Semiconductor device, method for manufacturing a semiconductor device, semiconductor testing device and semiconductor device testing device

Abstract

A semiconductor device according to the present disclosure has a structure in which terminals of different shapes coexist in a housing, or a structure in which the distances between terminals exposed to the outside of the housing are not uniform in a part of the housing, wherein the semiconductor device comprises: a semiconductor element; a resin part provided to cover the semiconductor element; a plurality of terminals, each having one end electrically connected to the semiconductor element and another end having an exposed portion through a surface of the resin part; and an identification part provided on the surface of the resin part having a function by which the position of the exposed portion of each of the plurality of terminals can be identified.

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