Method and system for testing dynamic random access memory
A test system and dynamic random technology, applied in static memory, instruments, etc., can solve the problems of high test cost and long test algorithm test time, and achieve the effect of shortening test time, improving test capacity and improving test speed.
Active Publication Date: 2021-06-25
深圳市晶存科技有限公司
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Problems solved by technology
[0006] Aiming at the deficiencies of the prior art, the present invention provides a DRAM testing method and system, which solves the problem that the current testing algorithm takes a long time to test and causes high testing costs
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[0033] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0034] see Figure 1-6 , the embodiment of the present invention provides a technical solution: a method for testing a dynamic random access memory, specifically comprising the following steps:
[0035] Step 1, preparatory operation: after the client 1 connects to the test interaction unit 24 through the wireless communication module 2, after logging in to the storage test system 3, the division of the DRAM space is determined by the division determination mod...
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The invention discloses a method and a system for testing a dynamic random access memory. The method specifically comprises the following steps: step 1, preparing operation; step 2, testing data; step 3, performing problem diagnosis; step 4, selecting a median value; step 5, performing problem positioning; and step 6, displaying the record; The invention relates to the technical field of memory testing. According to the method and the system for testing the dynamic random access memory, N test unit modules are divided, and the initial storage information is transmitted to the next test unit module according to the sequence, so that whether the data of the memory is damaged or not can be judged only by comparing whether the data of the Nth unit is consistent with the data written by the first unit or not; all units do not need to be compared, and the test speed can be improved by adopting a storage mode of reading the N-1 unit module data into the N unit module, so that the test time can be shortened, the test capacity can be improved, and the test cost can be effectively reduced.
Description
technical field [0001] The invention relates to the technical field of memory testing, in particular to a testing method and system of a dynamic random access memory. Background technique [0002] DRAM, or Dynamic Random Access Memory, is the most common type of system memory. DRAM can only keep data for a short time. In order to keep data, DRAM uses capacitor storage, so it must be refreshed every once in a while. If the storage unit is not refreshed, the stored information will be lost. [0003] With the development of integrated circuits, the manufacturing is becoming more and more miniaturized, the density of integrated circuits is getting higher and higher, and the speed is getting higher and higher. At the same time, as the density and speed increase, the failure rate of integrated circuits also increases. Especially in DRAM, the error of 1 BIT data cannot be allowed, otherwise the product will cause system crashes, restart application crashes and other bad phenomena ...
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IPC IPC(8): G11C29/36G11C29/38G11C29/56
CPCG11C29/36G11C29/38G11C29/56
Inventor 卢浩
Owner 深圳市晶存科技有限公司