Optical system and electromagnetic wave detection device
The optical system optimizes wave propagation paths in Lidar devices to reduce loss and enhance sensitivity by separating emitted and reflected wave directions, improving measurement accuracy.
Patent Information
- Authority / Receiving Office
- JP · JP
- Patent Type
- Applications
- Current Assignee / Owner
- KYOCERA CORP
- Filing Date
- 2024-12-12
- Publication Date
- 2026-06-24
Smart Images

Figure 2026103734000001_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to an optical system and an electromagnetic wave detection device.
Background Art
[0002] In a ranging device such as Lidar, an optical member that reflects or transmits light is used. While the propagation axes of the radiation wave emitted from the radiation source and the reflected wave from the irradiation target coincide, the reflected wave that has passed through the optical member is detected by the detector (see Patent Document 1).
Prior Art Documents
Patent Documents
[0003]
Patent Document 1
Summary of the Invention
Problems to be Solved by the Invention
[0004] However, when the optical member reflects or transmits electromagnetic waves, a part of the electromagnetic waves is lost, the light amount decreases, and the measurement sensitivity decreases.
[0005] Therefore, an object of the present disclosure made in view of the problems of the prior art as described above is to reduce the loss of electromagnetic waves.
[0006] To solve the above-described various problems, an optical system according to a first aspect is an optical member in which, in a first region on a first surface and in a second region, electromagnetic waves emitted from a radiation unit travel in a first direction from the first region, and reflected waves of the electromagnetic waves reflected by an object travel in a second direction different from the first direction from the second region; a detection unit that detects the reflected wave traveling in the second direction.
[0007] An electromagnetic wave detection device according to a second aspect is an optical system according to the first aspect, The system includes a scanning unit that changes the radiation direction of the electromagnetic wave traveling in the first direction. [Effects of the Invention]
[0008] According to the optical system described above, electromagnetic wave loss is reduced. [Brief explanation of the drawing]
[0009] [Figure 1] This is a configuration diagram of the optical system and electromagnetic wave detection device according to the first embodiment. [Figure 2] Figure 1 is a functional block diagram showing the schematic configuration of an electromagnetic wave detection device, including the optical system. [Figure 3] This is a configuration diagram of the optical system and electromagnetic wave detection device according to the second embodiment. [Figure 4] This is a configuration diagram of the optical system and electromagnetic wave detection device according to the third embodiment. [Modes for carrying out the invention]
[0010] Hereinafter, embodiments of optical systems and electromagnetic wave detection devices to which this disclosure is applied will be described with reference to the drawings.
[0011] As shown in Figure 1, in this disclosure, the optical system 10 comprises an optical element 11 and a detection unit 12. The optical system 10 may further comprise a collimator lens 13 and a focusing lens 14. The optical system 10 may together with a scanning unit 21 to constitute an electromagnetic wave detection device 20. The electromagnetic wave detection device 20 may further comprise a radiating unit 22 and a control unit 23, as shown in Figure 2.
[0012] In the drawings of this application, electromagnetic waves are depicted with dashed lines. In addition, in the drawings of this application, wireless or wired communication lines that transmit signals between functional blocks are depicted with solid lines.
[0013] As shown in Figure 2, electromagnetic waves em emitted by the radiating unit 22 are irradiated onto the object ob via the optical system 10. The reflected waves re of the electromagnetic waves em irradiated onto the object ob are incident on the optical system 10. The control unit 23 generates information about the object ob based on the electromagnetic waves em emitted by the radiating unit 22 and the reflected waves re detected by the detection unit 12 of the optical system 10. The components of the electromagnetic wave detection device 20 are described in detail below.
[0014] In this specification, the reflection of any electromagnetic wave by any optical component may mean that the component reflects the electromagnetic wave with a reflectance of more than 50%. Furthermore, the reflectance of the optical component to the electromagnetic wave is preferably more than 70%, more preferably more than 80%, even more preferably more than 90%, and most preferably substantially 100%.
[0015] In this specification, the transmission of any electromagnetic wave by any optical component may mean that the electromagnetic wave is transmitted with a transmittance of more than 50%. Furthermore, the transmittance of the optical component to the electromagnetic wave is preferably more than 70%, more preferably more than 80%, even more preferably more than 90%, and most preferably substantially 100%.
[0016] As shown in Figure 1, the radiating unit 22 may emit electromagnetic waves em. The electromagnetic waves em may include, for example, at least one of infrared rays, visible light, ultraviolet rays, and radio waves. The electromagnetic waves em may be invisible light such as near-infrared rays. The radiating unit 22 may emit electromagnetic waves em in the form of a narrow beam, for example, 0.5°. Alternatively, the radiating unit 22 may emit electromagnetic waves em in a pulsed manner. The radiating unit 22 may switch between emitting and stopping electromagnetic waves em based on the control of the control unit 23. The radiating unit 22 may include, for example, a radiation source such as an LD (Laser Diode) and an LED (Light Emitting Diode).
[0017] The collimator lens 13 may collimate the electromagnetic waves em emitted by the radiating part 22.
[0018] The optical member 11 may be located in the radiation path of the electromagnetic wave em collimated by the collimator lens 13. The optical member 11 may be located, for example, in the radiation direction of the electromagnetic wave em via the collimator lens 13. Alternatively, the optical member 11 may be located, for example, in the direction in which the electromagnetic wave em collimated by the collimator lens 13 is deflected using at least one mirror.
[0019] The optical member 11 has a first surface 11S1. The first surface 11S1 may be planar. The first surface 11S1 may be provided with through holes in part, and in the present disclosure, the portion made void by the through holes may also be included in the first surface. The optical member 11 may be arranged such that the first surface 11S1 is inclined with respect to the traveling axis of the electromagnetic wave em radiated from the radiation unit 22. The inclination angle of the traveling axis with respect to the first surface 11S1 may be 45°. The optical member 11 may be plate-shaped or triangular prism-shaped. In the following description, a plate-shaped optical member 11 will be described. In the configuration where the optical member 11 is plate-shaped, the first surface 11S1 is the main surface of the plate member. The main surface means the surface having the maximum area.
[0020] The first surface 11S1 has a first region 11R1 and a second region 11R2. From the first region 11R1, the electromagnetic wave em radiated from the radiation unit 22 travels in the first direction d1. Specifically, the first region 11R1 may cause the electromagnetic wave traveling inside the optical member 11 to travel in the first direction d1. Alternatively, the first region 11R1 may cause the electromagnetic wave em incident from outside the optical member 11 to travel in the first direction d1. From the second region 11R2, the reflected wave re of the electromagnetic wave em traveling in the first direction d that is reflected by the object ob travels in the second direction d2. Specifically, the second region 11R2 may cause the electromagnetic wave traveling inside the optical member 11 to travel in the second direction d2. The second region 11R2 may cause the electromagnetic wave em incident from outside the optical member to travel in the second direction d2.
[0021] The reflected wave re may be an electromagnetic wave whose frequency band overlaps with that of the electromagnetic wave em. The first direction d1 may coincide with the direction in which the electromagnetic wave em radiated from the radiation unit 22 travels. The second direction d2 is a direction different from the first direction d1. The second direction d2 may be a direction inclined with respect to the first direction d1. The second surface 11S2 as the back surface of the first surface 11S1 may be planar. A more specific configuration will be described below.
[0022] The first region 11R1 may be provided near the center of the first surface 11S1. The first region 11R1 may be smaller than the second region 11R2. The first region 11R1 may be approximately the same size as the bundle of the electromagnetic wave em when viewed from the incident direction of the electromagnetic wave em radiated from the radiation unit 22 onto the first surface 11S1. As described above, the optical member 11 is plate-shaped, and the first region 11R1 is elliptical. The first region 11R1 may be circular when viewed from the radiation unit 22. Assuming that the inclination angle of the traveling axis of the electromagnetic wave em radiated from the radiation unit 22 with respect to the first surface 11S1 is θ1, the ratio of the minor diameter to the major diameter may be 1:1 / cos(90° - θ1). The first region 11R1 may be circular.
[0023] In the first embodiment, the first region 11R1 may transmit the electromagnetic wave em. For example, the optical member 11 may be formed entirely of a material that transmits the electromagnetic wave em, and no reflecting member or the like may be provided in the first region 11R1. Further, a reflecting member for reflecting the electromagnetic wave em may not be provided in the portion of the optical member 11 that overlaps the first region 11R1 when viewed from the traveling direction of the traveling path of the electromagnetic wave em radiated from the radiation unit 22. Specifically, a reflecting member may not be provided in the portion of the second surface 11S2, which is the back surface of the first surface 11S1 of the plate-shaped optical member 11, that overlaps the first region 11R1 when viewed from the traveling direction of the traveling path of the electromagnetic wave em. The mounting position and orientation of the optical member 11 may be adjusted so that the bundle of the electromagnetic wave em radiated from the radiation unit 22 and the first region 11R1 overlap.
[0024] In the first embodiment, the second region 11R2 may reflect electromagnetic waves. Alternatively, the electromagnetic waves may be reflected on the back surface 11S2 of the second region 11R2 and propagated from the second region 11R2 in the second direction d2. More specifically, the second region 11R2 may reflect reflected waves re. The second region 11R2 of the optical member 11 may be provided with a reflective member that reflects reflected waves re. The reflective member may be an aluminum mirror or a gold mirror.
[0025] The second region 11R2 may surround the first region 11R1. The second region 11R2 may be a region on the first surface 11S1 other than the first region 11R1. The second region 11R2 may be located only around the first region 11R1. The second region 11R2 may surround only a part of the outer perimeter of the first region 11R1.
[0026] The optical element 11 may be something other than a half-mirror.
[0027] The scanning unit 21 may be positioned on the first direction d1 side of the optical member 11. The scanning unit 21 may change the radiation direction of the electromagnetic wave em propagating from the optical member 11. The scanning unit 21 may further change the propagation direction of the reflected wave re, which is the electromagnetic wave em reflected by the object ob, so that it is directed towards the optical member 11.
[0028] The scanning unit 21 may, for example, radiate electromagnetic waves em in multiple different directions in space by reflecting them while changing their direction. The scanning unit 21 may change the direction in which it reflects electromagnetic waves em based on the control of the control unit 23. The scanning unit 21 may change the direction of reflection around two axes that intersect each other, with these two axes as axes of rotation. These two axes may be orthogonal. The two directions in which it swings around these two axes are called the first swing direction sd1 and the second swing direction sd2, respectively. The scanning unit 21 includes, for example, MEMS (Micro Electro Mechanical Systems) mirrors, polygon mirrors, and galvanometer mirrors.
[0029] The condensing lens 14 may be located in a second direction d2 from the optical element 11.
[0030] The detection unit 12 may be provided near the imaging position of the reflected wave re by the focusing lens 14. In a configuration in which the detection unit 12 does not include an element array, or in other words, is a single element, as will be described later, the detection unit 12 does not have to be provided near the imaging position of the reflected wave re. Specifically, the detection unit 12 may be located in a second direction d2 from the optical member 11. The detection unit 12 may be positioned relative to the optical member 11 such that the propagation axis of the reflected wave re propagating in the second direction d2 from the second region 11R2 of the optical member 11 is parallel to the detection axis of the detection unit 12. This propagation axis is the central axis of the reflected wave re propagating in the second direction d2 from the optical member 11. This detection axis passes through the center of the detection surface of the detection unit 12 and is perpendicular to the detection surface.
[0031] The detection unit 12 detects the reflected wave re propagating from the optical member 11 in the second direction d2. The detection unit 12 may transmit detection information to the control unit 23 as a signal indicating that it has detected the reflected wave re from the object ob.
[0032] The detection unit 12 more specifically includes elements that constitute a distance measuring sensor. For example, the detection unit 12 includes a single element such as an APD (Avalanche PhotoDiode), a PD (PhotoDiode), and a distance measuring image sensor. Alternatively, the detection unit 12 may include an array of elements such as an APD array, a PD array, a distance measuring imaging array, and a distance measuring image sensor.
[0033] The control unit 23 includes one or more processors and memory. The processor may include at least one of a general-purpose processor that loads a specific program and executes a specific function, and a dedicated processor specialized for a specific process. The dedicated processor may include an Application Specific Integrated Circuit (ASIC). The processor may include a Programmable Logic Device (PLD). The PLD may include a Field-Programmable Gate Array (FPGA). The control unit 23 may include at least one of a System-on-a-Chip (SoC) and a System-in-a-Package (SiP) in which one or more processors cooperate.
[0034] The control unit 23 may control the scanning unit 21 and the radiating unit 22. The control unit 23 may also generate three-dimensional position information of an arbitrary point on object ob based on the drive signal for controlling the scanning unit 21 and the information obtained from the detection unit 12.
[0035] Specifically, the control unit 23 may acquire distance information for an arbitrary point on the object ob by Time of Flight (ToF) based on the time when the radiating unit 22 emits pulsed electromagnetic waves em and the time when the detection unit 12 detects the reflected waves re after emission.
[0036] Furthermore, the control unit 23 may calculate the deflection direction of the electromagnetic wave em and the reflected wave re based on the drive signal to the scanning unit 21. The deflection direction corresponds to the orientation of the reflective surface on which the scanning unit 21 changes the radiation direction of the electromagnetic wave em and the reflected wave re. The control unit 23 may calculate the deflection direction of the electromagnetic wave em as the direction of the first oscillation direction sd1 and the second oscillation direction sd2 components.
[0037] The control unit 23 may output, for example, a sinusoidal drive signal that causes the scanning unit 21 to oscillate along a first oscillation direction sd1. The control unit 23 may output, for example, a sinusoidal drive signal that causes the scanning unit 21 to oscillate along a second oscillation direction sd2.
[0038] The control unit 23 may generate three-dimensional position information of the object ob based on the deflection direction and distance information to an arbitrary object point calculated as described above.
[0039] Next, an optical system according to a second embodiment of this disclosure will be described. In the second embodiment, the structure of the optical elements differs from that of the first embodiment. The second embodiment will be described below, focusing on the differences from the first embodiment. Note that parts having the same configuration in the first and second embodiments are denoted by the same reference numerals.
[0040] As shown in Figure 3, the optical system 110 according to the second embodiment is configured similarly to the first embodiment, including an optical element 111 and a detection unit 12. The optical system 110 may further include a collimator lens 13 and a focusing lens 14, similarly to the first embodiment. The optical system 110 may together with the scanning unit 21 to form an electromagnetic wave detection device 120. The electromagnetic wave detection device 120 may further include a radiating unit 22 and a control unit 23, as shown in Figure 2. In the second embodiment, the configuration of the detection unit 12, collimator lens 13 and focusing lens 14, scanning unit 21, radiating unit 22, and control unit 23 is the same as in the first embodiment.
[0041] The optical member 111 has a first surface 111S1. In the second embodiment, unlike the first embodiment, a through hole 111H is formed in the first surface 111S1 in a first region 111R1, which will be described later. As mentioned above, the portion that is empty due to the through hole 111H is also included in the first surface 111S1.
[0042] The first surface 111S1 has a first region 111R1 and a second region 111R2. Similar to the first embodiment, the first region 111R1 propagates the electromagnetic wave em radiated from the radiating unit 22 in a first direction d1. Similar to the first embodiment, the second region 111R2 propagates the reflected wave re of the electromagnetic wave em propagated in the first direction d1 at the object ob in a second direction d2. In the second embodiment, the second direction d2 may be opposite to the first direction d1. Unlike the first embodiment, the first region 111R1 is circular from a manufacturing standpoint. The first region 111R1 may also be elliptical.
[0043] The entire electromagnetic wave em emitted from the radiating section 22 may pass through the through-hole 111H of the first region 111R1. Similar to the first embodiment, the mounting position and orientation of the optical member 111 may be adjusted so that the bundle of electromagnetic waves em emitted from the radiating section 22 overlaps with the through-hole 111H.
[0044] The through hole 111H may include at least one of a cylindrical portion 111C and a tapered portion 111T. The cylindrical portion 111C may terminate at least on the first surface 111S1. The cylindrical portion 111C may define an inner circumferential surface with a constant inner diameter. The tapered portion 111T may terminate at least on the back surface 111S2 of the first surface 111S1. The tapered portion 111T may be connected to the second surface 111S2. The inner circumferential surface of the tapered portion 111T in a plane passing through the central axis of the through hole 111H may be inclined with respect to the central axis such that the diameter expands toward the back surface 111S2. The tapered portion 111T may be formed to satisfy equation (1). θ2 > 90° - θ1 (1) However, θ2 is the angle between the axis A of the through hole 111H and the inner circumferential surface of the tapered portion 111T, when viewed from a direction perpendicular to the propagation axis of the electromagnetic wave em and parallel to the first surface 111S1.
[0045] The optical component 111 may further include an anti-reflective portion facing the radiating portion 22. The anti-reflective portion may be located on the inner circumferential surface of the tapered portion 111T and the cylindrical portion 111C. The anti-reflective portion may be located on the back surface 111S2. Reflection of electromagnetic waves em is reduced in the anti-reflective portion, at least compared to the surrounding portion. The anti-reflective portion may be an absorptive portion. The absorptive portion absorbs electromagnetic waves em. The absorptive portion may be a black portion. The absorptive portion may be made of paint or a sheet.
[0046] Next, an optical system according to a third embodiment of this disclosure will be described. In the third embodiment, the structure of the optical members and the arrangement of the components differ from those of the first embodiment. The third embodiment will be described below, focusing on the differences from the first embodiment. Note that parts having the same configuration in the first and third embodiments will be denoted by the same reference numerals.
[0047] As shown in Figure 4, the optical system 210 according to the third embodiment is configured similarly to the first embodiment, including an optical element 211 and a detection unit 12. The optical system 210 may further include a collimator lens 13 and a focusing lens 14, similarly to the first embodiment. The optical system 210 may together with the scanning unit 21 to form an electromagnetic wave detection device 220. The electromagnetic wave detection device 220 may further include a radiating unit 22 and a control unit 23, as shown in Figure 2. In the third embodiment, the configuration of the detection unit 12, collimator lens 13 and focusing lens 14, scanning unit 21, radiating unit 22, and control unit 23 is the same as in the first embodiment.
[0048] In the third embodiment, unlike the first and second embodiments, the first region 211R1 may reflect electromagnetic waves em. Alternatively, the region of the second surface 211S2 corresponding to the first region 211R1 may reflect electromagnetic waves em and cause them to propagate from the first region 211R1 in the second direction d2. A reflective member that reflects electromagnetic waves em may be provided in the portion of the optical member 211 that overlaps with the first region 211R1 as viewed from the direction of propagation of the electromagnetic wave em propagation path. The reflective member may be an aluminum mirror or a gold mirror. The mounting position and orientation of the optical member 211 may be adjusted so that the beam of electromagnetic waves em radiated from the radiating section 22 overlaps with the first region 211R1.
[0049] In the third embodiment, unlike the first and second embodiments, the second region 211R2 may transmit electromagnetic waves em. For example, the optical member 211 may be made entirely of a material that transmits reflected waves re. Furthermore, a reflective member that reflects electromagnetic waves em does not need to be provided in the portion of the optical member 211 that overlaps with the second region 211R2 as viewed from the direction of propagation of the propagation path of electromagnetic waves em radiated from the radiating portion 22.
[0050] In the third embodiment, the larger the diameter (size) of the first region 211R1, the larger the amount (width) of electromagnetic waves em incident on the first region 211R1 and reflected in the direction of the scanning unit 21. Therefore, the light intensity efficiency of the irradiation from the radiating unit 22 to the object ob (the ratio of the amount of light emitted by the radiating unit 22 to the amount of light irradiated to the object ob, and is called the irradiation efficiency) increases. On the other hand, the larger the diameter of the first region 211R1, the larger the amount (width) of reflected waves re incident on the first region 211R1 and shielded. Therefore, the light intensity efficiency of the light received from the object ob to the detection unit 12 (the ratio of the amount of light reflected by the object ob to the amount of light received by the detection unit 12, and is called the light reception efficiency) decreases. The diameter of the first region 211R1 may be designed to maximize the product of the irradiation efficiency and the light reception efficiency (called the illumination and reception efficiency). When the illumination and reception efficiency is maximized, the maximum measurable distance or accuracy of the electromagnetic wave detection device can be maximized. The irradiation efficiency and light reception efficiency vary depending on the spread angle of the electromagnetic wave em emitted by the radiating unit 22 (the angle formed by the two outermost rays of the electromagnetic wave em), the focal length of the collimator lens 13, and the size of the scanning unit 21. In the first or second embodiment described above, the diameter of the first region 11R1 or 111R1 may be designed similarly.
[0051] Furthermore, the spread angle of the electromagnetic wave em radiated by the radiating unit 22 and the focal length of the collimator lens 13 affect the resolution of the Lidar. The size of the scanning unit 21 affects the swing angle of the MEMS mirror (angles of the first oscillation direction sd1 and the second oscillation direction sd2), and the resonant frequency, etc.
[0052] In one embodiment, (1) the optical system comprises an optical member in which, in a first region and a second region on a first surface, electromagnetic waves radiated from a radiating part propagate in a first direction from the first region, and reflected waves from the electromagnetic waves reflected by an object propagate in a second direction different from the first direction from the second region, The system includes a detection unit for detecting the reflected wave propagating in the second direction.
[0053] (2) In the optical system described in (1) above, The area in the first region irradiated with the electromagnetic wave is smaller than the area in the second region irradiated with the reflected wave.
[0054] (3) In the optical system of (1) or (2) above, The first region transmits the electromagnetic waves, The second region reflects the reflected wave.
[0055] (4) In the optical system of (1) or (2) above, The first region is a through-hole through which the electromagnetic waves pass, The second region reflects the reflected wave.
[0056] (5) In the optical system described in (4) above, The through hole includes a tapered portion on the radial portion side that widens toward the radial portion in the axial direction of the through hole, The angle between the axis of the through hole and the tapered portion is greater than the angle obtained by subtracting the angle of inclination of the propagation axis of the electromagnetic wave radiated from the radiating portion with respect to the first plane from 90°.
[0057] (6) In the optical system described in (4) or (5) above, The optical member further includes an absorbing portion on the inner circumferential surface of the through hole.
[0058] (7) In the optical system of (1) or (2) above, The first region reflects the electromagnetic waves, The second region transmits the reflected wave.
[0059] (8) In any of the optical systems described in (1) to (7) above, The first region is located near the center of the optical member, The second region is located around the first region.
[0060] (9) In any of the optical systems described in (1) to (8) above, The electromagnetic waves radiated from the radiating section are propagated in the first direction from the first region of the first surface, and the reflected waves whose bandwidth overlaps with the electromagnetic waves incident on the second region of the first surface from the opposite direction to the first direction are propagated in the second direction, which is different from the first direction.
[0061] (10) In any of the optical systems described in (1) to (9) above, From the first region, the electromagnetic waves emitted from the radiating part are propagated at a rate exceeding 50% of the light intensity, or from the second region, the reflected waves reflected by the object are propagated at a rate exceeding 50% of the light intensity.
[0062] (11) In any of the optical systems described in (1) to (10) above, The propagation axis of the reflected wave traveling in the second direction is parallel to the detection axis of the detection unit.
[0063] In one embodiment, (12) the electromagnetic wave detection device is An optical system of any of the above (1) to (11), The system includes a scanning unit that changes the radiation direction of the electromagnetic wave traveling in the first direction.
[0064] The optical systems 10, 110, and 210, having the configuration described above, include an optical member 11 such that, in the first regions 11R1, 111R1, and 211R1 and the second regions 11R2, 111R2, and 211R2 on the first surfaces 11S1, 111S1, and 211S1, electromagnetic waves em radiated from the radiating unit 22 propagate in a first direction d1 from the first regions 11R1, 111R1, and 11R2, 111R2, and 211R2, and reflected waves re, obtained by reflecting electromagnetic waves em off an object ob, propagate in a second direction d2 different from the first direction d1 from the second regions 11R2, 111R2, and 211R2. In an optical system, as described in Patent Document 1, in which the propagation axes of electromagnetic waves incident from a radiating unit and reflected waves obtained by reflecting said electromagnetic waves off an object are aligned by a half-mirror, a portion of the electromagnetic waves is lost when the electromagnetic waves from the radiating unit are reflected by a reflective surface located inside the half-mirror. Furthermore, when the reflected wave from the object is transmitted to the half-mirror, a portion of the reflected wave is lost. Therefore, the measurement sensitivity was reduced with the optical system described above. On the other hand, in the optical systems 10, 110, and 210 having the above configuration, the loss of electromagnetic waves em can be reduced when the electromagnetic waves em radiated from the radiating unit 22 are propagated in the first direction d1 by the first regions 11R1, 111R1, and 211R1, for example, on the surface of the optical members 11, 111, and 211. Also, when the reflected waves re, which are reflected by the electromagnetic waves em from the object ob, are propagated in the second direction d2 by the second regions 11R2, 111R2, and 211R2, the loss of reflected waves re can be reduced when the reflected waves re are propagated in the second direction d2 by the electromagnetic waves em from the object ob.
[0065] Furthermore, in optical systems 10, 110, and 210, the area irradiated by electromagnetic waves em in the first regions 11R1, 111R1, and 211R1 is smaller than the area irradiated by reflected waves re in the second regions 11R2, 111R2, and 211R2. With this configuration, the area of the first regions 11R1, 111R1, and 211R1 irradiated by electromagnetic waves em is reduced. Therefore, when the electromagnetic waves em radiated from the radiating unit 22 are propagated in the first direction d1 from the first regions 11R1, 111R1, and 211R1, the loss of electromagnetic waves em can be further reduced.
[0066] Furthermore, in the optical system 110, the first region 110R1 is a through-hole 111H through which the electromagnetic wave em passes, and the second region 111R2 reflects the reflected wave re. With this configuration, when the electromagnetic wave em passes through the first region 110R1, the attenuation of the electromagnetic wave em can be reduced compared to a configuration in which the electromagnetic wave em is transmitted through the first region 111R1.
[0067] Furthermore, in the optical system 110, the through-hole 111H includes a tapered portion 111T on the radiating portion 22 side that widens toward the radiating portion 22 in the axial direction of the through-hole 111H, and the angle between the axis A of the through-hole 111H and the tapered portion 111T is greater than the angle obtained by subtracting the inclination angle of the propagation axis of the electromagnetic wave em radiated from the radiating portion 22 with respect to the first surface 111S1 from 90°. With this configuration, the irradiation of the tapered portion 111T by the electromagnetic wave em can be reduced. Therefore, the scattering of the electromagnetic wave em can be reduced. Consequently, the noise of the reflected wave re due to the scattered electromagnetic wave em can be reduced.
[0068] Furthermore, in the optical system 110, the optical member 111 further includes an absorption section around the through hole 111H. With this configuration, the absorption section can absorb electromagnetic waves em. Therefore, noise in the reflected wave re due to electromagnetic waves em can be further reduced.
[0069] Furthermore, in optical systems 10, 110, and 210, the first regions 11R1, 111R1, and 211R1 are located near the center of the optical element 11, while the second regions 11R2, 111R2, and 211R2 are located around the first regions 11R1, 111R1, and 211R1. With this configuration, for example, the propagation axis of the electromagnetic wave em irradiated onto the first regions 11R1, 111R1, and 211R1 can be parallel to the propagation axis of the reflected wave re irradiated onto the second regions 11R2, 111R2, and 211R2. Therefore, the optical element that irradiates the object ob with the electromagnetic wave em and the optical element that images the reflected wave re from the object ob onto the detection unit 12 can be shared at least partially. For example, as shown in Figure 1, the scanning unit 21 can change the radiation direction of electromagnetic waves em transmitted through the optical members 11, 111, and 211 toward the object ob, and can also change the radiation direction of reflected waves re reflected by the object ob toward the second regions 11R2, 111R2, and 211R2.
[0070] Furthermore, in optical systems 10, 110, and 210, the electromagnetic wave em radiated from the radiating unit 22 is propagated in the first regions 11R1, 111R1, and 211R1 at a rate exceeding 50% of the light intensity, or the reflected wave re reflected by the object ob is propagated in the second region 11R2 at a rate exceeding 50% of the light intensity. With this configuration, the loss of the electromagnetic wave em or the reflected wave re can be reduced.
[0071] Embodiments of optical systems 10, 110, and 210 have been described above. The diagrams illustrating the embodiments of the embodiments described herein are schematic. The dimensional ratios and other aspects shown in the drawings do not necessarily correspond to those of reality.
[0072] While embodiments relating to this disclosure have been described based on the drawings and examples, it should be noted that those skilled in the art can make various modifications or alterations based on this disclosure. Therefore, it should be noted that these modifications or alterations are within the scope of this disclosure. For example, the functions included in each component can be rearranged in a logically consistent manner, and multiple components can be combined into one or separated.
[0073] For example, in the above embodiment, a portion of the reflected wave re, which is reflected by the object ob from the electromagnetic wave em, will be blocked by the optical member 11, which may affect the accuracy of the distance information when the control unit 23 acquires distance information for an arbitrary point on the object ob. Therefore, for example, when the control unit 23 acquires distance information for an arbitrary point on the object ob, it may predict the intensity of the reflected wave re, which is reflected by the electromagnetic wave em from the object ob, based on a Gaussian distribution or the like, and acquire distance information for the arbitrary point from the predicted intensity of the reflected wave re.
[0074] All of the constituent elements described in this disclosure, and / or all of the methods or steps of the processes disclosed, can be combined in any combination except for any combination in which these features are mutually exclusive. Furthermore, each of the features described in this disclosure can be replaced by an alternative feature that works for the same, equivalent, or similar purposes, unless expressly disregarded. Thus, unless expressly disregarded, each of the disclosed features is merely an example of an extensive set of identical or equivalent features.
[0075] Furthermore, the embodiments relating to this disclosure are not limited to any specific configuration of the embodiments described above. The embodiments relating to this disclosure can be extended to all novel features or combinations thereof described herein, or all novel methods or processing steps or combinations thereof described herein.
[0076] In this disclosure, the designations "First," "Second," etc., are identifiers used to distinguish the configurations. Configurations distinguished by the designations "First," "Second," etc., in this disclosure may have their numbers swapped. The swapping of identifiers occurs simultaneously. The configurations remain distinguishable even after the swapping of identifiers. Identifiers may be deleted. Configurations from which identifiers have been deleted will be distinguished by codes. The designations "First," "Second," etc., in this disclosure should not be used alone to interpret the order of the configurations or to justify the existence of smaller numbered identifiers. [Explanation of Symbols]
[0077] 10, 110, 210 optics 11, 111, 211 Optical components 11S1, 111S1, 211S1 1st page 11R1, 111R1, 211R1 1st area 11R2, 111R2, 211R2 2nd area 111S2 back side 111H Through hole 111C Cylindrical part 111T Tapered section 12 Detection unit 13 Collimator lens 14. Focusing lens 20, 120, 220 Electromagnetic wave detection device 21 Scanning Unit 22 Radiation section 23 Control Unit d1 1st direction d2 2nd direction em electromagnetic wave re reflected wave ob object sd1 First oscillation direction sd2 Second oscillation direction θ1: The inclination angle of the electromagnetic wave propagation axis relative to the first plane. θ2 Angle between the first surface and the inner surface of the tapered portion Axial of the through-hole of the optical component
Claims
1. An optical member comprising a first region and a second region on a first surface, wherein electromagnetic waves radiated from a radiating portion propagate in a first direction from the first region, and reflected waves from the electromagnetic waves reflected by an object propagate in a second direction different from the first direction from the second region, The system comprises a detection unit for detecting the reflected wave propagating in the second direction. optical system.
2. In the optical system described in claim 1, The area in the first region irradiated with electromagnetic waves is smaller than the area in the second region irradiated with reflected waves. optical system.
3. In the optical system described in claim 1, The first region transmits the electromagnetic waves, The second region reflects the reflected wave. optical system.
4. In the optical system described in claim 1, The first region is a through-hole through which the electromagnetic waves pass, The second region reflects the reflected wave. optical system.
5. In the optical system according to claim 4, The through hole includes a tapered portion on the radial portion side that widens toward the radial portion in the axial direction of the through hole, The angle between the axis of the through hole and the tapered portion is greater than the angle obtained by subtracting the angle of inclination of the propagation axis of the electromagnetic wave radiated from the radiating portion with respect to the first plane from 90°. optical system.
6. In the optical system according to claim 4, The optical member further includes an absorbing portion on the inner circumferential surface of the through hole. optical system.
7. In the optical system described in claim 1, The first region reflects the electromagnetic waves, The second region transmits the reflected wave. optical system.
8. In the optical system according to any one of claims 1 to 7, The first region is located near the center of the optical member, The second region is located around the first region. optical system.
9. In the optical system according to any one of claims 1 to 7, The electromagnetic wave radiated from the radiating section is propagated in the first direction from the first region of the first surface, and the reflected wave whose bandwidth overlaps with the electromagnetic wave incident on the second region of the first surface from the opposite direction to the first direction is propagated in the second direction, which is different from the first direction. optical system.
10. In the optical system according to any one of claims 1 to 7, From the first region, the electromagnetic waves emitted from the radiating part are propagated at a rate exceeding 50% of the light intensity, or from the second region, the reflected waves reflected by the object are propagated at a rate exceeding 50% of the light intensity. optical system.
11. In the optical system according to any one of claims 1 to 7, The propagation axis of the reflected wave traveling in the second direction is parallel to the detection axis of the detection unit. optical system.
12. An optical system according to any one of claims 1 to 7, A scanning unit that changes the radiation direction of the electromagnetic wave traveling in the first direction, Electromagnetic wave detection device.
Citation Information
Patent Citations
Light illumination receiving apparatus and method
JP2003172612A