Duplex test device, control method thereof, and readable storage medium

Abstract

The invention relates to the technical field of televisions, and discloses a duplex station test device and a control method thereof, and a readable storage medium, the duplex station test device comprises a first station test module, a second station test module and an industrial control board; the first work station test module is arranged on a line body of a first work station, the second work station test module is arranged on a line body of a second work station, and the industrial control board is electrically connected with the first work station test module and the second work station test module. The first work station test module and the second work station test module are respectively controlled through the industrial control board, so that when the to-be-tested machine on the line body is in place, the test position is selected in the first work station and the second work station, after the test is completed, the machine is controlled to be released, and then GAMMA automatic debugging of the two work stations of one line body is realized.

Description

Technical Field

[0001] The present application relates to the field of television technology, and in particular to a duplex station testing device and a control method thereof, and a readable storage medium. Background Art

[0002] The current LCD TVs or monitors have increasingly higher requirements for picture quality and color reproduction, and more and more products require GAMMA debugging (GAMMA debugging is a testing method performed in the final stage after software development is completed).

[0003] In traditional technology, GAMMA debugging takes much longer than traditional white balance debugging in terms of testing time, which will seriously affect the testing rhythm of the production line. Therefore, two workstations are usually used on the production line for GAMMA testing, and a tester is required to perform the corresponding test operations so that the two machines can be tested at the same time. Specifically, the tester triggers the test after plugging in the line, and controls the release after the test passes. Summary of the invention

[0004] The main purpose of the present application is to propose a duplex station test device and a control method thereof, as well as a readable storage medium, in order to solve the problem that testers are required to perform GAMMA debugging.

[0005] To achieve the above object, the present application provides a duplex station testing device, the duplex station testing device comprising:

[0006] The dual-station test device comprises: a first station test module, a second station test module and an industrial control board;

[0007] The first workstation test module is arranged on the line body of the first workstation, the second workstation test module is arranged on the line body of the second workstation, and the industrial control board is electrically connected to the first workstation test module and the second workstation test module respectively.

[0008] Optionally, the first workstation test module includes a first test box, and the second workstation test module includes a second test box;

[0009] The industrial control board is electrically connected to the first test box and the second test box respectively.

[0010] Optionally, the first station test module further includes a first release switch, and the second station test module further includes a second release switch;

[0011] The first release switch is arranged on the line body of the first workstation, the second release switch is arranged on the line body of the second workstation, and the industrial control board is electrically connected to the first release switch and the second release switch respectively.

[0012] Optionally, the first station test module further includes a first in-place sensor and a first photoelectric sensor, and the second station test module further includes a second in-place sensor and a second photoelectric sensor;

[0013] The first in-place sensor and the first photoelectric sensor are respectively arranged on the line body of the first workstation, the second in-place sensor and the second photoelectric sensor are respectively arranged on the line body of the second workstation, and the industrial control board is electrically connected to the first in-place sensor, the first photoelectric sensor, the second in-place sensor and the second photoelectric sensor respectively.

[0014] Optionally, the duplex station testing device further comprises a switching switch;

[0015] The switch is connected to the industrial control board.

[0016] In addition, to achieve the above-mentioned purpose, the present invention further provides a control method for a duplex station test device, the control method for the duplex station test device is applied to the industrial control board of the duplex station test device as described above, and the control method for the duplex station test device comprises:

[0017] When the machine to be tested is in place, first working information of the first workstation is obtained through the first workstation test module, and second working information of the second workstation is obtained through the second workstation test module;

[0018] Determine a test position of the machine to be tested based on the first working information and the second working information;

[0019] The test result of the test at the test position is obtained, and the machine to be tested that has completed the test is released according to the test position and the test result.

[0020] Optionally, the first station test module includes: a first test box and a first release switch, the second station test module includes: a second test box and a second release switch, and the test result includes: a first test result and a second test result;

[0021] The step of releasing the machine to be tested after the test is completed through the test position and the test result comprises:

[0022] If the test location is the second workstation, and the second test result sent by the second test box is a test pass, the second release switch is controlled to release the machine to be tested to flow out of the second workstation;

[0023] If the test location is the first workstation, and the first test result received from the first test box is a test pass, detecting whether to send a second release signal to the second release switch;

[0024] If the second release signal is sent to the second release switch, the first release signal is sent to the first release switch;

[0025] When the machine to be tested flows into the second workstation, a no-test signal is sent to the second test box and a second release signal is sent to the second release switch to control the second workstation test module to release the machine to be tested in the second workstation to flow out of the second workstation.

[0026] Optionally, the first station test module includes a first in-place sensor and a first photoelectric sensor, the second station test module includes a second in-place sensor and a second photoelectric sensor, the first working information includes: a first tooling board in-place signal and a first machine empty board signal, and the second working information includes: a second tooling board in-place signal and a second machine empty board signal;

[0027] The step of determining the test position of the machine to be tested based on the first working information and the second working information comprises:

[0028] Receive the first tooling board in-place signal sent by the first in-place sensor, the first machine empty board signal sent by the first photoelectric sensor, the second tooling board in-place signal sent by the second in-place sensor, and the second machine empty board signal sent by the second photoelectric sensor;

[0029] When it is detected that there is no machine to be tested at the first workstation based on the first tooling plate in place signal and the first machine empty plate signal, and when it is detected that there is no machine to be tested at the second workstation based on the second tooling plate in place signal and the second machine empty plate signal, the second workstation is determined to be a test position;

[0030] If the next machine to be tested needs to be tested, the first workstation is determined as the testing position.

[0031] Optionally, the control method of the duplex station testing device further includes:

[0032] When it is detected that the first test result and the second test result are received at the same time and both the first test result and the second test result are passed, a second release signal is sent to the second release switch, so that the machine to be tested at the second station flows out of the second station;

[0033] After a preset time period of sending the second release signal, a first release signal is sent to the first release switch, so that the machine to be tested at the first station flows out of the first station.

[0034] In addition, to achieve the above-mentioned purpose, the present invention also provides a computer storage medium, on which a control program of a duplex station testing device is stored. When the control program of the duplex station testing device is executed by a processor, the steps of the control method of the duplex station testing device as described above are implemented.

[0035] The present application provides a dual-station test device, which includes: a first station test module, a second station test module and an industrial control board; the first station test module is arranged at the first station, the second station test module is arranged at the second station, and the industrial control board is electrically connected to the first station test module and the second station test module respectively. When the machine to be tested is in place, the first working information of the first station is obtained through the first station test module, and the second working information of the second station is obtained through the second station test module; the test position of the machine to be tested is determined based on the first working information and the second working information; the test result tested at the test position is obtained; and the machine to be tested that has completed the test is released through the test position and the test result. The present application controls the first station test module and the second station test module respectively through the industrial control board, so that when the machine to be tested on the line is in place, the test position is selected in the first station and the second station, and after the test is completed, the machine is controlled to be released, thereby realizing the GAMMA automatic debugging of two stations of a line. BRIEF DESCRIPTION OF THE DRAWINGS

[0036] Figure 1 A schematic diagram of the structure of a duplex station testing device provided in one embodiment of the present application;

[0037] Figure 2 A schematic diagram of the structure of a first station test module and a second station test module in a dual station test device provided in an embodiment of the present application;

[0038] Figure 3 A circuit connection diagram of a duplex station testing device provided in one embodiment of the present application;

[0039] Figure 4 A schematic diagram of an application of a switching switch in a duplex station testing device provided in an embodiment of the present application;

[0040] Figure 5 A schematic diagram of the working process of a control method of a duplex station testing device provided in one embodiment of the present application;

[0041] Figure 6 A schematic diagram of an internal control program of an industrial control board involved in a control method of a duplex station test device provided in an embodiment of the present application.

[0042] Description of Figure Numbers:

[0043]

[0044]

[0045] The purpose, features and advantages of this application will be further described in conjunction with the embodiments and with reference to the accompanying drawings. DETAILED DESCRIPTION

[0046] It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0047] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0048] It should be noted that all directional indications in the embodiments of the present application (such as up, down, left, right, front, back, etc.) are only used to explain the relative position relationship, movement status, etc. between the components under a certain specific posture (as shown in the accompanying drawings). If the specific posture changes, the directional indication will also change accordingly.

[0049] In this application, unless otherwise clearly specified and limited, the terms "connection", "fixation", etc. should be understood in a broad sense. For example, "fixation" can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements, unless otherwise clearly defined. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to specific circumstances.

[0050] In addition, in this application, descriptions such as "first", "second", etc. are only used for descriptive purposes and cannot be understood as indicating or implying their relative importance or implicitly indicating the number of technical features indicated. Therefore, the features defined as "first" and "second" may explicitly or implicitly include at least one of the features. In addition, the technical solutions between the various embodiments can be combined with each other, but they must be based on the ability of ordinary technicians in this field to implement them. When the combination of technical solutions is contradictory or cannot be implemented, it should be deemed that such combination of technical solutions does not exist and is not within the scope of protection required by this application.

[0051] Traditional LCD TVs or monitors have gradually improved their requirements for picture quality and color reproduction capabilities. More and more products require GAMMA debugging, and GAMMA debugging takes much longer than traditional white balance debugging, which will seriously affect the test rhythm of the production line. Therefore, two workstations are usually used on the production line for GAMMA testing, and a tester is required to perform the corresponding test operations so that the two machines can be tested at the same time. After the test passes, the control is released without repeating the test. In summary, when traditional duplex stations operate together, GAMMA debugging cannot be performed automatically. In addition, when one machine is in place, it is necessary to wait for the next machine to start the synchronous testing of the two workstations, resulting in low test efficiency.

[0052] Based on this, the present application provides a duplex station test device and a duplex station test device and a control method thereof, as well as a readable storage medium, wherein the duplex station test device includes: a first station test module, a second station test module, and an industrial control board; the present application controls the first station test module and the second station test module respectively through the industrial control board, so that when the machine to be tested on the line is in place, the test position is selected in the first station and the second station, and after the test is completed, the machine is controlled to be released, thereby realizing GAMMA automatic debugging of two stations of a line.

[0053] The present application provides a duplex station testing device.

[0054] In one embodiment of the present application, refer to Figure 1 , Figure 1 A schematic diagram of the structure of a duplex station test device provided in an embodiment of the present application, wherein the duplex station test device comprises: a first station test module 10, a second station test module 20 and an industrial control board 30;

[0055] The first workstation test module 10 is arranged on the line body of the first workstation A, the second workstation test module 20 is arranged on the line body of the second workstation B, and the industrial control board 30 is electrically connected to the first workstation test module 10 and the second workstation test module 20 respectively.

[0056] In this embodiment, the first workstation A and the second workstation B are arranged on the line body, such as Figure 1 As shown, the tooling board to be tested that flows into the line passes through the first workstation A and the second workstation B in sequence and then flows out. The first workstation A and the second workstation B can perform GAMMA debugging on the tooling board to be tested respectively.

[0057] In this embodiment, the first work information of the first station A is obtained through the first station test module 10, and the second work information of the second station B is obtained through the second station test module. The test position of the machine to be tested is determined based on the first work information and the second work information, and the test result tested at the test position is obtained. The machine to be tested that has completed the test is released according to the test position and the test result. The first station test module 10 and the second station test module 20 are controlled by the industrial control board 30 respectively, and the test position of the machine to be tested and the release after the test are determined by the industrial control board 30. Therefore, when the machine to be tested on the line is in place, the test position is selected in the first station and the second station, and after the test is completed, the machine is controlled to be released, thereby realizing the GAMMA automatic debugging of two stations of a line. Specifically, the test rhythm of the post is improved to meet the production of 150 PCS / H for 55EA and 185 PCS / H for 32 small-size TVs.

[0058] It should be noted that when the machine to be tested passes the test at the first station A and flows into the second station B, the test is not repeated at the second station B. The machine to be tested that fails the test at the first station A needs to wait for the confirmation of the tester. After receiving the confirmation operation, the industrial control board 30 manually releases it to the second station B for testing.

[0059] It should be noted that the specific model of the industrial control board 10 is FX1N-20MR. The PLC control program is written in GXWorks2 and then placed in the industrial control board 10. The specific implementation steps can refer to the following control method of the dual-station test device. In addition, the first station A and the second station B are logically sequential stations, and the test device may include multiple stations.

[0060] Optionally, in some feasible embodiments, reference Figure 2 and Figure 3 , Figure 2 This is a schematic diagram of the structure of a first station test module and a second station test module in a dual station test device provided in an embodiment of the present application. Figure 3 This is a circuit connection diagram of a dual-station test device provided in an embodiment of the present application, wherein the first station test module 10 includes a first test box 11, and the second station test module 20 includes a second test box 21;

[0061] The industrial control board 30 is electrically connected to the first test box 11 and the second test box 21 respectively.

[0062] In this embodiment, the first test box 11 and the second test box 21 are respectively single-chip microcomputer communication boxes. After the single-chip microcomputer control program is written by Kei 15, the first test box 11 and the second test box 21 are respectively placed in the first test box 11. After the first test box 11 receives the first test signal sent by the industrial control board 30, it tests the machine to be tested at the first workstation A, and feeds back the test result of the machine at the first workstation A to the industrial control board 30; after the second test box 21 receives the second test signal sent by the industrial control board 30, it tests the machine to be tested at the second workstation B, and feeds back the test result of the machine at the second workstation B to the industrial control board 30. It should be noted that the first test box 11 tests the machine to be tested at the first station A, and sends the first test result to the industrial control board 30. The first test result is received by the industrial control board 30. If the first test result is a pass, when the machine to be tested flows into the second station B, a no-test signal is sent to the second test box 21, that is, the machine to be tested that has been tested at the first station A is not tested repeatedly. Therefore, when the machine to be tested that has been tested at the first station flows into the second station, it is not tested repeatedly at the second station and flows out of the second station. Therefore, GAMMA automatic debugging of the two stations of a line is realized.

[0063] For example, Figure 3 As shown, Figure 3 The wiring diagram of the industrial control board 30 connected to the first test box 11 and the second test box 21, the B1 port of the first test box 11 is connected to the C2 port of the industrial control board 30, and the GND port of the first test box 11 is connected to the Y2 port of the industrial control board 30, which is used to receive the first test signal sent by the industrial control board 30 and test the machine to be tested at the first station A. Figure 4 The front station is the first station A, and the back station is the second station B; the B1 port of the second test box 21 is connected to the C3 port of the industrial control board 30, and the GND port of the second test box 21 is connected to the Y3 port of the industrial control board 30, for receiving the second test signal sent by the industrial control board 30, and testing the machine to be tested at the second station B. The A7 port of the first test box 11 is connected to the X4 port of the industrial control board 30, for sending the first test result to the industrial control board 30, specifically the test pass signal of the device to be tested at the first station A; the A7 port of the second test box 21 is connected to the X5 port of the industrial control board 30, for sending the second test result to the industrial control board 30, specifically the test pass signal of the device to be tested at the second station B.

[0064] Optionally, in some feasible real-time examples, refer to Figure 2 , the first station test module 10 further includes a first release switch 12, and the second station test module 20 further includes a second release switch 22;

[0065] The first release switch is arranged on the line body of the first workstation, the second release switch is arranged on the line body of the second workstation, and the industrial control board 30 is electrically connected to the first release switch 12 and the second release switch 22 respectively.

[0066] In this embodiment, the first release switch 12 is used to receive the first release signal sent by the industrial control board 30, and based on the first release signal, release and block the machine to be tested at the first station A from flowing out of the first station A, and the second release switch 22 is used to receive the second release signal sent by the industrial control board 30, and based on the second release signal, release and block the machine to be tested at the second station B from flowing out of the second release switch. Specifically, if the position to be tested is the first station A, a test signal is sent to the first test box 11, and if the position to be tested is the second station B, a first release signal is sent to the first release switch 12, so that the tooling board to be tested flows out of the first station A and enters the second station B, and a test signal is sent to the second test box 21, so that the switch 12 performs a test on the device to be tested.

[0067] Exemplary, reference Figure 3, the first release switch 12 is connected to the C0 port and the Y0 port of the industrial control board 10, and the second release switch 22 is connected to the C1 port and the Y1 port of the industrial control board 10. The industrial control board 30 receives the first test result sent by the first test box 11, and when the first test result is a test pass, sends a first release signal to the first release switch 12, and the first release switch 12 releases the machine to be tested at the first station A after receiving the first release signal; the industrial control board 30 receives the second test result sent by the second test box 21, and when the second test result is a test pass, sends a second release signal to the second release switch 22, and the second release switch 22 releases the machine to be tested at the second station B after receiving the second release signal. It should be noted that if the first workstation A and the second workstation B are tested at the same time, or the second workstation B is tested before the first workstation A for a preset time, the industrial control board 30 first controls the second release switch 22 to release the machine to be tested at the second workstation B for a preset time period, and then controls the first release switch 12 to release the machine to be tested at the first workstation A. Alternatively, when the industrial control board 30 detects that the first test result is a passed test, it further confirms whether to send a second release signal to the second release switch 22. If the second release signal is sent, it means that the machine at the second workstation has flowed out. If the second release signal is not sent, it means that the machine at the second workstation is still in the testing state. Therefore, after waiting for the machine test at the second workstation to be completed, the second release signal is sent to the second release switch 22, and then the second release signal is sent to the first release switch 12. Thus, the device to be tested at the second workstation B is released first, and then the device to be tested at the first workstation A is released after a preset time period, and the machine to be tested is released automatically after the test is completed, thereby realizing GAMMA automatic debugging of two workstations on a production line.

[0068] At the same time, the first test box 11 tests the machine to be tested at the first station A, and sends the first test result to the industrial control board 30. The industrial control board 30 receives the first test result. If the first test result is a pass, a no-test signal is sent to the second test box 21, and a first release signal is sent to the first release switch 12. The machine to be tested at the first station A is released through the first release switch 12, so that the machine to be tested flows into the second station B. The industrial control board 30 sends a no-test signal to the second test box 21, and a second release signal is sent to the second release switch 22. After receiving the no-test signal through the second test box 21, the machine to be tested at the second station B is not tested, and the machine to be tested at the second station B is released through the second release switch 22. Thus, when the machine to be tested that has been tested at the first station flows into the second station, it is not repeatedly tested at the second station and flows out of the second station, thereby realizing the GAMMA automatic debugging of two stations of a line.

[0069] Optionally, in some feasible embodiments, reference Figure 2 , the first station test module 10 further includes a first in-place sensor 13 and a first photoelectric sensor 14, and the second station test module 20 further includes a second in-place sensor 23 and a second photoelectric sensor 24;

[0070] The first in-place sensor 13 and the first photoelectric sensor 14 are respectively arranged on the line body at the entrance of the first workstation A, the second in-place sensor 23 and the second photoelectric sensor 24 are respectively arranged on the line body at the entrance of the second workstation B, and the industrial control board 30 is electrically connected to the first in-place sensor 13, the first photoelectric sensor 14, the second in-place sensor 23 and the second photoelectric sensor 24 respectively.

[0071] In this embodiment, the first in-position sensor 13 is used to send a first tooling board in-position signal of the first workstation A to the industrial control board 10, the second in-position sensor 23 is used to send a second tooling board in-position signal of the second workstation B to the industrial control board 10, the first photoelectric sensor 14 is used to send a first machine empty board signal on the tooling board of the first workstation A to the industrial control board 10, and the second photoelectric sensor 24 is used to send a second machine empty board signal on the tooling board of the second workstation B to the industrial control board 10.

[0072] In this embodiment, when the tooling board to be tested of the first station A is in place, the first tooling board in place signal is obtained by the first in place sensor 13, and then the first machine empty board signal of the tooling board is further obtained by the first photoelectric sensor 14, that is, whether the tooling board is equipped with the machine to be tested is detected, if not, it is an empty board. When the tooling board to be tested of the second station B is in place, the second tooling board in place signal of the first station A is obtained by the second in place sensor 23, and then the second machine empty board signal of the tooling board of the second station B is further obtained by the second photoelectric sensor 24, that is, whether the tooling board is equipped with the machine to be tested is detected, if not, it is an empty board, the industrial control board 30 determines the test position of the tooling board to be tested according to the first tooling board in place signal, the first machine empty board signal, the second tooling board in place signal, and the second machine empty board signal, and controls the test position of the tooling board to be tested through the first release switch 12. And the first tooling board in place signal and the first machine empty board signal are used to detect whether the tooling board of the first station A has the machine to be tested, thereby determining whether to test the tooling board. Thus, GAMMA automatic debugging of two workstations on a production line is realized.

[0073] Exemplarily, the steps for the industrial control board 30 to confirm whether to test the tooling board to be tested are as follows: when the industrial control board 30 detects that the tooling board to be tested is in place through the first in-place sensor 13, the first photoelectric sensor 14 detects whether the tooling board is an empty board. If so, the first release switch 12 releases the tooling board to be tested. When the tooling board to be tested flows into the second workstation B, the industrial control board 30 detects that the tooling board to be tested is in place through the second in-place sensor 23, and the second photoelectric sensor 24 detects whether the tooling board is an empty board. If so, the second release switch 22 releases the tooling board to be tested. Thus, when the tooling board to be tested is an empty board, it is not detected by the first test box 11 and the second test box 21, and flows out of the second workstation B, thereby realizing the GAMMA automatic debugging of the two workstations of a line. It should be noted that if there is no machine on the tooling board to be tested, it is an empty board.

[0074] Exemplarily, the steps for the industrial control board 30 to confirm the test position of the machine to be tooled are as follows: the first photoelectric sensor 14 is used to detect whether the tooling board is an empty board. If it is not an empty board, the second in-position sensor 23 is used to detect whether there is a tooling board to be tested at the second station B. If there is a tooling board to be tested at the second station B, the second photoelectric sensor 24 is further used to detect whether the tooling board at the second station B is an empty board. If it is not an empty board, the first station A is selected as the test position, and the industrial control board 30 sends a first test signal to the first test box 11. The tooling board to be tested at the first station A of the first test box 11 is detected by the second in-position sensor 23. The test machine is tested; if the second workstation B does not have a tooling board to be tested, or the tooling board of the second workstation B is an empty board, the second workstation B is selected as the test position, and a first release signal is sent to the first release switch 12, so that the machine to be tested at the first workstation A flows into the second workstation B, thereby achieving that there are no machines to be tested at the first workstation A and the second workstation B, and when the next machine to be tested flows into the first workstation A, it is tested at the second workstation B, so that when the next machine to be tested flows into the first workstation A, it can be tested at the first workstation A, thereby improving the test efficiency.

[0075] Optionally, in some feasible embodiments, reference Figure 4 , Figure 4 This is a schematic diagram of an application of a switch in a duplex station test device provided in an embodiment of the present application, wherein the duplex station test device further includes a switch 40;

[0076] The switch 40 is connected to the industrial control board 30 .

[0077] In this embodiment, the switch 40 is used to switch between the dual-station test mode and the single-station test mode. The single-station test mode is that there is no association between the first station A and the second station B. When the first station A and the second station B detect that the tooling board to be tested is in place, they further detect whether the tooling board to be tested is an empty board. If it is not an empty board, the test program is triggered to test the machine to be tested on the station. The dual-station test mode is that the machine to be tested that has been tested on the first station A is not repeatedly tested on the second station B, and when there is no machine to be tested on the first station A and the second station B, when the next machine to be tested flows into the first station B, the test is controlled to be performed on the second station B, and when the tests of the first station A and the second station B are completed at the same time, the machine to be tested on the second station B is first discharged, and after a preset time period, the machine to be tested on the first station A is discharged to the second station B. Thus, the switching between the dual-station test mode and the single-station test mode is realized by the switch 40.

[0078] Based on the above-mentioned embodiments of the duplex station test device, an embodiment of a control method of the duplex station test device of the present application is proposed. The control method of the duplex station test device is applied to the industrial control board of the above duplex station test device, referring to Figure 5 , Figure 5 A schematic diagram of a working process of a control method of a duplex station test device provided in an embodiment of the present application, wherein the control method of the duplex station test device comprises:

[0079] Step S10: when the machine to be tested is in place, first working information of the first workstation is obtained through the first workstation test module, and second working information of the second workstation is obtained through the second workstation test module;

[0080] Step S20: determining a test position of the machine to be tested based on the first working information and the second working information;

[0081] Step S30: obtaining the test result of the test at the test position, and releasing the machine to be tested that has completed the test according to the test position and the test result.

[0082] In this embodiment, the first workstation A and the second workstation B are arranged on the line body, such as Figure 1 As shown, the tooling board to be tested flowing into the line body passes through the first station A and the second station B in sequence and then flows out. The first station A and the second station B can perform GAMMA debugging on the tooling board to be tested respectively. It should be noted that the arrival of the machine to be tested means that the machine to be tested is in place at the first station A, which can be specifically detected by the first arrival sensor and the first photoelectric sensor.

[0083] In this embodiment, the first work information of the first station A is obtained through the first station test module 10, and the second work information of the second station B is obtained through the second station test module. Based on the first work information and the second work information, the test position of the machine to be tested is determined in the first station A and the second station B, and the test result of the test at the test position is obtained. The machine to be tested that has completed the test is released according to the test position and the test result. Therefore, the first station test module 10 and the second station test module 20 are controlled respectively by the industrial control board 30, and the test position of the machine to be tested and the release after the test are determined by the industrial control board 30. Therefore, when the machine to be tested on the line is in place, the test position is selected in the first station and the second station, and after the test is completed, the machine is controlled to be released, thereby realizing the GAMMA automatic debugging of the two stations of a line. Specifically, the test rhythm of the post is improved to meet the production of 150 PCS / H for 55EA and 185 PCS / H for 32 small-size TVs.

[0084] It should be noted that when the machine to be tested passes the test at the first station A and flows into the second station B, the test is not repeated at the second station B. The machine to be tested that fails the test at the first station A needs to wait for the confirmation of the tester. After receiving the confirmation operation, the industrial control board 30 manually releases it to the second station B for testing.

[0085] Optionally, in some feasible embodiments, the first station test module includes: a first test box and a first release switch, the second station test module includes: a second test box and a second release switch, and the test result includes: a first test result and a second test result;

[0086] Step S30 includes the following steps:

[0087] Step S301: if the test location is the second workstation, and the second test result sent by the second test box is a test pass, controlling the second release switch to release the machine to be tested to flow out of the second workstation;

[0088] Step S302: if the test location is the first workstation, and the first test result received from the first test box is a test pass, detecting whether a second release signal is sent to the second release switch;

[0089] Step S303: if the second release signal is sent to the second release switch, then the first release signal is sent to the first release switch;

[0090] Step S304: When the machine to be tested flows into the second workstation, a no-test signal is sent to the second test box and a second release signal is sent to the second release switch to control the second workstation test module to release the machine to be tested in the second workstation to flow out of the second workstation.

[0091] In this embodiment, for the machine that has completed the test at the second workstation B, that is, the industrial control board 30 receives the second test result sent by the second test box 21, and when the second test result is that the test passes, it sends a second release signal to the second release switch 22. After receiving the second release signal, the second release switch 22 releases the machine to be tested at the second workstation B. For the machine that has completed the test at the first workstation A, that is, the first test box 11 is used to test the machine to be tested at the first workstation A, and a first test result is sent to the industrial control board 30, and the first test result is received by the industrial control board 30. If the first test result is a pass, then when it is detected that the test of the machine at the second workstation is completed, a no test signal is sent to the second test box 21, and a first release signal is sent to the first release switch 12, and the machine to be tested at the first workstation A is released through the first release switch 12, so that the machine to be tested can flow into the second workstation B, a no test signal is sent to the second test box 21 through the industrial control board 30, and a second release signal is sent to the second release switch 22. After the no test signal is received by the second test box 21, the machine to be tested at the second workstation B is not tested, and the machine to be tested at the second workstation B is released through the second release switch 22. Therefore, when the machine to be tested that has been tested at the first station flows into the second station, it does not need to be tested again at the second station and flows out of the second station, thereby realizing GAMMA automatic debugging of two stations of a line.

[0092] Optionally, in some feasible embodiments, the first station test module includes a first in-place sensor and a first photoelectric sensor, the second station test module includes a second in-place sensor and a second photoelectric sensor, the first working information includes: a first tooling board in-place signal and a first machine empty board signal, and the second working information includes: a second tooling board in-place signal and a second machine empty board signal;

[0093] Step S20 may further include the following steps:

[0094] Step S201: receiving the first tooling board in-place signal sent by the first in-place sensor, the first machine empty board signal sent by the first photoelectric sensor, the second tooling board in-place signal sent by the second in-place sensor, and the second machine empty board signal sent by the second photoelectric sensor;

[0095] Step S202: when it is detected that there is no machine to be tested at the first workstation based on the first tooling plate in place signal and the first machine empty plate signal, and when it is detected that there is no machine to be tested at the second workstation based on the second tooling plate in place signal and the second machine empty plate signal, the second workstation is determined to be a test position;

[0096] Step S203: If the next machine to be tested needs to be tested, the first workstation is determined as a test location.

[0097] In this embodiment, there is no machine to be tested at the first workstation A and the second workstation B, specifically through the first in-place sensor 13, the first photoelectric sensor 14, the second in-place sensor 23 and the second photoelectric sensor 24 detection. If it is detected by the first in-place sensor 13 and the first photoelectric sensor 14 that there is no machine to be tested at the first workstation A, and it is detected by the second in-place sensor 23 and the second photoelectric sensor 24 that there is no machine to be tested at the second workstation B, when the next machine to be tested flows into the first workstation A, a release signal is sent to the first release switch 12 through the industrial control board 30, so that the machine to be tested flows into the second workstation B.

[0098] Specifically, the first in-position sensor 13 detects the tooling board to be tested at the first workstation A, and further detects whether the tooling board at the first workstation A is an empty board through the first photoelectric sensor 14. If it is not an empty board, the second in-position sensor 23 detects whether there is a tooling board to be tested at the second workstation B. If the second workstation B has a tooling board to be tested, the second photoelectric sensor 24 further detects whether the tooling board at the second workstation B is an empty board. If it is not an empty board, the industrial control board 30 sends a first test signal to the first test box 11, and the first test box 11 first The machine to be tested at workstation A is tested; if the second workstation B does not have a tooling board to be tested, or the tooling board at the second workstation B is an empty board, a first release signal is sent to the first release switch 12, so that the machine to be tested at the first workstation A flows into the second workstation B, thereby achieving that there are no machines to be tested at the first workstation A and the second workstation B, and when the next machine to be tested flows into the first workstation A, it is tested at the second workstation B, so that when the next machine to be tested flows into the first workstation A, it can be tested at the first workstation A, thereby improving the test efficiency.

[0099] Optionally, in some feasible embodiments, the control method of the duplex station testing device further includes:

[0100] Step A1: When it is detected that the first test result and the second test result are received at the same time and both the first test result and the second test result are passed, a second release signal is sent to the second release switch, so that the machine to be tested at the second workstation flows out of the second workstation;

[0101] Step A2: After a preset time period for sending the second release signal, sending a first release signal to the first release switch, so that the machine to be tested at the first workstation flows out of the first workstation.

[0102] In this embodiment, if the first station A and the second station B are tested at the same time, or the second station B is tested before the first station A for a preset time, the industrial control board 30 first controls the second release switch 22 to release the machine to be tested at the second station B for a preset time period, and then controls the first release switch 12 to release the machine to be tested at the first station A. Thus, the device to be tested at the second station B is released first, and then the device to be tested at the first station A is released after the preset time period, and the machine to be tested that has completed the test is released automatically, thereby realizing the GAMMA automatic debugging of two stations on a line.

[0103] As an example, Figure 5 As shown, when the industrial control board 30 detects that the tooling board to be tested is in place through the first in-place sensor 13, it detects whether the tooling board is an empty board through the first photoelectric sensor 14. If so, the tooling board to be tested is released through the first release switch 12. When the tooling board to be tested flows into the second workstation B, the industrial control board 30 detects that the tooling board to be tested is in place through the second in-place sensor 23, and detects whether the tooling board is an empty board through the second photoelectric sensor 24. If so, the tooling board to be tested is released through the second release switch 22.

[0104] If it is detected that the tooling board of the first workstation A is not an empty board, the second in-position sensor 23 is used to detect whether there is a tooling board to be tested in the second workstation B. If there is a tooling board to be tested in the second workstation B, the second photoelectric sensor 24 is further used to detect whether the tooling board of the second workstation B is an empty board. If it is not an empty board, the industrial control board 30 sends a first test signal to the first test box 11. The first test box 11 tests the machine to be tested at the first workstation A and releases it to the second workstation through the first release switch 12 after the test is completed. The second workstation B detects whether the machine to be tested has passed the test at the first workstation A. If the test passes, it is released through the second release switch 22.

[0105] If it is detected that the tooling board of the first workstation A is not an empty board, and there is no tooling board to be tested in the second workstation B, or the tooling board of the second workstation B is an empty board, a first release signal is sent to the first release switch 12, so that the machine to be tested in the first workstation A flows into the second workstation B. Thus, it is achieved that there are no machines to be tested in the first workstation A and the second workstation B, and when the next machine to be tested flows into the first workstation A, it is tested at the second workstation B, so that when the next machine to be tested flows into the first workstation A, it can be tested at the first workstation A, thereby improving the test efficiency.

[0106] For example, as an implementation example, refer to Figure 6 , Figure 6 This is a schematic diagram of the internal control program of the industrial control board involved in the control method of the dual-station test device provided in an embodiment of the present application. When the machine to be tested that has passed the test at the first station A flows into the second station B, no trigger test is performed. The shift register of the industrial control board 30 is used for judgment. When the second station B detects that the machine to be tested is in place, it reads the M61 register status. When M61=1, it means that the first station A has been tested and is released directly without triggering the test signal; when M61=0, it means that the first station A has not been tested and a test needs to be triggered. For specific steps, refer to Figure 6 , the initial register states are M64, M63, M62, M61, and M60, which are 00000 respectively. When the first station A has a signal of passing the test, M61 is set to 1, and the register state becomes 00001. When the machine to be tested flows into the second station B, the M60 state is shifted left to M61. After the left shift, M60 is automatically supplemented with 0. At this time, the register state becomes 00010, so that the test signal is not triggered and is released directly; when the first station A does not have a signal of passing the test, M60 remains unchanged, and the register state remains 00000. When the machine to be tested flows into the second station B, the M60 state is shifted left to M61. After the left shift, M60 is automatically supplemented with 0. At this time, the register state becomes 00000, so that the test signal is triggered.

[0107] In addition, an embodiment of the present invention also proposes a computer storage medium, which is applied to a computer. The computer storage medium can be a non-volatile computer-readable computer storage medium, and a control program of a duplex station testing device is stored on the computer storage medium. When the control program of the duplex station testing device is executed by a processor, the steps of the control method of the duplex station testing device as described above are implemented.

[0108] Among them, the steps implemented when the control program of the duplex station test device running on the processor is executed can refer to the various embodiments of the control method of the duplex station test device of the present invention, and will not be repeated here.

[0109] The above are only preferred embodiments of the present application, and are not intended to limit the patent scope of the present application. All equivalent structural changes made using the contents of the present application specification and drawings under the application concept of the present application, or direct / indirect application in other related technical fields are included in the patent protection scope of the present application.

Claims

1. A duplex station test device, characterized in that: The dual-station test device comprises: a first station test module, a second station test module and an industrial control board; The first workstation test module is arranged on the line body of the first workstation, the second workstation test module is arranged on the line body of the second workstation, and the industrial control board is electrically connected to the first workstation test module and the second workstation test module respectively.

2. The duplex station testing device according to claim 1, characterized in that: The first station test module includes a first test box, and the second station test module includes a second test box; The industrial control board is electrically connected to the first test box and the second test box respectively.

3. The duplex station testing device according to claim 2, characterized in that: The first station test module further includes a first release switch, and the second station test module further includes a second release switch; The first release switch is arranged on the line body of the first workstation, the second release switch is arranged on the line body of the second workstation, and the industrial control board is electrically connected to the first release switch and the second release switch respectively.

4. The duplex station testing device according to claim 3, characterized in that: The first station test module further includes a first in-place sensor and a first photoelectric sensor, and the second station test module further includes a second in-place sensor and a second photoelectric sensor; The first in-place sensor and the first photoelectric sensor are respectively arranged on the line body of the first workstation, the second in-place sensor and the second photoelectric sensor are respectively arranged on the line body of the second workstation, and the industrial control board is electrically connected to the first in-place sensor, the first photoelectric sensor, the second in-place sensor and the second photoelectric sensor respectively.

5. The duplex station testing device according to claim 1, characterized in that: The duplex station test device also includes a switch; The switch is connected to the industrial control board.

6. A control method for a duplex station test device, characterized in that: The control method of the duplex station test device is applied to the industrial control board of the duplex station test device according to any one of claims 1 to 5, and the control method of the duplex station test device comprises: When the machine to be tested is in place, first working information of the first workstation is obtained through the first workstation test module, and second working information of the second workstation is obtained through the second workstation test module; Determine a test position of the machine to be tested based on the first working information and the second working information; The test result of the test at the test position is obtained, and the machine to be tested that has completed the test is released according to the test position and the test result.

7. The control method of the duplex station test device according to claim 6, characterized in that: The first station test module includes: a first test box and a first release switch, the second station test module includes: a second test box and a second release switch, and the test result includes: a first test result and a second test result; The step of releasing the machine to be tested after the test is completed through the test position and the test result comprises: If the test location is the second workstation, and the second test result sent by the second test box is a test pass, the second release switch is controlled to release the machine to be tested to flow out of the second workstation; If the test location is the first workstation, and the first test result received from the first test box is a test pass, detecting whether to send a second release signal to the second release switch; If the second release signal is sent to the second release switch, the first release signal is sent to the first release switch; When the machine to be tested flows into the second workstation, a no-test signal is sent to the second test box and a second release signal is sent to the second release switch to control the second workstation test module to release the machine to be tested in the second workstation to flow out of the second workstation.

8. The control method of the duplex station test device according to claim 7, characterized in that: The first station test module includes a first in-place sensor and a first photoelectric sensor, the second station test module includes a second in-place sensor and a second photoelectric sensor, the first work information includes: a first tooling board in-place signal and a first machine empty board signal, the second work information includes: a second tooling board in-place signal and a second machine empty board signal; The step of determining the test position of the machine to be tested based on the first working information and the second working information comprises: Receive the first tooling board in-place signal sent by the first in-place sensor, the first machine empty board signal sent by the first photoelectric sensor, the second tooling board in-place signal sent by the second in-place sensor, and the second machine empty board signal sent by the second photoelectric sensor; When it is detected that there is no machine to be tested at the first workstation based on the first tooling plate in place signal and the first machine empty plate signal, and when it is detected that there is no machine to be tested at the second workstation based on the second tooling plate in place signal and the second machine empty plate signal, the second workstation is determined to be a test position; If the next machine to be tested needs to be tested, the first workstation is determined as the testing position.

9. The control method of the duplex station test device according to claim 8, characterized in that: The control method of the duplex station testing device further includes: When it is detected that the first test result and the second test result are received at the same time and both the first test result and the second test result are passed, a second release signal is sent to the second release switch, so that the machine to be tested at the second station flows out of the second station; After a preset time period of sending the second release signal, a first release signal is sent to the first release switch, so that the machine to be tested at the first station flows out of the first station.

10. A readable storage medium, characterized in that: The readable storage medium stores a control program of a duplex station test device, and when the control program of the duplex station test device is executed by a processor, the steps of the control method of the duplex station test device according to any one of claims 6 to 9 are implemented.

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