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P-type semi-stacked subthreshold standard cell based on Schmidt trigger circuit

A technology of Schmitt trigger and standard cell, which is applied in the direction of logic circuit with logic function, field effect transistor reliability improvement, reliability improvement modification, etc., can solve the problems of stability and reliability not being improved, and achieve Improve the effect of stability and reliability, high stability and reliability, low leakage current and delay

Active Publication Date: 2021-08-31
COLLEGE OF SCI & TECH NINGBO UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the circuit structure of the logic gate has not changed, and its stability and reliability have not been improved.

Method used

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  • P-type semi-stacked subthreshold standard cell based on Schmidt trigger circuit
  • P-type semi-stacked subthreshold standard cell based on Schmidt trigger circuit
  • P-type semi-stacked subthreshold standard cell based on Schmidt trigger circuit

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0022] Embodiment one: if Figure 1 to Figure 4 As shown, a P-type semi-stacked sub-threshold standard cell based on a Schmitt trigger circuit includes a pull-up network, a pull-down network, a gate feedback PMOS stack module, and a parallel NMOS module group; the pull-up network consists of n PMOS transistors Composed in series, n is an integer greater than or equal to 2, and the source of the first PMOS transistor is connected to the power supply V DD, the drain of the mth PMOS transistor is connected to the source of the m+1th PMOS transistor and its connection terminal is the mth stack node Um of the pull-up network, m=1, 2,..., n-1, the The drain of n PMOS transistors is the output terminal of the pull-up network, the gate of the kth PMOS transistor is the kth input terminal of the pull-up network, k=1, 2,..., n; the pull-down network is connected in parallel by n NMOS transistors Composition, the drains of n NMOS transistors are connected and their connection ends are t...

Embodiment 2

[0025] Embodiment 2: This embodiment is basically the same as Embodiment 1, the only difference is that in this embodiment, the output terminal OUT of the P-type semi-stacked sub-threshold standard cell is connected to an inverter, such as Figure 5 As shown, the inverter includes a first PMOS transistor P1, a second PMOS transistor P2, a third PMOS transistor P3, a first NMOS transistor N1, a second NMOS transistor N2 and a third NMOS transistor N3, and the source of the first PMOS transistor P1 The pole is connected to the power supply, the gate of the first PMOS transistor P1, the gate of the second PMOS transistor P2, the gate of the first NMOS transistor N1 and the gate of the second NMOS transistor N2 are connected, and the connection terminal is the inverter The input terminal, the input terminal of the inverter is connected to the output terminal of the P-type semi-stacked sub-threshold standard cell, the drain of the first PMOS transistor P1, the source of the second P...

Embodiment 3

[0027] Embodiment 3: This embodiment is basically the same as Embodiment 1, the only difference is that in this embodiment, the value of n is 3, the pull-up network is composed of 3 PMOS transistors M7, M8 and M9 connected in series, and the pull-down network is composed of 3 NMOS transistors M10, M11 and M12 are connected in parallel, the gate feedback PMOS stack module is composed of two PMOS transistors M13 and M14, and the parallel NMOS module group is composed of two parallel NMOS modules, of which the first parallel NMOS module is composed of one NMOS transistor M15 The second parallel NMOS module is composed of two NMOS transistors M16 and M17. At this time, the P-type semi-stacked sub-threshold standard unit is a three-input NOR gate. The specific circuit is as follows Figure 8 shown.

[0028] In the three-input NOR gate of this embodiment, PMOS transistors M7, M8 and M9, PMOS transistors M13 and M14, NMOS transistors M15, NMOS transistors M16 and M17 are composed of ...

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PUM

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Abstract

The invention discloses a Schmidt trigger circuit-based P-type semi-stacked subthreshold standard cell, and the standard cell comprises a pull-up network, a pull-down network, a grid feedback PMOS stacking module and a parallel NMOS module group; the pull-up network is formed by connecting n PMOS tubes in series and has n-1 stacking nodes, the pull-down network is formed by connecting n NMOS tubes in parallel, the grid feedback PMOS stacking module is formed by n-1 PMOS tubes, and the n-1 PMOS tubes are connected in parallel and have n-1 stacking nodes. The parallel NMOS module group is composed of (n-1) parallel NMOS modules. The standard cell has the advantages that when the grid feedback PMOS stacking module and the parallel NMOS module group are switched on simultaneously, the capacitors at n-1 stacking nodes are discharged, the leakage current of the pull-up network is reduced, and meanwhile, due to the hysteresis characteristic of the Schmidt trigger circuit formed by the pull-up network, the grid feedback PMOS stacking module and the parallel NMOS module group, the reliability of the Schmidt trigger circuit is improved; the VTC curve of the circuit is improved, the switch threshold value of the pull-up network is increased, and the stability and the reliability are improved.

Description

technical field [0001] The invention relates to a standard cell, in particular to a P-type semi-stacked sub-threshold standard cell based on a Schmitt trigger circuit. Background technique [0002] In recent years, with the continuous reduction of process size and the rapid development of integrated circuits, the problem of high energy consumption of chips has gradually become an important factor restricting the development of the mobile terminal market. Sub-threshold circuits are an important development direction of low-power technology. As the power supply voltage decreases, the dynamic power consumption of the circuit decreases quadratically, but the delay of the circuit increases exponentially. At the same time, the subthreshold leakage current also decreases exponentially with the decrease of supply voltage. When the power supply voltage drops to a limit situation, that is, when the power supply voltage is equal to or less than the threshold voltage of the transistor,...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H03K19/20H03K19/003
CPCH03K19/20H03K19/00315
Inventor 杨润萍殷金曙杜世民韩金亮
Owner COLLEGE OF SCI & TECH NINGBO UNIV