Sample supply system of an analytical instrument
Patent Information
- Application Number
- JP2025500855
- Authority / Receiving Office
- JP · JP
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2022-07-15
- Filing Date
- 2023-07-11
- Publication Date
- 2026-07-13
AI Technical Summary
Existing sample supply systems for ICP spectrometers and similar analytical instruments face inefficiencies due to the need for all samples to pass through dilution modules, even when not required, leading to reduced productivity and increased analysis time, especially for samples outside the calibration range.
A sample supply system with a dual-mode operation that allows undiluted samples to bypass the dilution module for direct analysis and enables inline dilution only for samples that need it, using a valve assembly and fluid pumps to control sample and diluent flow, minimizing the impact on productivity.
The system enhances productivity by allowing undiluted samples to be analyzed quickly and reducing the size of the external sample reservoir, while ensuring accurate inline dilution for out-of-range samples, thus optimizing the analysis process.
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