Testing characteristics of radio-frequency transponder assembly

Abstract

There is provided a method for determining at least one characteristic of an RFID tag assembly comprising at least an integrated circuit, IC. The method comprises providing, from a test reader, an RF waveform to the IC; receiving, at the test reader, a backscattered reply from the IC, wherein the IC forms the backscattered reply by impressing an information signal on the RF waveform. While receiving the backscattered reply, the RF waveform is altered, thereby changing the backscattered reply. The method further comprises measuring the affected backscattered reply, and determining the characteristic based on the measured changed backscattered reply caused by the altering.