Semiconductor devices fabricated using plasma assisted atomic layer deposition techniques and methods thereof
A technique of atomic layer deposition and plasma, applied in semiconductor devices, semiconductor/solid-state device manufacturing, semiconductor/solid-state device components, etc., can solve problems affecting the electrical and mechanical properties of semiconductor wafers, and improve quality and stability , Improve the effect of uniformity
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[0015] The directional terms mentioned in the following embodiments, such as: up, down, left, right, front or back, etc., are only directions referring to the attached drawings. Accordingly, the directional terms are used to illustrate and not to limit the invention.
[0016] As used herein, the terms "about", "approximately" and "substantially" generally mean within + / - 20% of a given value, more usually within + / - 10% of a given value, more usually is within + / - 5% of a given value, more usually within 3% of a given value, more usually within + / - 2% of a given value, more usually within + / - 2% of a given value Within -1%, and even more usually within + / -0.5% of a given value. The numerical values given in this disclosure are approximate numerical values, that is, the given value may still imply the meaning of "about" or "substantially" if "about" or "substantially" is not specified.
[0017] Please refer to figure 1 , figure 2 , image 3 , Figure 4 and Figure 5 ,...
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