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LED epitaxy and manufacturing method thereof

A manufacturing method and epitaxial technology, applied in electrical components, circuits, semiconductor devices, etc., can solve problems such as overflow and low internal quantum efficiency, and achieve the effects of reducing hole overflow, reducing dislocation density, and reducing ineffective recombination

Pending Publication Date: 2021-12-24
FUJIAN PRIMA OPTOELECTRONICS CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

In terms of improving the internal quantum efficiency, the internal quantum efficiency can be improved by means of quantum well energy band design, improving crystal quality, improving the hole injection efficiency of the P-type layer, and improving the electron overflow situation. The bottleneck factor of LED, because the recombination of electrons and holes occurs in the active region is effective recombination, the situation of electron hole overflow often occurs, and the internal quantum efficiency is low

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  • LED epitaxy and manufacturing method thereof
  • LED epitaxy and manufacturing method thereof
  • LED epitaxy and manufacturing method thereof

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Experimental program
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Effect test

Embodiment 1

[0045] Please refer to figure 1 with figure 2 , a LED epitaxial manufacturing method, comprising the steps of:

[0046] S1. Prepare a nitride buffer layer on a patterned substrate.

[0047] Specifically, a nitride buffer layer is prepared on a patterned substrate, and the substrate material includes sapphire (Al2O3) or Si or SiC, etc.;

[0048] Based on the patterned substrate, an AlN buffer layer was plated with AlN sputtering equipment.

[0049] S2. Generating an N-type gallium nitride layer based on the nitride buffer layer.

[0050] Specifically, in this embodiment, an N-type GaN layer is grown in an MOCVD reaction chamber based on the AlN buffer layer, and electrons provided by the N-type GaN layer move toward the P-type GaN layer.

[0051] S3. Alternately generating electron blocking layers and quantum well layers based on the N-type gallium nitride to obtain a composite quantum well layer in which the bottom and top layers are both the electron blocking layers.

...

Embodiment 2

[0061] Please refer to figure 2 , an LED epitaxy, including a patterned substrate, a nitride buffer layer, an N-type gallium nitride layer, a composite quantum well layer and a P-type gallium nitride layer.

[0062] Above the patterned substrate are a nitride buffer layer, an N-type gallium nitride layer, a composite quantum well layer and a P-type gallium nitride layer;

[0063] The composite quantum well layer includes an electron blocking layer and a quantum well layer, the electron blocking layer and the quantum well layer are arranged alternately, and the bottom and top layers of the composite quantum well layer are both electron blocking layers;

[0064] The thickness of the quantum well layer is fixed, the thickness of the electron blocking layer increases along the direction away from the N-type gallium nitride, and the thickness of the electron blocking layer ranges from 1 to 20 nm;

[0065] The material of the electron blocking layer is aluminum nitride, the materi...

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Abstract

The invention discloses an LED epitaxy and a manufacturing method thereof, and the method comprises the steps: preparing a nitride buffer layer on a patterned substrate, and generating an N-type gallium nitride layer on the nitride buffer layer; alternately generating electron barrier layers and quantum well layers based on the N-type gallium nitride layer to obtain a composite quantum well layer of which the bottommost layer and the uppermost layer are the electron barrier layers; and generating a P-type gallium nitride layer based on the composite quantum well layer to obtain an LED epitaxy. Therefore, by adding the electron blocking layer between the quantum wells, the dislocation direction of each quantum well layer can be changed, so that the dislocation density of the quantum well layers is reduced; and moreover, the condition of overflow of electrons of the N-type gallium nitride and holes of the P-type gallium nitride can be reduced, and invalid recombination of the electrons and the holes is reduced, so that the electron-hole recombination efficiency is improved.

Description

technical field [0001] The invention relates to the field of LED manufacturing, in particular to an LED epitaxy and a manufacturing method thereof. Background technique [0002] GaN-based light-emitting diodes (LEDs) have been widely used in lighting, backlight, display and other fields due to their high-efficiency light-emitting performance and low cost. Its basic structure includes an N-type semiconductor layer, an active layer and a P-type semiconductor layer, wherein the electrons provided by the N-type semiconductor layer and the holes provided by the P-type semiconductor layer recombine and emit light in the active layer. The luminous efficiency of this luminescent material is mainly determined by two factors. The first is the radiative recombination efficiency of electrons and holes in the active layer, that is, the internal quantum efficiency; the second is the light extraction efficiency. In terms of improving the internal quantum efficiency, the internal quantum e...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L33/12H01L33/14H01L33/22H01L33/32H01L33/00H01L33/06
CPCH01L33/12H01L33/145H01L33/06H01L33/22H01L33/0066H01L33/0075H01L33/32
Inventor 刘恒山吴永胜解向荣马野王孝智江辉煌
Owner FUJIAN PRIMA OPTOELECTRONICS CO LTD