AOI Imaging System Based on TDI Linear Scan Camera
The AOI imaging system with dual illumination optical paths and dual image acquisition channels solves the problem that existing technologies can only output one type of illumination effect, achieving efficient, high-speed, and high signal-to-noise ratio defect detection, thus improving detection efficiency and capability.
Patent Information
- Application Number
- CN202610213141.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2026-02-13
- Publication Date
- 2026-05-26
AI Technical Summary
Existing AOI imaging systems based on TDI line scan cameras can only output images with one lighting effect in a single scan, resulting in poor defect detection capabilities and difficulty in detecting some important defects.
An AOI imaging system employing dual illumination optical paths and dual image acquisition channels achieves two illumination effects in a single scan by setting up a first illumination optical path and a second illumination optical path with different illumination effects, and by controlling the first TDI linear array acquisition channel and the second TDI linear array acquisition channel to periodically alternate exposure and lighting up the first illumination optical path and the second illumination optical path periodically alternate.
While achieving high-quality imaging, it simplifies the system structure, improves defect detection efficiency, and can detect important defects that are difficult to detect based on a single lighting effect, thus improving defect detection capabilities.
Smart Images

Figure CN122093668A_ABST
