Semiconductor memory device using only single-channel transistor to apply voltage to selected word line

A storage device, a technology for transmitting voltage, applied in semiconductor devices, read-only memories, information storage, etc., can solve the problems of increased risk, inability to realize data writing operations, and increased circuit pattern area of ​​row decoders, etc. High performance, realizing the effect of data writing action and sufficient data writing action

Inactive Publication Date: 2006-07-19
TOSHIBA MEMORY CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Therefore, there is a problem that the pattern area of ​​the row decoder circuit increases
[0025] In addition, in order to solve this problem, if the transistors connected to the word lines are provided as one per word line in the row decoder circuit, a pump circuit is required in the row decoder circuit, and since the pattern area of ​​the pump circuit increase, there is still the problem of increasing the graphic area of ​​the row decoder circuit
[0026] Furthermore, when the row decoder circuit is provided with one transistor connected to the word line per word line, and no pump circuit is provided in the row decoder circuit, it cannot be achieved without a voltage drop. Sending high voltage for writing to the word line increases the risk of insufficient data writing operation

Method used

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  • Semiconductor memory device using only single-channel transistor to apply voltage to selected word line
  • Semiconductor memory device using only single-channel transistor to apply voltage to selected word line
  • Semiconductor memory device using only single-channel transistor to apply voltage to selected word line

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Embodiment Construction

[0077] 3 is a diagram for explaining a semiconductor memory device according to an embodiment of the present invention, and is a block diagram showing a schematic configuration of a NAND-type EEPROM. To the memory cell array 101, a bit line control circuit (sense amplifier and data latch) 102 for performing data writing, reading, rewriting, and verify reading is connected. The bit line control circuit 102 is connected to a data input / output buffer 106 and receives an output of a column decoder 103 that receives an address signal from an address buffer 104 as an input.

[0078] In addition, on the above-mentioned memory cell array 101, a row decoder 105 for controlling the control gate and the select gate, and a p-type silicon substrate (or p-type well) for controlling the formation of the memory cell array 101 are connected. region) potential of the substrate potential control circuit 107. In addition, in order to generate high voltage Vpp (approximately 20 V) and intermediat...

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Abstract

A semiconductor memory device has a memory cell array, a first transistor of a first conductivity type, a second transistor of a second conductivity type and a third transistor of the first conductivity type. A source or drain of the first transistor is connected to each of word lines. A drain of the second transistor is connected to a gate of the first transistor. A source of the third transistor is connected to the gate of the first transistor. The gates of the second transistor and the third transistor are not connected, a source of the second transistor is not connected to a drain of the third transistor, and the gate of the second transistor and the drain of the third transistor have different voltage levels corresponding to opposite logic levels each other.

Description

[0001] This application is a divisional application of the invention patent application with the application number 01120869.4, the application date is June 8, 2001, and the invention title is "semiconductor storage device that only uses single-channel transistors to transmit voltage to selected word lines". technical field [0002] The present invention relates to a semiconductor storage device, and more specifically to a nonvolatile semiconductor storage device such as a NAND cell, a NOR cell, a DINOR cell, and an AND cell type EEPROM. Background technique [0003] Conventionally, an electrically rewritable EEPROM is known as a semiconductor memory device. What is striking is that the NAND cell type EEPROM, in which a plurality of memory cells are connected in series to form a NAND cell block, can be highly integrated. [0004] A memory cell, one of the NAND cell types EEPEOM, has a FET-MOS structure in which a floating gate (charge storage layer) and a control gate are la...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11C16/06H01L27/115H01L29/78H10B69/00
Inventor 中村宽今宫贤一
Owner TOSHIBA MEMORY CORP
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