Simplified test module for missile equipment

Abstract

The invention discloses a simplified test module for missile equipment. The simplified test module comprises a PXI bus I / O card, a missile control box and a missile, wherein the missile control box and the missile are in communication connection with the PXI bus I / O card; the simplified test module is characterized in that the PXI bus I / O card is in communication connection with the missile control box and the missile through the simplified test module; the simplified test module comprises a single-chip microcomputer minimum system which is composed of an embedded 89S2051 single-chip microcomputer and a peripheral circuit of the single-chip microcomputer. Five I / O ports of the single-chip microcomputer are in communication connection with the output end of the PXI bus I / O card, and two I / O ports of the single-chip microcomputer are connected with the information signal input end of the power amplifier module. According to the simplified test module for the missile equipment, peripheral elements are small, the whole size is small, and the PXI serial port card function is completed through ingenious assembly program design.

Description

technical field [0001] The invention relates to a missile equipment test module, in particular to a missile equipment simplified test module, which belongs to the technical field of missile equipment test modules. Background technique [0002] Existing missile launch control device test systems, such as figure 1 As shown in Fig. 1, a system is used to test the launch and control equipment under test after the PXI bus virtual instrument is used as the core, after conditioning the signals of the launch control equipment control box and missiles through the adapter; among them, as figure 2 As shown, for the test system of the missile control box, in the test of the AFT07C launch control equipment, the PXI bus I / O card should output information signals and tracking signals GZA and GZB while sending the angular deviation data to the missile control box through the PXI serial port card. For the missile control box; at the same time, the alternating 110V signal generated when tes...

AI Technical Summary

Problems solved by technology

[0002] Existing missile launch control device test systems, such as figure 1 As shown in Fig. 1, a system is used to test the launch and control equipment under test after the PXI bus virtual instrument is used as the core, after conditioning the signals of the launch control equipment control box and missiles through the adapter; among them, as figure 2 As shown, for the test system of the missile control box, in the test of the AFT07C launch control equipment, the PXI bus I / O card should output information signals and tracking signals GZA and GZB while sending the angular deviation data to the missile control box through the PXI serial port card. For the missile control box; at the same time, the alternating 110V signal generated when testing the missile also needs to be generated by the PXI bus I / O card; since the serial communication and information signal synchronization work needs to be provided at the same time, the PXI serial communication card and the I / O card must be configured at the same time; However, the PXI serial communication card is expensive, and the generation of information signals and alternating 110V signals depends on the programming of the I / O card of the PXI bus. The signal timing coordination between the PXI serial card and the PXI I / O card is complicated; Intensive programming and debugging efforts due to the need for synchronization

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