A passive crystal oscillator test circuit
A passive crystal oscillator and test circuit technology, applied in the direction of measuring electricity, measuring electrical variables, single semiconductor device testing, etc., can solve problems such as errors
Active Publication Date: 2022-04-05
SHENZHEN MINIEYE INNOVATION TECH CO LTD
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Problems solved by technology
[0002] When designing and selecting hardware, the indicators and performance parameters of the passive crystal oscillator depend on the product specification. However, in actual situations, the performance of the passive crystal oscillator is often different from the product specification. The performance parameters of the source crystal oscillator may have certain errors
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[0025] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.
[0026] see figure 1 , a passive crystal oscillator test circuit provided by an embodiment of the present invention, comprising: an oscillator drive module 2, a crystal oscillator oscillator module 1, and an oscillator signal output module 3;
[0027] The start-up drive module 2 includes a drive chip U1; the crystal oscillator start-up module 1 includes: a first capacitor C1, a second capacitor C2, a passive crystal oscillator Y1 to be tested, and a first resistor R...
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The invention discloses a passive crystal oscillator test circuit, comprising: an oscillation start-up drive module, a crystal oscillator start-up module, and an oscillation start-up signal output module; the start-up drive module includes a drive chip; the crystal oscillator start-up module includes: a first capacitor, a second Capacitance, the passive crystal oscillator to be tested and the first resistor; the signal input end of the passive crystal oscillator to be tested is connected to the first end of the first resistor, the signal output end is connected to the passive crystal oscillator signal input end of the drive chip, and the ground terminal is grounded; The second end of the first resistor is connected to the passive crystal oscillator signal output end of the drive chip, and the first resistor is externally connected to a current testing device; the first end of the first capacitor is grounded, and the second end is connected to the signal output of the passive crystal oscillator to be tested. The first end of the second capacitor is connected to the ground, and the second end is connected to the first end of the first resistor; the start-up signal output end of the driver chip is connected to the start-up signal output module, and the start-up signal output module is externally connected to an oscilloscope. The performance parameters of the passive crystal oscillator can be tested by implementing the invention.
Description
technical field [0001] The invention relates to the technical field of electronic circuits, in particular to a passive crystal oscillator test circuit. Background technique [0002] When designing and selecting hardware, the indicators and performance parameters of the passive crystal oscillator depend on the product specification. However, in actual situations, the performance of the passive crystal oscillator is often different from the product specification. There may be certain errors in the performance parameters of the source crystal oscillator. Contents of the invention [0003] The embodiment of the present invention provides a passive crystal oscillator test circuit, which can realize the test of the performance parameters of the passive crystal oscillator. [0004] A passive crystal oscillator test circuit according to an embodiment of the present invention includes: an oscillation start-up drive module, a crystal oscillator start-up module, and an oscillation s...
Claims
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IPC IPC(8): G01R31/26
CPCG01R31/2637
Inventor 钱航刘国清杨广王启程聂晓楠谭开荣胡帅王军
Owner SHENZHEN MINIEYE INNOVATION TECH CO LTD