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A system test method and device

A technology for system testing and test results, applied in the field of testing, can solve problems such as poor test efficiency and TPC-W test benchmarks not considered, and achieve the effect of improving test efficiency

Active Publication Date: 2021-11-05
武汉迎风聚智科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] It can be understood that the TPC-W test benchmark regulates the test from a theoretical level, but in actual operation, it is necessary to make corresponding test tools within the scope of its specifications and meet the test requirements. Therefore, in the test tool In the research and development work, you may also encounter practical problems that the TPC-W test benchmark has not considered at the theoretical level
[0004] In the research process of the existing related technologies, the inventors found that the existing TPC-W test tool has the problem of poor test efficiency in some test scenarios

Method used

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Embodiment Construction

[0079] The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, but not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative work fall within the protection scope of the present application.

[0080] The terms "first", "second" and the like in the description and claims of the present application and the above drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It is to be understood that data so used may be interchanged under appropriate circumstances so that the embodiments described herein can be practiced in sequences other than those illustrated or described herein. Furthe...

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Abstract

The application provides a system testing method and device, which are used to split the TPC-W test task into two stages, and screen out the system under test that does not meet the TPC-W test benchmark by the preliminary first stage, and then can be used in Improve TPC‑W test efficiency to a certain extent.

Description

technical field [0001] The present application relates to the testing field, in particular to a system testing method and device. Background technique [0002] The TPC-W test benchmark can be understood as a database test for e-commerce environments such as online bookstores, or it can also be called a system test for web service systems, which regulates the types and performance of e-commerce network transactions involved index. [0003] It can be understood that the TPC-W test benchmark regulates the test from a theoretical level, but in actual operation, it is necessary to make corresponding test tools within the scope of its specifications and meet the test requirements. Therefore, in the test tool In the research and development work, there may also be practical problems that the TPC-W test benchmark has not considered at the theoretical level. [0004] However, during the research process of the existing related technologies, the inventors found that the existing TPC...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/36
CPCG06F11/3684G06F11/3688G06F11/3664
Inventor 梁俊杰
Owner 武汉迎风聚智科技有限公司