Chip operation state data screening method

A technology of running status data and running status, applied in the field of data processing, can solve problems such as poor data effect, and achieve the effect of improving poor effect and improving screening effect.

Inactive Publication Date: 2021-12-24
方金花
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[0004] In view of this, the purpose of the present invention is to provide a method for scree

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  • Chip operation state data screening method
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  • Chip operation state data screening method

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[0052] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is only a part of embodiments of the present invention, but not all embodiments. The components of the embodiments of the invention generally described and illustrated in the figures herein may be arranged and designed in a variety of different configurations.

[0053] Accordingly, the following detailed description of the embodiments of the invention provided in the accompanying drawings is not intended to limit the scope of the claimed invention, but merely represents selected embodiments of the invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the a...

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Abstract

The invention provides a chip operation state data screening method, and relates to the technical field of data processing. According to the method, multiple pieces of chip operation state data are received, and each piece of chip operation state data represents the operation state of a target monitoring chip at the moment when target data acquisition equipment acquires the chip operation state data; based on a first screening rule, the multiple pieces of chip operation state data are screened to obtain multiple pieces of first operation state screening data, and a size relationship is determined between the data volume of the multiple pieces of first operation state screening data and a pre-configured data volume threshold; and if it is determined that the data volume of the multiple pieces of first running state screening data is larger than or equal to a data volume threshold value, the multiple pieces of first running state screening data are screened based on a second screening rule to obtain multiple pieces of target chip running state data. Based on the steps, the problem of poor data screening effect in the prior art can be improved.

Description

technical field [0001] The present invention relates to the technical field of data processing, in particular to a method for screening chip operating state data. Background technique [0002] As an important part of electronic equipment, and as an integrated circuit, a chip has many advantages such as small size, so it has very large application scenarios. Therefore, the status data for monitoring the running status of the chip can also have more application scenarios and higher application value. Based on this, in the prior art, the running status of the chip is generally monitored, and then the monitored status data is processed and analyzed. [0003] Among them, in order to improve the efficiency of processing and analyzing the obtained state data and reduce the amount of processed data, etc., the obtained state data is generally screened first. However, the inventor found that in the prior art, one is Performing a screening on the obtained state data may lead to the p...

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Application Information

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IPC IPC(8): G06F11/30
CPCG06F11/3072G06F11/3055
Inventor 方金花潘子健李杰
Owner 方金花
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