Internal storage error generator and internal storage error correction function test method of computer main board

Abstract

The present invention relates to internal storage error generator and internal storage error debugging function test method for computer mainboard. The internal storage error generator includes plug to mainboard, internal storage slot and button, which has one side connected to data lines of the internal storage slot via wires and the other side connected digital ground of the internal storage slot via wires. The test method includes inserting the internal storage error generator into the internal storage slot of the mainboard to be tested and memory bank in the internal storage error generator; and starting the tested mainboard and leading to operate system to run the test software and perform test program. The test process can verify the capability of the mainboard in detecting and debugging the internal storage data errors of 1 bit, 2 bits, continuous 4 bits, continuous 8 bits and continuous 16 bits. The test system is simple and low in hardware cost, and has less interference and influence on tested system.

Description

technical field [0001] The invention relates to a testing technology for the error correction function of the computer motherboard memory in the field of computers, in particular to a memory error generator and a corresponding computer motherboard memory error correction function testing method. Background technique [0002] Most of the components of a computer are made of semiconductors, and its very important part, the memory, is composed of multiple random read-write memory semiconductor chips and circuit boards connecting these chips. There are millions of memory cells in these semiconductor memory chips, and each cell stores information such as "0" or "1". Because the memory cooperates with the CPU to store the programs and data being executed at high speed, as an important component in the computer system, its reliability and fault tolerance have always been the subject of research in the industry. [0003] The industry has studied semiconductor and memory technology ...

AI Technical Summary

Problems solved by technology

However, for manufacturers of computer motherboards and systems, it has brought new challenges, because the hardware testing equipment and technology owned by manufacturers without chipsets can only be completed according to the hardware design recommended by the manufacturer and the code of the BIOS. The design of the product, but the lack of simple and convenient verification methods and equipment for this function

Images