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System for cleaning substrate

A substrate and cleaning technology, applied in the system field, can solve the problems of serious pollution in the clean room and the cleanliness of the clean room.

Inactive Publication Date: 2005-11-23
SK HYNIX INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0010] Moreover, the inside of the housing is not a closed space from the clean room, and therefore, the pollution of the clean room also becomes serious
Specifically, the fumes are diffused into the clean room outside the housing through the holes for putting the substrates into and taking out the substrates from the housing and through the gaps of the substrate inlets inside the housing, and these diffused fumes are harmful to the clean room. cleanliness creates a serious problem

Method used

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  • System for cleaning substrate
  • System for cleaning substrate
  • System for cleaning substrate

Examples

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Embodiment Construction

[0021] The system for cleaning a substrate according to a preferred embodiment of the present invention will be described in detail with reference to the accompanying drawings.

[0022] Figures 2 and 3A are respectively a schematic configuration view and a perspective view showing a cleaning device according to a preferred embodiment of the present invention.

[0023] Referring to Figures 2 and 3A, the cleaning device according to the present invention includes a plurality of dipping tanks 202A to 202D, which are located at the bottom of the housing 201, and a plurality of robotic arms 203A to 203E, which are located at the top part of the housing 201, It is located above a plurality of dipping tanks 202A to 202D. A substrate inlet, which is enabled by opening and closing actions, is formed on the top of each of the dipping tanks 202A to 202D. Therefore, through the substrate entrance, the plurality of robot arms 203A to 203E put the substrate into the corresponding immersion tank...

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PUM

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Abstract

Disclosed is a system for cleaning a substrate such as a semiconductor wafer in wet type to thereby reduce airborne molecular contaminants (AMCs) in a wet station and a cleaning room by efficiently exhausting fumes generated during a wet cleaning process. The system for cleaning the substrate includes: a housing; a plurality of bathes placed inside of the housing; a transferring means placed on a top portion of the plurality of bathes for transferring a substrate; a first exhausting means connected to the plurality of bathes for exhausting fumes inside of the plurality of bathes; and a second exhausting means placed in a space inside of the housing and outside of the plurality of bathes for exhausting chemical fumes.

Description

Technical field [0001] The present invention relates to a system for wet cleaning of substrates, such as semiconductor wafers; and more specifically, to a system for reducing wet stations and clean rooms by effectively discharging fumes generated during the wet cleaning process Airborne molecular contaminant (AMC). Background technique [0002] As is well known, after performing a series of steps, such as depositing a thin layer, etching, polishing, and implanting ions, the substrate should be subjected to a wet cleaning process to continue the subsequent process. The wet station contains multiple dipping tanks with different chemistries; and therefore, the substrate is sequentially transferred to each dipping tank placed close to each other. [0003] Figure 1 is a diagram conceptually illustrating a conventional chemical mechanical polishing (CMP) wet station. [0004] As shown in the figure, a plurality of immersion tanks 102A, 102B, 102C and 102D are placed in the bottom part ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/306B08B3/00B08B3/04B08B15/02
CPCB08B2215/003B08B15/02B08B3/04E02B7/36E02B7/28
Inventor 朴炫烈裵钟坤
Owner SK HYNIX INC