A method and system for determining a magnetron filament loss fault of a household microwave oven, an electronic device and a storage medium

Abstract

The application discloses a kind of household microwave oven magnetron filament loss fault determination methods, comprising: microwave output power original value of multiple moments of microwave oven and the voltage ripple original value of the two ends of magnetron filament determine time domain denoising voltage ripple value and smooth filtering power value;According to the time domain denoising voltage ripple value of multiple moments, determine voltage ripple time domain distortion rate;Calculate power fluctuation variance ratio;Iterative calculation is calculated for a preset number of times, obtain multiple iteration coupling eigenvalues;According to the average of multiple iteration coupling eigenvalues, determine loss gradient quantization value;According to loss gradient quantization value, determine calibration fault probability;According to loss gradient quantization value and corresponding loss gradient threshold value and calibration fault probability and probability threshold value, determine loss fault information.The application can realize the accurate positioning of magnetron filament micro-aging fault and make the on-site repair work more safe and reliable.The application also discloses a system, an electronic device and a storage medium for implementing the above method.

Description

Technical Field

[0001] This invention relates to the field of computer data processing technology, and in particular to a method, system, electronic device, and storage medium for determining filament loss faults in a magnetron of a household microwave oven. Background Technology

[0002] During daily use, household microwave ovens may experience various functional malfunctions due to factors such as component aging, frequent start-stop cycles, or environmental factors. Among these, the magnetron, as the core high-voltage component of the microwave oven, directly affects its heating efficiency and operational stability. Currently, there are relatively mature detection and diagnosis methods for common magnetron faults (such as complete failure, high-voltage breakdown, and filament breakage), and related repair techniques are also relatively widespread.

[0003] However, in practice, there exists a special and insidious type of fault: "magnetron filament micro-aging fault." This fault manifests as a slight increase in the magnetron filament resistance, typically ranging from 5% to 15% of the rated value; this results in a 10% to 20% decrease in microwave output power. While this type of fault is not high-frequency or frequently occurring and accounts for a small percentage of all fault cases, its diagnosis and handling present significant challenges.

[0004] First, the fault symptoms are extremely subtle. When not in operation, the microwave oven shows no abnormalities in appearance or during routine power-on checks. Only when the heating program is started do indirect symptoms appear, such as slower heating, uneven food heating, and a slight increase in noise within the oven cavity. These symptoms are faint and highly similar to those caused by other common problems such as high-voltage capacitor attenuation and power supply voltage fluctuations, easily leading to confusion for on-site repair personnel during initial diagnosis. It is often misdiagnosed as a high-voltage capacitor failure or a problem with other high-voltage circuits.

[0005] Secondly, existing repair procedures are inefficient and pose safety risks in diagnosing such faults. During on-site repairs, technicians typically rely on subjective experience based solely on the user's description of poor heating performance or a simple on-site test. To confirm whether the magnetron is malfunctioning, the common practice is to remove it from the unit for offline measurement or replacement testing. The magnetron's installation location is usually complex, and a complete disassembly process often takes more than 20 minutes, significantly increasing the time cost of on-site service. More importantly, the magnetron is a high-voltage, high-risk component. Improper operation or inadequate protection during disassembly and subsequent testing can easily lead to high-voltage electric shock, component damage, or even personal injury.

[0006] In summary, current technologies lack rapid, accurate, and safe on-site diagnostic methods and specialized tools for niche and hidden faults such as "micro-aging of the magnetron filament" in household microwave ovens. Traditional methods relying on disassembly and inspection are not only inefficient but also require highly skilled and safety-conscious repair personnel, failing to meet the demands of efficient and safe modern services. Summary of the Invention

[0007] To address the aforementioned problems in the prior art, this invention provides a method, system, electronic device, and storage medium for determining filament loss faults in a magnetron of a household microwave oven. The technical problem to be solved by this invention is achieved through the following technical solution: The first aspect of this invention provides a method for determining filament loss faults in a magnetron of a household microwave oven, comprising the following steps: Obtain the raw values ​​of microwave output power and voltage ripple across the magnetron filament at multiple moments in the microwave oven. Based on the original voltage ripple value and the original microwave output power value, determine the time-domain denoising voltage ripple value and smoothing filter power value at each moment; The voltage ripple time-domain distortion rate is determined based on the time-domain denoised voltage ripple value and the standard operating voltage ripple value of the magnetron filament at multiple time points. The power fluctuation variance ratio is calculated based on the variance of the smoothed filter power value at multiple times and the variance of the microwave oven's standard operating power value. Based on the initial values ​​of the time-domain adaptive weights, the initial values ​​of the power adaptive weights, the voltage ripple time-domain distortion rate, the power fluctuation variance ratio, and the iterative adaptive correction coefficients, a preset number of iterations are performed to obtain multiple iterative coupling feature values. The loss gradient quantization value is determined based on the average of multiple iteratively coupled eigenvalues. The calibration failure probability is determined based on the loss gradient quantization value. Loss fault information is determined based on the loss gradient quantization value and the corresponding loss gradient threshold, as well as the calibration fault probability and probability threshold.

[0008] In one embodiment of the present invention, the formula for calculating the time-domain denoised voltage ripple value is as follows: in, Indicates the first The time-domain denoised voltage ripple value at each moment. Indicates the first The original value of voltage ripple at each moment. Indicates the size of the time-domain denoising window. Indicates the first From the moment to the first The local average of the original voltage ripple value at each time point.

[0009] In one embodiment of the present invention, the formula for calculating the smoothing filter power value is as follows: in, Indicates the first The smoothing filter power value at each moment. Indicates the first The original value of microwave output power at each moment. Indicates the first Preset power smoothing weights at each time point This indicates the total number of raw values ​​for microwave output power.

[0010] In one embodiment of the present invention, the voltage ripple time-domain distortion rate The calculation formula is: in, Indicates the first The standard operating voltage ripple value of the magnetron filament at a given moment.

[0011] In one embodiment of the present invention, the power fluctuation variance ratio The calculation formula is: in, The variance of the smoothed filter power value at multiple times is represented by . This represents the variance of the standard operating power value of the microwave oven.

[0012] In one embodiment of the present invention, the preset number of times is 5 times, and the first... Coupled eigenvalues ​​of the next iteration The calculation formula is: in, Indicates the first Temporal adaptive weights in the next iteration Indicates the first Power adaptive weights in the next iteration Indicates the first Iterative adaptive correction coefficients for the next iteration , .

[0013] In one embodiment of the present invention, the loss gradient quantization value The calculation formula is: in, This represents the average of multiple iteratively coupled eigenvalues; The calibration failure probability The calculation formula is: .

[0014] A second aspect of this invention provides a system for determining filament loss faults in a magnetron of a household microwave oven, comprising: The acquisition module is used to acquire the raw values ​​of microwave output power and voltage ripple across the magnetron filament at multiple moments in the microwave oven. The first determining module is used to determine the time-domain denoising voltage ripple value and the smoothing filter power value at each moment based on the original voltage ripple value and the original microwave output power value. The second determining module is used to determine the voltage ripple time-domain distortion rate based on the time-domain denoised voltage ripple value and the standard operating voltage ripple value of the magnetron filament at multiple times. The first calculation module is used to calculate the power fluctuation variance ratio based on the variance of the smoothed filter power value at multiple times and the variance of the microwave oven's standard operating power value. The second calculation module is used to iteratively calculate a preset number of times based on the initial values ​​of the time-domain adaptive weights, the initial values ​​of the power adaptive weights, the voltage ripple time-domain distortion rate, the power fluctuation variance ratio, and the iterative adaptive correction coefficients to obtain multiple iterative coupling feature values. The third determination module is used to determine the loss gradient quantization value based on the average value of multiple iteratively coupled feature values. The fourth determining module is used to determine the calibration failure probability based on the loss gradient quantization value; The output module is used to determine loss fault information based on the loss gradient quantization value and the corresponding loss gradient threshold, as well as the calibration fault probability and probability threshold.

[0015] A third aspect of the present invention provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the program, it implements a method for determining filament loss faults in a magnetron of a household microwave oven, as provided in the first aspect of the present invention.

[0016] A fourth aspect of the present invention provides a computer-readable storage medium having a computer program stored thereon, wherein the computer program, when executed by a processor, implements a method for determining filament loss faults in a magnetron of a household microwave oven, as provided in the first aspect of the present invention.

[0017] The beneficial effects of this invention are: This invention collects two core types of field data that directly and sensitively reflect the micro-aging state of the magnetron filament: "time-domain characteristics of voltage ripple at both ends of the magnetron filament" and "microwave output power." It then processes and analyzes these data using a core algorithm combining "time-domain feature extraction + power fluctuation coupling + adaptive iterative correction + aging gradient quantization." This effectively captures and correlates subtle fault characteristics, fundamentally differentiating it from fault diagnosis logic for other components such as high-voltage capacitors, thus achieving precise localization of micro-aging faults in the magnetron filament. Simultaneously, the algorithm quantifies the magnitude of the filament's aging loss gradient, providing objective and accurate data support for maintenance decisions (such as repair or replacement). Maintenance personnel can quickly complete the collection and analysis of key data while the microwave oven is in its entirety; the entire process typically takes only a few minutes. This significantly shortens the fault diagnosis time for a single on-site service visit, improves the efficiency of maintenance personnel, and thus significantly reduces the overall service time and labor costs. Since the entire diagnostic process does not require any physical disassembly of the high-voltage component magnetron, nor does it require connection to professional high-voltage testing equipment, maintenance personnel can completely avoid direct contact with high-voltage circuits during operation, greatly ensuring the personal safety of maintenance personnel and the safety of equipment, making on-site maintenance work safer and more reliable.

[0018] Other features and advantages of the invention will be set forth in the description which follows, and will be apparent in part from the description, or may be learned by practicing the invention. The objects and other advantages of the invention may be realized and obtained by means of the structures particularly pointed out in the written description, claims, and drawings.

[0019] The technical solution of the present invention will be further described in detail below with reference to the accompanying drawings and embodiments. Attached Figure Description

[0020] The accompanying drawings are provided to further illustrate the invention and form part of the specification. They are used in conjunction with embodiments of the invention to explain the invention and do not constitute a limitation thereof. In the drawings: Figure 1 A flowchart illustrating a method for determining filament loss faults in a magnetron of a household microwave oven, provided in an embodiment of the present invention; Figure 2 This is a block diagram of a system for determining the filament loss fault of a magnetron in a household microwave oven, provided as an embodiment of the present invention. Detailed Implementation

[0021] The present invention will be further described in detail below with reference to specific embodiments, but the implementation of the present invention is not limited thereto.

[0022] like Figure 1 As shown, the first aspect of this invention provides a method for determining filament loss faults in a magnetron of a household microwave oven, comprising the following steps: Step 11: Obtain the original values ​​of microwave output power and voltage ripple at multiple times in the microwave oven.

[0023] Step 12: Determine the time-domain denoising voltage ripple value and smoothing filter power value at each moment based on the original voltage ripple value and the original microwave output power value.

[0024] Step 13: Determine the voltage ripple time-domain distortion rate based on the time-domain denoised voltage ripple value at multiple times and the standard operating voltage ripple value of the magnetron filament.

[0025] Step 14: Calculate the power fluctuation variance ratio based on the variance of the smoothed filter power value at multiple times and the variance of the microwave oven's standard operating power value.

[0026] Step 15: Based on the initial values ​​of the time-domain adaptive weights, the initial values ​​of the power adaptive weights, the voltage ripple time-domain distortion rate, the power fluctuation variance ratio, and the iterative adaptive correction coefficients, calculate the preset number of iterations to obtain multiple iterative coupling feature values.

[0027] Step 16: Calculate the average value of multiple iteratively coupled eigenvalues ​​to determine the loss gradient quantization value.

[0028] Step 17: Determine the calibration failure probability based on the loss gradient quantization value.

[0029] Step 18: Determine the loss fault information based on the loss gradient quantization value, the corresponding loss gradient threshold, the calibration fault probability, and the probability threshold.

[0030] This invention collects two core types of field data that directly and sensitively reflect the micro-aging state of the magnetron filament: "time-domain characteristics of voltage ripple at both ends of the magnetron filament" and "microwave output power." It then processes and analyzes these data using a core algorithm combining "time-domain feature extraction + power fluctuation coupling + adaptive iterative correction + aging gradient quantization." This effectively captures and correlates subtle fault characteristics (the correlation between voltage ripple and power fluctuation at the same time reflects the micro-aging characteristics of the filament), fundamentally differentiating it from fault diagnosis logic for other components such as high-voltage capacitors. This allows for precise localization of micro-aging faults in the magnetron filament. Simultaneously, the algorithm quantifies the magnitude of the filament's aging loss gradient, providing objective and accurate data support for maintenance decisions (such as repair or replacement). Maintenance personnel can quickly complete the collection and analysis of key data while the microwave oven is in its entirety; the entire process typically takes only a few minutes. This significantly shortens the fault diagnosis time for a single on-site service visit, improves the efficiency of maintenance personnel, and thus significantly reduces the overall service time and labor costs. Since the entire diagnostic process does not require any physical disassembly of the high-voltage component magnetron, nor does it require connection to professional high-voltage testing equipment, maintenance personnel can completely avoid direct contact with high-voltage circuits during operation, greatly ensuring the personal safety of maintenance personnel and the safety of equipment, making on-site maintenance work safer and more reliable.

[0031] Based on the first aspect of the present invention, the second aspect of the present invention provides a method for determining filament loss faults in a magnetron of a household microwave oven. The second aspect of the present invention provides a method for determining filament loss faults in a magnetron of a household microwave oven, applied to a service platform, and includes the following steps: Step 201: Obtain the original values ​​of microwave output power and voltage ripple at multiple times in the microwave oven.

[0032] In this step, when acquiring the original value of microwave output power and the original value of voltage ripple across the magnetron filament, both are acquired synchronously on the same time axis, at the same acquisition frequency (e.g., 5 times / second).

[0033] Step 202: Determine the time-domain denoising voltage ripple value and smoothing filter power value at each moment based on the original voltage ripple value and the original microwave output power value.

[0034] In this step, the time-domain denoised voltage ripple value is calculated at each time step based on the original voltage ripple value. The formula for calculating the time-domain denoised voltage ripple value is as follows: in, Indicates the first The time-domain denoised voltage ripple value at each moment (to eliminate time-domain distortion caused by high-voltage interference). Indicates the first Raw voltage ripple values ​​at each moment (unit: V, sampling frequency 5 times / second). This represents the size of the temporal denoising window (generally, the value is...). It adapts to the high-voltage time-domain interference characteristics of microwave ovens and filters instantaneous high-voltage pulse interference. Indicates the first From the moment to the first The local average of the original voltage ripple value at each time point.

[0035] In this step, the smoothed filtering power value at each moment is determined based on the preset power smoothing weight and the original value of the microwave output power. The formula for calculating the smoothed filtering power value is as follows: in, Indicates the first The smoothing filter power value at each moment. Indicates the first The original value of microwave output power at each moment (unit: W). Indicates the first The preset power smoothing weights at each time step (preset smoothing gradients, with preset values ​​of 0.1, 0.2, 0.4, 0.2, and 0.1 respectively). This represents the total number of raw microwave output power values ​​collected, which is also the total number of raw voltage ripple values ​​collected.

[0036] Smoothing and filtering of power data can reduce instantaneous power fluctuation errors. A dual preprocessing logic of "voltage ripple time-domain deviation denoising + power fluctuation weighted smoothing filtering" is employed, conforming to the time-domain interference characteristics of the high-pressure operating environment of microwave ovens. Unlike conventional denoising methods, this approach cancels high-voltage pulse interference through local mean deviation. Simultaneously, gradient-weighted smoothing is used to process the power data, further reducing interference errors while preserving the weak ripple time-domain distortion and continuous power fluctuation characteristics caused by filament micro-aging. This simplifies the complexity of subsequent feature extraction, adapts to fast mobile computing, and provides accurate data support for feature extraction. Magnetron filament loss faults are also faults caused by filament micro-aging.

[0037] Step 203: Determine the voltage ripple time-domain distortion rate based on the time-domain denoised voltage ripple value at multiple times and the standard operating voltage ripple value of the magnetron filament.

[0038] Voltage ripple time-domain distortion rate The calculation formula is: in, Indicates the first The standard operating voltage ripple value of the magnetron filament at each moment, that is, the standard value when the magnetron filament is working normally, is expressed in V. This data is pre-stored in a database, and the standard operating voltage ripple value of the magnetron filament is the same at every moment. Voltage ripple time-domain distortion rate. Unit: %. The more severe the filament aging, the higher the time-domain distortion rate, and the core characteristic is the ripple anomaly caused by aging.

[0039] Step 204: Calculate the power fluctuation variance ratio based on the variance of the smoothed filter power value at multiple times and the variance of the microwave oven's standard operating power value.

[0040] Power fluctuation variance ratio The calculation formula is: in, This represents the variance of the smoothed filter power values ​​at multiple time points. This represents the variance of the microwave oven's standard operating power values ​​at multiple points in time; this data is pre-stored in a database. Indicates the first The standard power value of the microwave oven when it is working normally at each moment, and this standard value is the same at each moment. The core characteristic is the deviation between the power fluctuation amplitude and the normal fluctuation range; the more severe the aging, the larger the ratio. The total number of standard power values ​​collected from a set of microwave ovens during normal operation is the same as the total number of original microwave output power values, both being... m indivual.

[0041] Step 205, based on the initial values ​​of the time-domain adaptive weights. Initial value of power adaptive weight The voltage ripple time-domain distortion rate, power fluctuation variance ratio, and iterative adaptive correction coefficient are used to calculate multiple iterative coupling characteristic values ​​by iterating for a preset number of times.

[0042] In this step, we first use the known initial values. and And substitute the calculation results from steps 203 and 204 into the formula: , The iterative coupling eigenvalues ​​of the first iteration are calculated. ( Then, according to the formula: The coupling eigenvalues ​​for the next iteration are calculated. Generally, A total of five calculations were performed, yielding five iterative coupled eigenvalues. Among them, Indicates the first Temporal adaptive weights in the next iteration Indicates the first Power adaptive weights in the next iteration Indicates the first The iterative adaptive correction coefficient for each iteration (decays with the number of iterations to reduce the impact of initial bias and adapt to the coupling characteristics of dual features). Generally, the initial value... , . The value range is 0 to 1.2.

[0043] Step 206: Calculate the average value of multiple iteratively coupled feature values ​​to determine the loss gradient quantization value.

[0044] Loss gradient quantization value The calculation formula is: in, This represents the average of multiple iteratively coupled eigenvalues. 1.2 represents the theoretical maximum upper limit of the iterative coupling eigenvalue. This value is based on a large number of historical samples of filament micro-aging (loss) faults (resistance increase of 5%~15%, power attenuation of 10%~20%). The maximum reasonable fluctuation range of voltage ripple time-domain distortion rate and power fluctuation variance ratio was calculated through experimental calibration. This upper limit, obtained through iterative calculation, ensures the aging gradient... A It remains stable between 0% and 100%.

[0045] Step 207: Determine the calibration failure probability based on the loss gradient quantization value.

[0046] Calibration Failure Probability The calculation formula is: .

[0047] Step 208: Determine the loss fault information based on the loss gradient quantization value, the corresponding loss gradient threshold, the calibration fault probability, and the probability threshold.

[0048] In this step, for The loss gradient threshold is: It is non-aging. It is a slight aging. Moderate to slight aging, 60 This indicates relatively severe micro-aging.

[0049] The probability threshold is: If so, then there is no fault. This indicates a filament micro-aging fault.

[0050] Specifically, the loss and fault information includes information on... The degree of wear and tear and whether it is faulty.

[0051] For example, a certain model of microwave oven has normal voltage ripple. Power standard deviation After the maintenance personnel collected and preprocessed the data, they obtained the following: , Substitute into the formula and calculate iteratively: Power fluctuation variance ratio: ; Iterative calculation of coupled eigenvalues: when k=1 After iterating 5 times, ; Aging gradient quantization: (Judged as slight micro-aging); Fault probability calibration: (The system was determined to be fault-free, but the following processing suggestion was given: it is close to the threshold, so it is recommended to focus on testing).

[0052] Based on the calculation results and troubleshooting suggestions, the maintenance personnel specifically inspected the magnetron wiring, cleaned the contacts, checked for oxidation in the circuit, and then retested it. The problem was determined to be without aging issues, and the fault was resolved.

[0053] like Figure 2 As shown, a third aspect of the present invention provides a system for determining filament loss faults in a magnetron of a household microwave oven, comprising: The acquisition module 31 is used to acquire the original values ​​of microwave output power and voltage ripple at multiple times of the microwave oven. The first determining module 32 is used to determine the time-domain denoising voltage ripple value and the smoothing filtering power value at each moment based on the original voltage ripple value and the original microwave output power value. The second determining module 33 is used to determine the voltage ripple time-domain distortion rate based on the time-domain denoised voltage ripple value at multiple times and the standard operating voltage ripple value of the magnetron filament. The first calculation module 34 is used to calculate the power fluctuation variance ratio based on the variance of the smoothed filtered power value at multiple times and the variance of the standard operating power value of the microwave oven. The second calculation module 35 is used to iterate and calculate a preset number of times based on the initial value of the time-domain adaptive weight, the initial value of the power adaptive weight, the voltage ripple time-domain distortion rate, the power fluctuation variance ratio and the iterative adaptive correction coefficient to obtain multiple iterative coupling feature values. The third determining module 36 is used to determine the loss gradient quantization value based on the average value of multiple iteratively coupled feature values; The fourth determination module 37 is used to determine the calibration failure probability based on the loss gradient quantization value; Output module 38 is used to determine loss fault information based on the loss gradient quantization value, the corresponding loss gradient threshold, the calibration fault probability, and the probability threshold.

[0054] In one embodiment of the present invention, the formula for calculating the time-domain denoising voltage ripple value is as follows: in, Indicates the first The time-domain denoised voltage ripple value at each moment. Indicates the first The original value of voltage ripple at each moment. Indicates the size of the time-domain denoising window. Indicates the first From the moment to the first The local average of the original voltage ripple value at each time point.

[0055] In one embodiment of the present invention, the formula for calculating the smoothing filter power value is as follows: in, Indicates the first The smoothing filter power value at each moment. Indicates the first The original value of microwave output power at each moment. Indicates the first Preset power smoothing weights at each time point This indicates the total number of raw values ​​for microwave output power.

[0056] In one embodiment of the present invention, the voltage ripple time-domain distortion rate The calculation formula is: in, Indicates the first The standard operating voltage ripple value of the magnetron filament at a given moment.

[0057] In one embodiment of the present invention, the power fluctuation variance ratio The calculation formula is: in, This represents the variance of the smoothed filter power values ​​at multiple time points. This represents the variance of the standard operating power value of the microwave oven.

[0058] In one embodiment of the present invention, the preset number of times is 5, the first... Coupled eigenvalues ​​of the next iteration The calculation formula is: in, Indicates the first Temporal adaptive weights in the next iteration Indicates the first Power adaptive weights in the next iteration Indicates the first Iterative adaptive correction coefficients for the next iteration , .

[0059] In one embodiment of the present invention, the loss gradient quantization value The calculation formula is: in, This represents the average of multiple iteratively coupled eigenvalues; Calibration Failure Probability The calculation formula is: .

[0060] A fourth aspect of the present invention provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the program, it implements the above-described method for determining the filament loss fault of a magnetron in a household microwave oven provided by the present invention.

[0061] The fifth aspect of this invention also provides a computer-readable storage medium having a computer program stored thereon, wherein the computer program, when executed by a processor, implements the steps of the method for determining the filament loss fault of a magnetron in a household microwave oven provided in the above-described embodiments of this invention.

[0062] The memory may include random access memory (RAM) or non-volatile memory (NVM), such as at least one disk storage device. Optionally, the memory may also be at least one storage system located remotely from the aforementioned processor.

[0063] The processors mentioned above can be general-purpose processors, including central processing units (CPUs), network processors (NPs), etc.; they can also be digital signal processors (DSPs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, or discrete hardware systems.

[0064] The method provided in this invention can be applied to electronic devices. Specifically, the electronic device can be a desktop computer, a portable computer, a smart mobile terminal, a server, etc. No limitation is made herein; any electronic device that can implement this invention falls within the protection scope of this invention.

[0065] For system / electronic device embodiments, since they are basically similar to method embodiments, the description is relatively simple, and relevant parts can be found in the description of the method embodiments.

[0066] This invention is described with reference to flowchart illustrations and / or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of the invention. It will be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, special-purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, generate instructions for implementing the flowchart illustrations and / or block diagrams. Figure 1 One or more processes and / or boxes Figure 1 A system that specifies functions in one or more boxes.

[0067] These computer program instructions may also be stored in a computer-readable storage medium that can direct a computer or other programmable data processing device to function in a particular manner, such that the instructions stored in the computer-readable storage medium produce an article of manufacture including instruction means, which are implemented in a process Figure 1 One or more processes and / or boxes Figure 1 The function specified in one or more boxes.

[0068] These computer program instructions may also be loaded onto a computer or other programmable data processing equipment to cause a series of operational steps to be performed on the computer or other programmable equipment to produce a computer-implemented process, thereby providing instructions that execute on the computer or other programmable equipment for implementing the process. Figure 1 One or more processes and / or boxes Figure 1 The steps of the function specified in one or more boxes.

[0069] Obviously, those skilled in the art can make various modifications and variations to this invention without departing from its spirit and scope. Therefore, if these modifications and variations fall within the scope of the claims of this invention and their equivalents, this invention also intends to include these modifications and variations.

Claims

1. A method for determining filament loss faults in a magnetron of a household microwave oven, characterized in that, Includes the following steps: Obtain the raw values ​​of microwave output power and voltage ripple across the magnetron filament at multiple moments in the microwave oven. Based on the original voltage ripple value and the original microwave output power value, determine the time-domain denoising voltage ripple value and smoothing filter power value at each moment; The voltage ripple time-domain distortion rate is determined based on the time-domain denoised voltage ripple value and the standard operating voltage ripple value of the magnetron filament at multiple time points. The power fluctuation variance ratio is calculated based on the variance of the smoothed filter power value at multiple times and the variance of the microwave oven's standard operating power value. Based on the initial values ​​of the time-domain adaptive weights, the initial values ​​of the power adaptive weights, the voltage ripple time-domain distortion rate, the power fluctuation variance ratio, and the iterative adaptive correction coefficients, a preset number of iterations are performed to obtain multiple iterative coupling feature values. The loss gradient quantization value is determined based on the average of multiple iteratively coupled eigenvalues. The calibration failure probability is determined based on the loss gradient quantization value. Loss fault information is determined based on the loss gradient quantization value and the corresponding loss gradient threshold, as well as the calibration fault probability and probability threshold.

2. The method as described in claim 1, characterized in that, The formula for calculating the time-domain denoised voltage ripple value is as follows: in, Indicates the first The time-domain denoised voltage ripple value at each moment. Indicates the first The original value of voltage ripple at each moment. Indicates the size of the time-domain denoising window. Indicates the first From the moment to the first The local average of the original voltage ripple value at each time point.

3. The method as described in claim 2, characterized in that, The formula for calculating the smoothing filter power value is: in, Indicates the first The smoothing filter power value at each moment. Indicates the first The original value of microwave output power at each moment. Indicates the first Preset power smoothing weights at each time point This indicates the total number of raw values ​​for microwave output power.

4. The method as described in claim 3, characterized in that, The voltage ripple time-domain distortion rate The calculation formula is: in, Indicates the first The standard operating voltage ripple value of the magnetron filament at a given moment.

5. The method as described in claim 4, characterized in that, The power fluctuation variance ratio The calculation formula is: in, The variance of the smoothed filter power value at multiple times is represented by . This represents the variance of the standard operating power value of the microwave oven.

6. The method as described in claim 1, characterized in that, The preset number of times is 5 times, the first time... Coupled eigenvalues ​​of the next iteration The calculation formula is: in, Indicates the first Temporal adaptive weights in the next iteration Indicates the first Power adaptive weights in the next iteration Indicates the first Iterative adaptive correction coefficients for the next iteration , .

7. The method as described in claim 1, characterized in that, The loss gradient quantization value The calculation formula is: in, This represents the average of multiple iteratively coupled eigenvalues; The calibration failure probability The calculation formula is: 。 8. A system for determining filament loss faults in a magnetron of a household microwave oven, characterized in that, include: The acquisition module is used to acquire the raw values ​​of microwave output power and voltage ripple across the magnetron filament at multiple moments in the microwave oven. The first determining module is used to determine the time-domain denoising voltage ripple value and the smoothing filter power value at each moment based on the original voltage ripple value and the original microwave output power value. The second determining module is used to determine the voltage ripple time-domain distortion rate based on the time-domain denoised voltage ripple value and the standard operating voltage ripple value of the magnetron filament at multiple times. The first calculation module is used to calculate the power fluctuation variance ratio based on the variance of the smoothed filter power value at multiple times and the variance of the microwave oven's standard operating power value. The second calculation module is used to iteratively calculate a preset number of times based on the initial values ​​of the time-domain adaptive weights, the initial values ​​of the power adaptive weights, the voltage ripple time-domain distortion rate, the power fluctuation variance ratio, and the iterative adaptive correction coefficients to obtain multiple iterative coupling feature values. The third determination module is used to determine the loss gradient quantization value based on the average value of multiple iteratively coupled feature values. The fourth determining module is used to determine the calibration failure probability based on the loss gradient quantization value; The output module is used to determine loss fault information based on the loss gradient quantization value and the corresponding loss gradient threshold, as well as the calibration fault probability and probability threshold.

9. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, When the processor executes the program, it implements the method for determining the filament loss fault of a magnetron in a household microwave oven as described in any one of claims 1 to 7.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by the processor, it implements the method for determining the filament loss fault of the magnetron in a household microwave oven as described in any one of claims 1 to 7.

Images