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Liquid crystal display panel test structure and driving method

A technology of liquid crystal display panel and test structure, which is applied in the field of display and can solve the problems of inaccurate test results and the like

Pending Publication Date: 2022-06-24
东光光电(南京)有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, when the gate insulating layer breaks down, it cannot be determined whether the planar region is broken down or the climbing region is broken down, so the test result of the gate insulating layer film condition is inaccurate

Method used

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  • Liquid crystal display panel test structure and driving method
  • Liquid crystal display panel test structure and driving method
  • Liquid crystal display panel test structure and driving method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0044] like Figure 2-4 As shown in the figure, this embodiment provides a liquid crystal display panel test structure, which is used for the breakdown detection of the liquid crystal display panel, including a driving device 1 , a die head 2 , a breakdown voltage 3 , a liquid crystal display panel placing plate 4 , and a support table 5 , Clamping and moving device 7 , detection device, controller and substrate 10 , active layer 11 , gate insulating layer 12 , and gate layer 13 of the liquid crystal display panel to be broken down.

[0045] The driving device 1 provides breakdown energy power for the liquid crystal display panel test structure; the die head 2 fixes the driving device 1; the breakdown voltage 3 is fixed under the die head 2;

[0046] The substrate 10 is placed on the liquid crystal display panel placement plate 4; the active layer 11 is placed on the substrate 10; the gate insulating layer 12 is placed on the active layer 11, and the gate insulating layer 12 a...

Embodiment 2

[0053] like figure 1 This embodiment provides a driving method for a liquid crystal display panel test structure, which is applied to the liquid crystal display panel test structure of the above-mentioned embodiment 1, and includes the following steps:

[0054] S11: detect the vertical vertical distance one between the breakdown voltage 3 and the gate layer 13;

[0055] Detect the horizontal distance 1 between the breakdown voltage 3 and the center of the plane region 121;

[0056] S12: determine whether the vertical vertical distance one is less than a preset vertical vertical distance one;

[0057] judging whether the horizontal distance one is equal to a preset horizontal distance one;

[0058] S13: when the vertical vertical distance 1 is less than the preset vertical vertical distance 1, the controller controls the breakdown voltage 3 to perform a breakdown test, and applies a voltage on the active layer and the gate layer , wherein the voltage gradually increases;

...

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Abstract

The invention provides a liquid crystal display panel test structure, which is used for carrying out breakdown detection on a liquid crystal display panel, and comprises a driving device, a die head, a breakdown voltage, a liquid crystal display panel placement plate, a clamping moving device, a detection device, a controller, and a substrate, an active layer, a gate insulation layer and a gate layer of the liquid crystal display panel to be broken down. A clamping and moving device is arranged, a display panel needing to be tested is fixed and moved, a controller is matched with a distance measuring sensor, a breakdown test part of the display panel is accurately controlled, a grid layer comprises a first grid part and a second grid part, the first grid part covers a plane area, and the second grid part covers a climbing area. The climbing region and the plane region of the gate insulating layer can be determined according to the first gate part and the second gate part, so that when the breakdown voltage of the gate insulating layer is tested, which one of the plane region and the climbing region is broken down and which one is firstly broken down is determined according to the breakdown position, and the film layer condition of the gate insulating layer is accurately known according to the breakdown phenomenon.

Description

technical field [0001] The present invention relates to the field of display technology, and in particular, to a liquid crystal display panel testing structure and a driving method. Background technique [0002] In recent years, with the development of OLED products, the process of OLED products has become more and more complicated, and the quality of the front-layer process will directly affect the subsequent process, and even affect the entire process. Under this development trend, the process of measuring each layer becomes more and more important. [0003] At present, the breakdown voltage of the structure is tested, and a voltage is applied to the source / drain and gate to obtain the breakdown voltage of the gate insulating layer. However, when the gate insulating layer is broken down, it cannot be determined whether the plane region is broken down or the ramp region is broken down, so the test result of the film condition of the gate insulating layer is inaccurate. ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G02F1/13
CPCG02F1/1309
Inventor 张大伟吉文超
Owner 东光光电(南京)有限公司