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Semiconductor relay

A semiconductor and relay technology, applied in the field of semiconductor relays with fault detection function, can solve the problems of rising ambient temperature, temperature rise of semiconductor relays, and high air tightness, and achieve the effect of miniaturization

Inactive Publication Date: 2005-08-10
ORMON CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] As far as this kind of conventional semiconductor relay is concerned, although it is often used in control boards, etc., due to the high airtightness inside the control board, the air convection is not smooth, and the ambient temperature rises, resulting in an excessive rise in the temperature of the semiconductor relay. Make semiconductor elements such as triacs prone to short-circuit (turn-on) failures, etc.
[0006] However, with the above-mentioned conventional semiconductor relay, it cannot stably detect the failure of the semiconductor element unit

Method used

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Examples

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Embodiment approach 1

[0044] figure 1 It is a perspective view showing the appearance structure of the SSR of the first embodiment of the semiconductor relay of the present invention.

[0045] figure 1 The shown SSR 100 is mounted on a heat sink with screws, and a swingable cover 103 is installed on the top of the SSR 100. The cover 103 has an opening 104 corresponding to an indicator LED that is lit to indicate input status and alarm output status.

[0046] In addition, a pair of input terminals 105 , a pair of alarm output terminals 106 , and five terminals of a power supply terminal 107 are disposed on the lower surface of the cover 103 . There are also a pair of output terminals 108 (figure 1 Only one output terminal 108 is shown).

[0047] figure 2 It is a block diagram showing the schematic structure inside the SSR of the first embodiment.

[0048] figure 2 The illustrated SSR 100 has a power supply circuit 110 that supplies power to, for example, a circuit that generates an internal c...

Embodiment approach 2

[0092] Next, the semiconductor relay showing the second embodiment will be described.

[0093] As a general relay for the output of the final stage, an electromagnetic relay and a semiconductor relay having a semiconductor element are used.

[0094] Semiconductor relays using semiconductor elements in the final stage are superior in high-speed response and long life, but it is difficult to avoid open circuit failures, so short circuit failures can cause danger, and are used in combination with electromagnetic relays.

[0095] In particular, for relays used for safety purposes, safety relays with further improved reliability and well-known electromagnetic relays are used. From the above-mentioned point of view, semiconductor relays were considered to be unreliable in the past. Therefore, it is generally recommended to adopt a structure combining semiconductor relays and electromagnetic relays from the beginning to improve reliability.

[0096] However, this kind of relay needs...

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Abstract

The invention relates to a semiconductor relay, comprising a voltages detecting circuit 116, an element driving circuit 112, a logic judgment circuit 119 and a filter circuit 120, wherein, the voltages detecting circuit 116 is used for detecting the voltage across the bidirectional triode thyristor 114 and outputting the voltage detection signal between the elements corresponding to the voltage across exceeding or without exceeding the threshold; the element driving circuit 112 is used for outputting the element driving signal according to the input controlling signal; the logic judgment circuit 119 is used for outputting the logic judgment signal according to whether a voltage detection signal or an element driving signal exists; the filter circuit 120 is used for eliminating the interference factors in the logic judgment signal and outputting the element safety signal. The semiconductor relay has the advantages of detecting the faults of the bidirectional triode thyristor reliably.

Description

[0001] This patent application is a divisional application of a patent application with an application date of November 21, 2001, an application number of 01130376.X, and a title of "semiconductor relay and its control method". technical field [0002] The present invention relates to a semiconductor relay, such as a solid state relay (hereinafter referred to as SSR), etc., more specifically, a semiconductor relay with a fault detection function. Background technique [0003] Semiconductor relays, such as SSRs, are devices used to drive heaters, motors, or solenoid valves as direct loads. For example, thermostats control the energization of heaters as direct loads by controlling the drive of SSRs. [0004] This SSR performs on / off control of a semiconductor element such as a triac, based on an element drive signal corresponding to a control input signal output from a temperature regulator, for example, to perform a direct load such as a heater. However, when the semiconducto...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01H51/30H03K17/082H03K17/18
CPCH03K17/0824H03K17/18H01H51/30
Inventor 堀端健司中山晃行中村敏之山田隆章桥本雄士原田和
Owner ORMON CORP