Temporary fixed substrate

JP7874213B2Active Publication Date: 2026-06-15NGK CORP
View PDF 14 Cites 0 Cited by

Patent Information

Application Number
JP2025034511
Authority / Receiving Office
JP · JP
Patent Type
Patents
Current Assignee / Owner
Priority Date
2022-03-31
Filing Date
2025-03-05
Publication Date
2026-06-15
Estimated Expiration
2043-03-02

AI Technical Summary

Technical Problem

Conventional temporary fixing substrates used in semiconductor package manufacturing suffer from issues such as chipping and delamination, leading to decreased yield.

Method used

A translucent alumina temporary fixing substrate with a chamfered region on its edges, featuring a two-stage configuration with specific inclination angles and surface roughness, is used to prevent chipping and delamination during the manufacturing process.

Benefits of technology

The chamfered edges effectively suppress chipping and delamination, enhancing the yield of semiconductor packages by maintaining the integrity of the resin and adhesive layers.

✦ Generated by Eureka AI based on patent content.

Smart Images

  • Figure 0007874213000003
    Figure 0007874213000003
  • Figure 0007874213000004
    Figure 0007874213000004
  • Figure 0007874213000005
    Figure 0007874213000005
Patent Text Reader

Abstract

To suppress chipping in an outer peripheral section of a temporarily fixed substrate.SOLUTION: On a temporarily fixed substrate, on which a predetermined fixing target is temporarily fixed on one principal surface, the arithmetic average roughness of a side end is greater than the arithmetic average roughness of the one principal surface and is 5 μm or less.SELECTED DRAWING: Figure 2
Need to check novelty before this filing date? Find Prior Art

Citation Information

Patent Citations

  • Hand for harvesting fruit vegetables

    JP1989020023A

  • Head moving device for hard disk

    JP1989030081A

  • Method and device for automatic beveling of wafer

    JP1990139165A

  • Measurement of semiconductor wafer and particles thereof

    JP1992096247A

  • Semiconductor wafer and manufacturing method thereof

    JP2010040549A