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Method and structure to develop a test program for semiconductor integrated circuits

A technology for testing systems and testing modules, applied in the U.S. Provisional Application No.60/Field filed on May 22, can solve problems such as annoying translation mode files

Inactive Publication Date: 2007-06-27
ADVANTEST CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This leads to annoying rounds of translating schema files every time a device provider chooses to use a different device provider's test device

Method used

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  • Method and structure to develop a test program for semiconductor integrated circuits
  • Method and structure to develop a test program for semiconductor integrated circuits
  • Method and structure to develop a test program for semiconductor integrated circuits

Examples

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Embodiment Construction

[0031] [31] provides a method and system for managing pattern object files in a modular testing system. The following description is presented to enable any person skilled in the art to make and use the invention. Descriptions of specific implementations and applications are provided as examples only. Various modifications and combinations of the examples described herein will be readily apparent to those skilled in the art, and the general principles defined herein may be applied to other examples and applications without departing from the spirit and scope of the invention. Thus, the present invention is not intended to be limited to the examples described and shown, but is to be accorded the widest scope consistent with the principles and features disclosed herein.

[0032] [32] The present invention is generally described in terms of an open architecture as described in US Application Nos. 60 / 449,622, 10 / 404,002, and 10 / 403,817 of the present assignee. However, those ski...

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PUM

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Abstract

A method for managing a pattern object file in a modular test system is disclosed. The method includes providing a modular test system, where the modular test system comprises a system controller for controlling at least one site controller, and where the at least one site controller controls at least one test module and its corresponding device under test (DUT). The method further includes creating an object file management framework for establishing a standard interface between vendor-supplied pattern compilers and the modular test system, receiving a pattern source file, creating a pattern object metafile based on the pattern source file using the object file management framework, and testing the device under test through the test module using the pattern object metafile.

Description

technical field [0001] [1] This application is a continuation-in-part of co-pending U.S. Application No. 10 / 772,434, "Method and Structure to Develop a Test Program for Semiconductor Integrated Circuits," filed February 6, 2004, and claims that rights and interests. This Application No. 10 / 772,434 claims the benefit of Application No. 60 / 447,839, "Method and Structure to Develop a Test Program for Semiconductor Integrated Circuits," filed February 14, 2003. This application also claims the benefit of US Provisional Application No. 60 / 573,577, "Software Development in an Open Architecture Test System," filed May 22, 2004. All of the above applications are assigned to Advantest Corporation and are hereby incorporated by reference in their entirety. [0002] [2] The present invention relates to the field of automatic test equipment (ATE) for semiconductor testing. More specifically, the present invention relates to methods and systems for managing schema object files in a modu...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/319G01R31/3183G06F11/26G06F17/50
Inventor 哈森吉特·辛格安康·普拉马尼克马克·埃尔斯顿田原善文足立敏明
Owner ADVANTEST CORP