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Semiconductor devices fabricated using plasma assisted atomic layer deposition techniques and methods thereof

A technique of atomic layer deposition and plasma, applied in semiconductor devices, semiconductor/solid-state device manufacturing, semiconductor/solid-state device components, etc., can solve problems affecting the electrical and mechanical properties of semiconductor wafers, and improve quality and stability , Improve the effect of uniformity

Pending Publication Date: 2022-05-06
TAIWAN CARBON NANO TECHNOLOGY CORPORATION
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

There are still many problems in the existing three-dimensional semiconductor manufacturing process, which affect the electrical and mechanical properties of the semiconductor wafer

Method used

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  • Semiconductor devices fabricated using plasma assisted atomic layer deposition techniques and methods thereof
  • Semiconductor devices fabricated using plasma assisted atomic layer deposition techniques and methods thereof
  • Semiconductor devices fabricated using plasma assisted atomic layer deposition techniques and methods thereof

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Embodiment Construction

[0015] The directional terms mentioned in the following embodiments, such as: up, down, left, right, front or back, etc., are only directions referring to the attached drawings. Accordingly, the directional terms are used to illustrate and not to limit the invention.

[0016] As used herein, the terms "about", "approximately" and "substantially" generally mean within + / - 20% of a given value, more usually within + / - 10% of a given value, more usually is within + / - 5% of a given value, more usually within 3% of a given value, more usually within + / - 2% of a given value, more usually within + / - 2% of a given value Within -1%, and even more usually within + / -0.5% of a given value. The numerical values ​​given in this disclosure are approximate numerical values, that is, the given value may still imply the meaning of "about" or "substantially" if "about" or "substantially" is not specified.

[0017] Please refer to figure 1 , figure 2 , image 3 , Figure 4 and Figure 5 ,...

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Abstract

The invention relates to a semiconductor device manufactured using plasma assisted atomic layer deposition technology and a method thereof. A method of fabricating a semiconductor device using a plasma assisted atomic layer deposition technique includes providing a substrate including a silicon substrate and a first oxide layer. Depositing a plurality of stacked layers on the substrate, wherein the stacked layers comprise dielectric layers and conductor layers; the stack layer is etched to form at least one trench. A second oxide layer is deposited on the stack layer and the trench using a plasma assisted atomic layer deposition device. The plasma-assisted atomic layer deposition device comprises a chamber, an upper electrode and a lower electrode, wherein the upper electrode is positioned above the chamber and comprises a plurality of spray heads; the first radio frequency power device enables the plurality of nozzles of the upper electrode to generate plasma, the second radio frequency power device cleans the plurality of nozzles, and the lower electrode is arranged below the cavity and connected with a third radio frequency power device. Depositing a high-resistance layer on the second oxide layer, and depositing a low-resistance layer on the high-resistance layer;

Description

technical field [0001] The present invention relates to a method for manufacturing a semiconductor device, and in particular to a method for manufacturing a semiconductor device using plasma-assisted atomic layer deposition technology. Background technique [0002] The semiconductor industry is constantly booming. Technological advances in semiconductor design and materials have enabled semiconductor devices with smaller and more complex circuits. The functional density of semiconductor devices is generally increased while the size is reduced, which can improve production efficiency and reduce costs. [0003] The function of a semiconductor device is limited by the area of ​​the semiconductor chip. With the development of semiconductor technology, more and more devices use three-dimensional stacking technology to increase the density of components. However, the three-dimensional stacking technology increases the complexity of the semiconductor device manufacturing process,...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/48H01L21/768H01L21/02H01L21/311H01L21/3213H01L23/498H01L23/538C23C16/40C23C16/455C23C16/509
CPCH01L21/02697H01L21/0228H01L21/311H01L21/3213H01L21/4846H01L21/76895H01L23/49838H01L23/49811H01L23/5386C23C16/45544C23C16/509C23C16/40H01L21/02274H01L21/02164H01L21/68764C23C16/045C23C16/4405C23C16/45536C23C16/45565H01J37/32862C23C16/4583H01J37/32715H01J37/32091H01J37/32165H01J37/3244C23C16/505C23C16/45563
Inventor 颜聪富张光瑞蔡群贤李庭鹃蔡群荣
Owner TAIWAN CARBON NANO TECHNOLOGY CORPORATION