Image sensor, image sensor test system and method

Abstract

The invention relates to an image sensor, an image sensor testing system and an image sensor testing method. An image sensor may include: an active pixel array including a plurality of active pixels operable to convert incident light into pixel signals of image information carried in the incident light; a plurality of sampling pixel groups located adjacent to the active pixel array but spatially separated from the active pixel array, and having different heat dissipation characteristics from the other sampling pixel groups; and a plurality of temperature sensors respectively coupled to the sampling pixel groups to provide temperature measurements.

Description

technical field [0001] The techniques and implementations disclosed in this patent document relate generally to a semiconductor integrated device, and more particularly, to an image sensor and an image sensor testing system and method. Background technique [0002] The image sensor includes a pixel array including optoelectronic semiconductor devices and transistors. Optoelectronic semiconductor devices can convert light into photoelectric charges. Transistors can convert photocharges generated by optoelectronic semiconductor devices into electrical signals. [0003] A CMOS image sensor may include a single integrated circuit (IC) in which an analog control circuit and a digital control circuit are integrated. CMOS image sensors can convert light reflected from objects and incident on opto-semiconductor devices of a pixel array into electrical charges. The amount of accumulated charge is proportional to the voltage signal generated by the CMOS image sensor. [0004] The ...

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Problems solved by technology

[0004] Electrical signals generated by an array of pixels in an image sensor may include noise that may adversely affect the quality of the image

[0005] Examples of noise include dark current, a relatively small current that flows through a photosensitive device such as a photodiode even if no photons enter the device, which results in distortion of the image signal

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