Photoelectric parameter multi-stress online test platform

Abstract

The invention discloses a photoelectric parameter multi-stress online test platform, which comprises a vibration table, a multi-stress loading mechanism and an integrating sphere. The vibration table is used for loading vibration stress for the whole test platform; the integrating sphere is used for measuring photoelectric parameters; the multi-stress loading mechanism comprises a circular temperature control table, an integrating sphere connecting part, an aluminum-based circuit board and a rotary optical splitter; one end of the circular temperature control table is connected with the power output end of the vibration table, the aluminum-based circuit board is arranged at the other end of the circular temperature control table in a wall attaching mode, the rotary optical splitter is arranged at the position opposite to the aluminum-based circuit board, the rotary optical splitter is in power connection with a rotary stepping motor, and the rotary stepping motor drives the rotary optical splitter to rotate; the rotary optical splitter is provided with a movable stepping motor which is used for adjusting the distance between the rotary optical splitter and the aluminum-based circuit board; the integrating sphere connecting part is sleeved outside the circular temperature control table and is connected with a window of the integrating sphere; and the aluminum-based circuit board and the rotary optical splitter are both arranged inside the integrating sphere. The platform can complete on-line measurement of LED photoelectric parameters under complete coupling loading of temperature, vibration and current.

Description

technical field [0001] The invention belongs to the technical field of testing, in particular to a small-scale multi-stress composite loading online testing system aimed at measuring LED photoelectric parameters. Background technique [0002] For semiconductor light emitting diodes (light emitting diodes, LEDs) with a theoretical lifespan of 25,000 hours, using the life test method of traditional lighting products, LED lighting products need to be tested for no less than 6,000 hours, and every 1,000 hours at an ambient temperature of 25 ℃, rated current (voltage) conditions to record photometric parameters, which is obviously a great loss of human, material and financial resources for quality inspection agencies and manufacturers. In order to shorten the life test time, the accelerated life test accelerates the aging of the product by increasing the stress without changing the failure mechanism, so as to obtain the failure information of the product in a short time, and then...

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Problems solved by technology

Such a test method, from the perspective of simulating the aging of the LED, the aging process of the LED is interrupted from time to time, and there are principle errors; in addition, the accelerated stress device is separated from the photoelectric parameter testing equipment, and it is difficult to directly complete the complete testing of the LED chip under test on the photoelectric testing equipment. Multiple stress coupling

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