High-temperature piezoelectric measuring device
A measuring device, high-temperature piezoelectric technology, applied in the direction of measuring devices, instruments, scientific instruments, etc., can solve the problem that the measurement parameters are limited to the normal temperature environment
Pending Publication Date: 2021-07-09
武汉佰力博科技有限公司
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Problems solved by technology
[0003] In order to improve the stability and reliability of piezoelectric materials and devices working in high-temperature environments, it is necessary to carry out the evolution behavior and law of piezoelectric properties of piezoelectric materials with temperature. However, the current piezoelectric performance tests are all carried out at room temperature. , resulting in the limitation of the measurement parameters in the normal temperature environment, and the lack of a device for testing the evolution behavior and law of the piezoelectric properties of piezoelectric materials with temperature at high temperatures
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[0031] Preferred embodiments of the present invention are specifically described below in conjunction with the accompanying drawings, wherein the accompanying drawings constitute a part of the application and are used together with the embodiments of the present invention to explain the principle of the present invention, and are not intended to limit the scope of the present invention.
[0032] The invention provides a high temperature piezoelectric measuring device, such as figure 1 and image 3 As shown, it includes a support assembly 1, a force application assembly 2, a pressing assembly 3, and a heating assembly 4. The support assembly 1 includes a housing 11, a bottom plate 12, a top plate 13, a first support plate 14, a second support plate 15 and a third support plate. The support plate 16, the interior of the housing 11 is hollow, the outer wall of the housing 11 is surrounded by a receiving hole 17, the bottom plate 12 is built into the housing 11 and connected to th...
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The invention discloses a high-temperature piezoelectric measuring device. The device comprises a supporting assembly, a force application assembly, a pressing assembly and a heating assembly, wherein the force application assembly is connected to the supporting assembly and is used for applying alternating force to a test sample; the pressing assembly is connected to the supporting assembly and is used for pressing the test sample on the force application assembly; the heating assembly is used for heating the test sample. According to the device, the evolution behavior and rule of the piezoelectric property of the piezoelectric material along with the temperature can be tested.
Description
technical field [0001] The invention relates to the technical field of piezoelectric measurement, in particular to a high-temperature piezoelectric measurement device. Background technique [0002] The temperature stability of piezoelectric materials is a key factor that determines the reliability and service life of key piezoelectric devices such as piezoelectric sensors, drivers, and transducers in high-temperature service environments. [0003] In order to improve the stability and reliability of piezoelectric materials and devices working in high-temperature environments, it is necessary to carry out the evolution behavior and law of piezoelectric properties of piezoelectric materials with temperature. However, the current piezoelectric performance tests are all carried out at room temperature. , resulting in the limitation of the measurement parameters in the normal temperature environment, and the lack of devices for testing the evolution behavior and law of the piezoe...
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IPC IPC(8): G01N33/00
CPCG01N33/00
Inventor 方辉
Owner 武汉佰力博科技有限公司