Chip testing method, system, electronic device and storage medium
A technology of chip testing and testing current, which is applied in static memory, instruments, etc., can solve the problem of low chip testing efficiency and achieve the effect of improving efficiency and accuracy
Active Publication Date: 2022-04-26
悦芯科技股份有限公司
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[0004] In view of this, the purpose of the embodiment of the present application is to provide a chip testing method, system, electronic equipment and storage medium, so as to improve the problem of low chip testing efficiency existing in the prior art
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[0067] The following will clearly and completely describe the technical solutions in the embodiments of the present application with reference to the drawings in the embodiments of the present application. Apparently, the described embodiments are only some of the embodiments of the present application, but not all of them. Based on the embodiments of the embodiments of the present application, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the scope of protection of the embodiments of the present application.
[0068] In the existing chip test method, when calibrating the data of the chip, the precision unit of the chip is usually tested and calibrated by using a calibration board and a test instrument, and all channels in the precision unit used when testing the chip are individually calibrated through the calibration board. Select to apply stimulus and measure in a single channel, measure with a test instrume...
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The application provides a chip testing method, system, electronic equipment and storage medium, which relate to the technical field of integrated circuit testing. The method includes: calibrating the initial converter to obtain a target converter, both the initial converter and the target converter are analog-to-digital converters; calibrating the voltage data in the voltage channel of the test chip based on the target converter to obtain a calibration voltage data; based on the calibration voltage data and the target converter, the current data in the current channel of the test chip is calibrated to obtain the calibration current data. This application can use the calibrated converter to calibrate the voltage data and current data obtained during the chip test with high precision and high efficiency, without making a separate calibration board and test instrument to test and calibrate the chip, reducing the need for calibration The operating time is short, and multiple different channels can be tested and calibrated at the same time, which effectively improves the efficiency and accuracy of testing and calibrating the chip.
Description
technical field [0001] The present application relates to the technical field of integrated circuit testing, in particular, to a chip testing method, system, electronic equipment and storage medium. Background technique [0002] Due to the improvement of performances such as capacity and speed of various memory chips, the test performance of memory chip test equipment for testing various memory chips is very important. Memory chip testing equipment is a system that can automatically implement memory chip testing. The test is mainly divided into DC parameter test, AC parameter measurement, functional test, etc. The DC parameter is an important indicator to characterize the performance of the chip. [0003] Existing testing equipment basically adopts PMU (Precision Measurement Unit) to measure DC parameters in two main modes: current pressure measurement and pressure measurement current. It is usually necessary to install a separate calibration board in the precision measure...
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IPC IPC(8): G11C29/56
CPCG11C29/56
Inventor 朴英斗宋秀良刘金海
Owner 悦芯科技股份有限公司