01R31/2851G06F13/4282G06F2213/0016G01R31/318508G01R31/287G01R31/3177
Inventor 刘叶
Owner INVENTEC PUDONG TECH CORPOARTION
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