Unlock instant, AI-driven research and patent intelligence for your innovation.

Stepped electrode structure based on two-dimensional material transistor and preparation method thereof

A technology of two-dimensional materials and electrode structures, which is applied in transistors, semiconductor/solid-state device manufacturing, circuits, etc., can solve problems such as good side contact of two-dimensional materials and device performance degradation, and achieve improved charge transfer characteristics and good contact characteristics, effects of high mobility

Pending Publication Date: 2022-04-05
HEFEI UNIV OF TECH
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, due to technical reasons, it is difficult to ensure good contact between the metal electrode and the side of each layer of two-dimensional material in the channel, resulting in a decrease in device performance.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Stepped electrode structure based on two-dimensional material transistor and preparation method thereof
  • Stepped electrode structure based on two-dimensional material transistor and preparation method thereof
  • Stepped electrode structure based on two-dimensional material transistor and preparation method thereof

Examples

Experimental program
Comparison scheme
Effect test

preparation example Construction

[0039] A method for preparing a stepped electrode structure based on a two-dimensional material transistor, specifically comprising the following steps:

[0040] Step 1, cleaning the conductive substrate 1, and setting an insulating layer 2 on the conductive substrate 1;

[0041] Step 2, setting a two-dimensional material 4 on the insulating layer 2 of the conductive substrate 1;

[0042] Step 3, spin coating the photoresist on the insulating layer 2 and the two-dimensional material 4;

[0043] Step 4, patterning and photoetching the photoresist 5;

[0044] Step five, etching the two-dimensional material 4 in the channel;

[0045] Step 6, putting the etched sample into an organic solution to remove the photoresist 5;

[0046] Step seven, repeat steps three to six according to the total number of layers of the two-dimensional material 4, so that the electrodes are in contact with the upper surface of each layer of the two-dimensional material 4, and the contact surfaces of t...

Embodiment

[0061] MoS 2 Preparation of transistor step electrodes:

[0062] 1. Select a P++ type Si substrate with a thickness of 500um, and grow 285nm SiO on the surface by thermal oxidation 2 , as an insulating layer.

[0063] 2. Transfer 3 layers of MoS by tape peeling 2 to the insulating layer of the substrate.

[0064] 3. Using PMMA A7 / MMA EL6 double-layer photoresist method, spin coating onto MoS 2 and on the substrate.

[0065] 4. Use electron beam lithography (EBL) to pattern the photoresist, and expose the MoS that needs to be etched 2 s position.

[0066] 5. Etching MoS with a single layer thickness by Ar ions in a reactive ion etcher (RIE) 2 . In this example of etching equipment, set the gas to Ar, RF power to 50W; pressure to 50mTorr; time to 50s.

[0067] 6. After the etching is finished, put the sample into acetone to remove the attached photoresist.

[0068] 7. Repeat the process steps 1~6 of the first layer etching, and modify the exposure pattern position of E...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a stepped electrode structure based on a two-dimensional material transistor and a preparation method of the stepped electrode structure, and belongs to the technical field of semiconductors, and the two-dimensional material transistor refers to a transistor of which a channel adopts a two-dimensional semiconductor material. The step electrode structure refers to that the contact surface between the transistor electrode and each layer of the channel two-dimensional material is in a step shape along with the fluctuation of different layer thicknesses. The preparation method comprises the steps of photoresist spin coating, graphical exposure, etching, metal coating and coating stripping. According to the stepped electrode structure based on the two-dimensional material transistor, the problem of contact between the two-dimensional material and the metal electrode is solved, the contact resistance is reduced, and the charge mobility is improved. The invention provides a basis for wide application of the two-dimensional material in the transistor.

Description

technical field [0001] The invention relates to the technical field of semiconductors, in particular to a stepped electrode structure based on a two-dimensional material transistor and a preparation method thereof. Background technique [0002] Since the discovery of the two-dimensional material graphene in 2004, two-dimensional semiconductor materials have become the most ideal for the next generation of thermal, optical, communication and micro-nano devices due to their high mobility, bipolarity, adjustable energy band, and flexibility. one of the materials. However, due to the layer characteristics of two-dimensional materials, the performance of conventional two-dimensional material transistors cannot give full play to the inherent characteristics of two-dimensional materials, which affects the practical application of two-dimensional material transistors. [0003] The current conventional two-dimensional material transistor electrode structure is top electrode, side el...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): H01L29/417H01L29/45H01L29/786H01L21/44
Inventor 蔡斐
Owner HEFEI UNIV OF TECH