EQUIPMENT FOR DIMENSIONAL CONTROL OF CERAMIC TILES

Description

Patent Description for Industrial Invention entitled: “EQUIPMENT FOR DIMENSIONAL CONTROL OF CERAMIC TILES”. On behalf of: MAIN LABORATORY SASSUOLO Srl, a company incorporated and existing under Italian law, having its headquarters in 42019 SCANDIANO (KING). Designated Inventor: GAIDO Giulia. DESCRIPTION The present invention relates to an apparatus for the control dimensional of ceramic tiles, particularly suitable for the checking the quality of a ceramic tile and other sheet materials such as natural stones, agglomerates or other. There are different types of equipment known that allow the measurement of the dimensional characteristics of ceramic tiles, used in particular to check the length, width and straightness of the edges, squareness and flatness of the tile. According to a first type of known type of equipment, the measurement of the dimensional characteristics is carried out on ceramic tiles arranged horizontally and supported on three points. However, the horizontal arrangement of the tiles has its limitations. evident, specifically with regard to the reliability of the measurement of the flatness, and therefore of the various curvatures present, in particular for tiles large-format ceramics. In fact, according to the existing legislation it is necessary to calibrate the sensors of the equipment prior to measurement and this calibration is made using ground metal plates. However, this calibration does not take into account the fact that each tile is characterized by a specific weight and a different rigidity / flexibility from those of the metal plate, differences which are further accentuated by large format tiles which can lead to different curvatures due to the three-point horizontal positioning. To overcome this problem, the use of equipment is known measurement of dimensional characteristics with vertical arrangement of the tiles. Specifically, these devices have a support frame arranged vertically and capable of vertically supporting a tile ceramic during measurement. The frame supports a plurality of measurement sensors, consisting for example of digital comparators, which can be moved along the frame by means of appropriate action actuators for measurements at different points on the sides and on at least one of the tiles, for tiles of different sizes. These sensors therefore allow all the necessary detections to be carried out for the measures relating to flatness, orthogonality, length, width and straightness of the tiles. However, even such vertical measuring equipment has some drawbacks. major drawbacks. In fact, to carry out calibration operations it is generally necessary the use of appropriate references consisting of metal calibration plates rectified of different sizes, corresponding to the dimensions of the specific tile to measure. This necessarily involves the storage and maintenance of more calibration plates of different sizes, corresponding precisely to tiles ceramics of different sizes which must be possible to carry out measurement using the equipment. Additionally, calibration plates can become damaged during use or movement and, therefore, it is necessary to ensure the availability of more replacement calibration plates, for each of the useful dimensions, as well as carry out continuous maintenance of the calibration plates and, indeed, of the their “calibration”. Therefore, the need to have available rectified calibration plates of every possible size, even for large format tiles, together with the need to have replacement calibration plates, involves a problematic use of known types of equipment, in particular along tile production lines. It should also not be overlooked that such plates, especially those of large size dimensions, they are very heavy, therefore impossible to move by hand of a single technician. It should also be added that it is difficult to produce calibration plates with excellent flatness characteristics, as at the time of cutting “they twist” and therefore result in a questionable “zero” reference. The main task of the present invention is to devise a equipment for the dimensional control of ceramic tiles which allows for a practical and simple calibration without the need to use ground calibration plates. Another purpose of the present invention is to devise an apparatus for the dimensional control of ceramic tiles which allows to overcome the aforementioned drawbacks of the prior art in the context of a solution simple, rational, easy and effective to use and low cost. The above mentioned purposes are achieved by this equipment for the dimensional control of ceramic tiles, according to the characteristics described in claim 1. Other features and advantages of the present invention will be found more evident from the description of a form of execution preferred, but not exclusive, control device dimensional of ceramic tiles, illustrated for information purposes only, but not limiting, in the attached tables of drawings in which: Figure 1 is an axonometric view of the equipment according to the invention; Figures 2 to 6 illustrate a setup procedure of the apparatus according to the invention; Figures 7 and 8 illustrate a positioning and measurement phase of a tile using the apparatus according to the invention. With particular reference to these figures, a globally indicated 1 is equipment for the dimensional control of ceramic tiles, can be used in particular to check the quality of a tile ceramic. In particular, the apparatus 1 allows the measurement of the dimensional characteristics of ceramic tiles, in order to verify length, width, straightness of edges, squareness and flatness of the tiles. The apparatus 1 comprising a support frame 2 substantially vertical, configured to vertically support a ceramic P tile, Therefore, once positioned on the support frame 2 for the operations of measure, the P tile is arranged on a substantially vertical plane. According to a preferred embodiment of the apparatus 1, illustrated in the figures, the support frame 2 is inclined by 5 degrees with respect to the upright position, so as to ensure the support and support of a P tile during measurement operations. The support frame 2 includes a base 3 for resting on the ground. Usefully, base 3 is equipped with adjustable support feet in order to adjust the tilt of the frame. Always according to a preferred embodiment, the support frame 2 It has a substantially rectangular shape and includes at least one lower crosspiece 4 horizontal and at least one lateral upright 5 vertical. Preferably, the support frame 2 has a square shape. Furthermore, the support frame 2 comprises support means 6, 7, 8 of the tile P in a substantially vertical position. Specifically, the support means 6, 7, 8 comprise at least one pair of 6 lower support elements associated with each other spaced at a distance lower portion of the support frame 2. The lower support elements 6 are intended to support the lower edge of the tile P to measure. According to a preferred embodiment, illustrated in the figures, a first lower support element 6 is fixedly associated to one end of the lower crosspiece 4, in correspondence with the side upright 5, while a second lower support element 6 is associated with sliding along the lower crosspiece 4. The position of the second lower support element 6 along the lower crosspiece 4 is adjustable according to the size of the P tile to be measured. Furthermore, the support means 6, 7, 8 comprise at least one element of lateral support 7 associated with a lateral portion of the support frame 2. The lateral support element 7 is intended to accommodate the support one of the side edges of the P tile to be measured. According to a preferred embodiment, illustrated in the figures, the lateral support element 7 is fixedly associated with one end of the lower crosspiece 4, in correspondence with the side upright 5. Finally, the support means 6, 7, 8 comprise at least a plurality of 8 rear support elements associated with each other spaced apart from the frame support 2. The rear support elements 8 are intended to accommodate in support of the surface of the operating surface of the tile P from measure. Always according to the preferred embodiment illustrated in the figures, a first rear support element 8 is fixedly associated at one end of the lower crosspiece 4, in correspondence with the side upright 5, a second rear support element 8 is associated with sliding along the lower crosspiece 4, while a third support element 8 is associated sliding side upright 5. The positions of the second and third element 8 rear support are adjustable according to the size of the P tile to be measured. Please note that, with reference to this description, terms such as “lower,” “upper,” and “lateral” refer to the conventional positioning of equipment 1 and ceramic tiles during the measurement operations. Furthermore, the “working surface” of the P tile means the face of the P tile facing the equipment 1 during the operations measure. Furthermore, the apparatus 1 comprises means for dimensional control 9, 10, 11, 12 of a ceramic P tile. Specifically, the means for dimensional control 9, 10, 11, 12 include at least one sensor for measuring the length of the tile 9 P, mobile associated with the support frame 2. Furthermore, the means for dimensional control 9, 10, 11, 12 include at least one sensor for measuring the orthogonality 10 of the tile P, associated movable to the support frame 2 and positionable on the support frame 2 in different positions depending on the size of the tile P from measure. The squareness measuring sensor 10 is configured to measure the distance from one of the lateral edges of the tile P to be measured, in proximity to one of the upper corners of the P tile, once positioned vertically on the support frame 2. Furthermore, the means for dimensional control 9, 10, 11, 12 include at least one sensor for measuring the straightness 11 of the tile P, associated movable to the support frame 2 and positionable on the support frame 2 in different positions depending on the size of the tile P from measure. The straightness measurement sensor 11 is configured to measure the distance with respect to a substantially central portion of one of the edges of the tile P to be measured, once positioned vertically on the frame of support 2. Finally, the means for dimensional control 9, 10, 11, 12 include a plurality of sensors for measuring the flatness 12 of the tile P, associated movable to the support frame 2 and positionable on the support frame 2 in different positions depending on the size of the tile P from measure. The flatness measuring sensors 12 are configured to measure the distance at three different points with respect to the surface of one of the faces of the tile P to be measured, once positioned vertically on the frame of support 2. The apparatus 1 also comprises at least one processing unit operationally connected to the dimensional control equipment 9, 10, 11, 12 and configured to calculate dimensional parameters (length, width, straightness of the edges, orthogonality and flatness) of the tile P and to perform a calibration phase of the means for dimensional control 9, 10, 11, 12. With reference to the embodiment illustrated in the figures, a generic control panel 13. The processing unit can be implemented, for example, by a computer equipped with dedicated software and connected to the control panel control 13. Advantageously, the apparatus 1 allows to carry out the phase of calibration automatically and without the aid of metal calibration plates. In particular, the apparatus 1 comprises actuation means for the movement of the length measuring sensor 9 on the frame support 2. Furthermore, the length measuring sensor 9 includes an encoder incremental configured to detect the position of the sensor itself on the support frame 2. Advantageously, the calibration phase includes at least the following steps: - using the actuating means, position the measuring sensor of the length 9 in a reference position on the support frame 2, corresponding to the “zero” of the length measuring sensor 9; - detect the reference position using the said incremental encoder and store that reference position. In particular, the reference position is defined at a portion of the support frame 2 intended to accommodate one of the supports edges of the P tile. Furthermore, according to a preferred embodiment, the measuring sensor of the length 9 is a contact sensor that can be positioned in the measuring position, at one of the edges of the tile P opposite to the position of reference, for detection by digital distance encoder with respect to the reference position and, therefore, the length of the P tile. According to the preferred embodiment illustrated in the figures, the sensor measuring length 9 is movable along the lateral upright 5 and the reference position is defined at the lower end of the side pillar 5. In particular, the reference position is defined at the first lower support element 6. Therefore, the calibration operations involve automatic movement of the length measuring sensor 9 in the reference position corresponding to the zero of the sensor itself, at the end lower part of said side upright 5. During the measurement, the length measuring sensor 9 is moved manually in the measuring position, at the edge top of the P tile, for detection by digital encoder of the distance from the reference position and, therefore, of the length of the P tile. Advantageously, the apparatus 1 further comprises at least one reference element 14 movable associated with the support frame 2 and positionable in correspondence with each of the measurement sensors of the flatness 12. Furthermore, the calibration phase includes at least the following steps: - place the reference element 14 in correspondence with each of the flatness measuring sensors 12; - detect, by means of the flatness measuring sensors 12, a distance of reference to the reference element 14, corresponding to the “zero” of the flatness measurement sensor 12, and store the distance of reference. In particular, the support frame 2 comprises at least one support plane 15 of the flatness measurement sensors 12. The flatness measurement sensors 12 are removably associated with this support plan 15 depending on the dimensions of the P tile to be measured. Preferably, the flatness measuring sensors 12 are associated removable to the support plane 15 for magnetic coupling. In particular, the support plane 15 is substantially vertical. Furthermore, the support plan 15 has a substantially similar shape rectangular and extends over the entire surface of the support frame 2 useful to carry out measurement operations on ceramic tiles of different sizes dimensions. Preferably, the support plane 15 has a square shape. Preferably, the reference element 14 consists of a rod 14 sliding associated with the support frame 2 and parallel to the support plane 15 of the flatness measuring sensors 12. Therefore, during the calibration phase, the rod 14 is moved from one side to the other of the support plan 15 for the detection and setting of a reference distance for each of the flatness measuring sensors 12. Advantageously, the apparatus 1 comprises at least one square calibrated 16 positionable on the support frame 2. The calibration phase includes at least the following steps: - detect, by means of the orthogonality measuring sensor 10, a distance reference with respect to a first side of the calibrated square 16, corresponding to the “zero” of the orthogonality measurement sensor 10, and store this reference distance; - detect, by means of the straightness measurement sensor 11, a distance reference with respect to a second side of the calibrated square 16, corresponding to the “zero” of the straightness measurement sensor 11, and store the reference distance. Therefore, the calibrated square 16 can be positioned on the support frame 2, in the position intended to accommodate the P tiles, for the calibration of the 10 squareness measuring sensor and 10 squareness measuring sensor straightness 11. The calibrated square 16 is appropriately sized to allow the Calibration of sensors for measuring tiles of different sizes. At least one of said orthogonality measuring sensor, said straightness measurement 11, said flatness measurement sensors 12 is of the type of a laser sensor. According to a preferred embodiment, such sensors are all of the laser sensor type. According to the preferred embodiment illustrated in the figures, the sensor of orthogonality measurement is associated with vertical sliding to the side upright 5 and can be positioned to fit tiles of different sizes. In particular, during the measurement, the orthogonality measuring sensor is positioned at a lateral edge of the P tile measure, near the top corner. Always according to the preferred embodiment illustrated in the figures, the straightness measurement sensor 11 is associated with horizontally sliding to the lower crosspiece 4 and can be positioned to fit tiles of different sizes. In particular, during the measurement, the straightness measuring sensor 11 is positioned in correspondence with a substantially central portion of the bottom edge of the P tile to be measured. In practice, it has been found that the described invention achieves the objectives proposed. In particular, it is emphasized that the equipment according to The invention allows for a practical and simple calibration of all sensors without the need to use ground calibration plates.

Claims

1) Apparatus (1) for the dimensional control of ceramic tiles, comprising a substantially vertical support frame (2), configured to vertically support a ceramic tile (P), and means for the dimensional control (9, 10, 11, 12) of a ceramic tile (P), wherein said means for the dimensional control (9, 10, 11, 12) comprise: - at least one sensor for measuring the length (9) of the tile (P), movably associated with said support frame (2); - at least one sensor for measuring the orthogonality (10) of the tile (P), movably associated with said support frame (2) and configured to measure the distance with respect to one of the lateral edges of the tile (P), in proximity to one of the upper corners of the tile (P);- at least one sensor for measuring the straightness (11) of the tile (P), movably associated with said support frame (2) and configured to measure the distance with respect to a substantially central portion of one of the edges of the tile (P) to be measured; - a plurality of sensors for measuring the flatness (12) of the tile (P), movably associated with said support frame (2) and configured to measure the distance in three different points with respect to the surface of one of the faces of the tile (P) to be measured; - at least one processing unit operatively connected to said means for dimensional control (9, 10, 11, 12), configured to calculate dimensional parameters of the tile (P) and to perform a calibration phase of said means for dimensional control (9, 10, 11, 12);characterised in that it comprises actuation means for moving said length measuring sensor (9) on said support frame (2), in that said length measuring sensor (9) comprises an incremental encoder configured to detect the position of said length measuring sensor (9) on said frame, and in that said calibration step comprises at least the following steps: - by means of said actuation means, positioning said length measuring sensor (9) in a reference position on said support frame (2); - detecting said reference position by means of said incremental encoder and storing said reference position.; 2) Apparatus (1) according to claim 1, characterised in that it comprises at least one reference element (14) movably associated with said support frame (2) and positionable in correspondence with each of said flatness measurement sensors (12), and in that said calibration phase comprises at least the following steps: - positioning said reference element (14) in correspondence with each of said flatness measurement sensors (12); - detecting, by means of said flatness measurement sensors (12), a reference distance with respect to said reference element (14) and memorising said reference distance. 3) Apparatus (1) according to one or more of the preceding claims, characterised in that it comprises at least one calibrated square (16) positionable on said support frame (2), and in that said calibration phase comprises at least the following steps: - by means of said orthogonality measurement sensor (10), detecting a reference distance with respect to one side of said calibrated square (16) and memorising said reference distance; - by means of said straightness measurement sensor (11), detecting a reference distance with respect to one side of said calibrated square (16) and memorising said reference distance. 4) Apparatus (1) according to one or more of the preceding claims, characterised in that said support frame (2) has a substantially rectangular shape and comprises at least one horizontal lower crosspiece (4) and at least one vertical lateral upright (5). 5) Apparatus (1) according to one or more of the preceding claims, characterised in that said support frame (2) comprises means (6, 7, 8) for supporting the tile (P) in a substantially vertical position. 6) Apparatus (1) according to one or more of the preceding claims, characterised in that said reference position is defined in correspondence with a portion of the support frame (2) intended to accommodate one of the edges of the tile (P), and in that said length measurement sensor (9) is a contact sensor that can be positioned in said measurement position, in correspondence with one of the edges of the tile (P) opposite to said reference position, for the detection by means of said digital encoder of the distance with respect to said reference position. 7) Apparatus (1) according to one or more of the preceding claims, characterised in that said length measuring sensor (9) is movable along said lateral upright (5), said reference position being defined at the lower end of said lateral upright (5). 8) Apparatus (1) according to one or more of the preceding claims, characterised in that at least one of said orthogonality measurement sensor (10), said straightness measurement sensor (11), said flatness measurement sensors (12) is of the type of a laser sensor. 9) Apparatus (1) according to one or more of the preceding claims, characterised in that said support frame (2) comprises at least one support plane (15) of said flatness measurement sensors (12), said flatness measurement sensors (12) being removably associated with said support plane (15) depending on the dimensions of the tile (P) to be measured. 10) Apparatus (1) according to one or more of the preceding claims, characterised in that said reference element (14) comprises at least one rod (14) slidably associated with said support frame (2) and parallel to said support plane (15) of said flatness measurement sensors (12).