Sample preparation and analysis method for primary and secondary components of seamless silicon-calcium core-spun yarn
An analysis method, cored wire technology, applied in the field of ion emission spectrometry, to achieve the effect of improving efficiency, high accuracy and reliability
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[0018] The technical solutions of the present invention will be further described in detail below in conjunction with specific embodiments.
[0019] This embodiment provides a sample preparation and analysis method for the primary and secondary components of a seamless silicon-calcium cored wire. The silicon powder and the calcium rod in the silicon (silicon powder) calcium (calcium rod) cored wire are physically separated to prepare samples respectively. , use the chemical titration method to measure the silicon content in the silicon powder, use the ICP method to measure the silicon powder Mn, Al, P impurity element content; use the ICP method to measure the content of Al, Mg, Fe and other impurity elements in the calcium rod and calculate the calcium content etc., mainly including the following steps:
[0020] 1. Sample preparation: According to the number of sampling circles, randomly intercept core-spun wire sample sections according to 1 section / circle, and each section ...
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