Signal test analysis device and method

Abstract

The invention discloses a signal test analysis device and method, and the device comprises a signal collection unit which is used for collecting a plurality of signals corresponding to a fault event, a main control unit used for analyzing the signal acquired by the signal collection unit to obtain fault data corresponding to the fault event, and storing the fault data in the storage unit and / or transmitting the fault data to a controller through the communication unit to analyze the fault event, a storage unit used for storing the fault data analyzed by the main control unit, and a communication unit used for transmitting the fault analyzed by the main control unit to a controller. Therefore, the signal test analysis device integrates multi-channel signal acquisition, storage and communication, can perform comprehensive reproduction analysis on the occasional fault of the hardware analog quantity, is convenient to test the occasional fault of the hardware analog quantity, and is low in cost, simple and convenient.

Description

technical field [0001] The present invention relates to the technical field of fault analysis, and more specifically, to a signal test and analysis device and method. Background technique [0002] With the rise of technologies such as artificial intelligence, big data, cloud computing, and edge computing, there are more and more smart cards and computer products for various application scenarios. Test verification is a necessary process to ensure the conversion of hardware projects, and it is also a way to improve quality. In each company, usually the field of computer product testing methods already has relatively deep technical accumulation, and has a series of standardized or automated testing procedures that can cover a large area of ​​product application scenarios; however, in the process of computer product conversion, there will still be some individual For the abnormal hardware analog faults that occur randomly (such as occasional signal abnormalities such as temper...

AI Technical Summary

Problems solved by technology

In each company, usually the field of computer product testing methods already has relatively deep technical accumulation, and has a series of standardized or automated testing processes, which can cover a large area of ​​product application scenarios; however, in the process of computer product conversion, there are still some individual There is a lack of low-cost, simple and convenient test solutions for random abnormal hardware analog faults (such as occasional signal abnormalities such as temperature and voltage).

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