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ADC chip test circuit and method, test equipment and storage medium

A chip testing and chip technology, applied in testing equipment and storage media, methods, and ADC chip testing circuit fields, can solve the problems of low testing efficiency of ADC chips, and achieve the solution of low testing efficiency, ensuring consistency, and reducing the number of tests. Effect

Pending Publication Date: 2022-03-29
SHENZHEN RENERGY TECH
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Problems solved by technology

[0004] The present invention proposes an ADC chip test circuit, method, test equipment and storage medium, which are used to solve the technical problem of low ADC chip test efficiency in the prior art

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  • ADC chip test circuit and method, test equipment and storage medium
  • ADC chip test circuit and method, test equipment and storage medium
  • ADC chip test circuit and method, test equipment and storage medium

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Embodiment Construction

[0043] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0044] In the exemplary technology, the multi-channel ADC chip generally integrates multiple channels of relatively independent ADC circuits inside. Due to the discreteness of the semiconductor process itself, there may be deviations in the conversion accuracy of each channel sent to the ADC. At the same time, during the analog-to-digital conversion process of each channel, the errors introduced by different analog input quantities are different. These nonlinear er...

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Abstract

The embodiment of the invention discloses an ADC chip test circuit and method, test equipment and a storage medium, and the multi-channel ADC chip test method comprises the steps: obtaining a plurality of analog test signals after voltage division, inputting the plurality of analog test signals into a plurality of ADC branches of a to-be-detected ADC chip in a one-to-one manner, collecting the output signal of each ADC branch, and outputting the output signal of each ADC branch. And determining whether the to-be-detected ADC chip is a good product or not according to the plurality of output signals and a preset first test standard value range. According to the scheme, the technical problem of relatively low ADC chip test efficiency in the prior art is solved.

Description

technical field [0001] The invention relates to the technical field of ADC chip testing, in particular to an ADC chip testing circuit, method, testing equipment and storage medium. Background technique [0002] ADC (Analog-to-Digital Convertor, analog-to-digital converter) is an extremely critical component of the current electrical signal acquisition system. With the rapid development of SOC technology and electrical metering industry in recent years, the performance and quality requirements of ADC are also getting higher and higher. Electric metering ADCs have been widely used in power and energy storage fields such as smart energy meters, charging piles, and energy controllers because they can simultaneously meet the performance requirements of wide voltage, high precision, and high reliability. [0003] How to evaluate the quality of such devices through a fast and effective test method, so as to save test cost and meet test coverage, has become one of the most concerne...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H03M1/10
CPCH03M1/1071
Inventor 苗书立李文标刘凯
Owner SHENZHEN RENERGY TECH
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