Static CT device and CT scan method

Abstract

The present disclosure provides a static CT device. The device comprises one or more sets of inspection assemblies. Each set of inspection assemblies comprises a multipoint dispersion source configured to emit a radiation beam, a detector facing the multipoint dispersion source to receive the radiation beam emitted by the multipoint dispersion source and defining an inspection channel together with the multipoint dispersion source, and a raster disposed between the multipoint dispersion source and the detector in the inspection channel. The raster has a periodic configuration, and the periodic configuration is configured to diffract the radiation beam passing through the raster to form an interference pattern. The present disclosure also provides a CT inspection method.

Description

Technology Field

[0001] The present application claims priority to a Chinese patent application filed on December 21, 2023, application number 202311771056.2, the entire contents of which are incorporated herein by reference.

[0002] The present disclosure relates to the field of inspection technology. Specifically, it relates to a static CT device. Background Technology

[0003] Related X-ray CT scanners are generally implemented based on traditional X-ray absorption imaging methods, with X-ray sources and detectors as their core components, enabling the acquisition of absorption images that reflect the attenuation characteristics of X-rays passing through a material. These absorption images possess excellent identification capabilities for materials with high density and strong X-ray absorption, and offer superior imaging effects for materials such as metals or skeletons; thus, they are highly effective for identifying prohibited items in security inspections or diagnosing skeletal diseases in the medical field. However, there are significant limitations regarding materials composed of light elements (carbon, hydrogen, oxygen, and nitrogen), as the signals in the absorption images are weak. For example, it is difficult to observe prohibited items, such as narcotics, obscured by metal in security inspections, and difficult to observe lesioned tissue in the lungs in the medical field. In short, to enhance the effectiveness of security inspections and medical diagnoses, new technologies and products must be developed to help improve the identification capabilities for imaging materials with low absorption.

[0004] According to one aspect of the present disclosure, it includes one or a plurality of sets of inspection assemblies, and

[0005] Each set of inspection assemblies is,

[0006] A multipoint dispersion source configured to emit a radiation beam, comprising an array arranged with multiple point sources,

[0007] A detector facing the multipoint dispersion source to receive a radiation beam emitted by the multipoint dispersion source, and a detector defining an inspection channel together with the multipoint dispersion source;

[0008] It includes a raster positioned between the multi-point dispersion source and the detector,

[0009] The above-described raster has a periodic configuration, and the periodic configuration is configured to diffract a radiation beam passing through the periodic configuration of the raster to form an interference pattern, thereby providing a static CT device.

[0010] In one embodiment, the one or more sets of inspection assemblies are each positioned in different sections in the extension direction of the inspection channel.

[0011] In one embodiment, the one or more sets of inspection assemblies emit a radiation beam toward the inspection channel at different viewing angles relative to the object to be inspected in the circumferential direction of the inspection channel, along the transverse direction of the extension direction of the inspection channel.

[0012] In one embodiment, the one or more sets of inspection assemblies include four sets of inspection assemblies, and each of the four sets of inspection assemblies has a multipoint dispersion source positioned on the upper, lower, left, and right sides of the inspection channel, respectively, so as to be able to emit a radiation beam toward the inspection channel along a cross-sectional plane in the extension direction of the inspection channel from the upper, lower, left, and right sides of the inspection channel, respectively.

[0013] In one embodiment, the one or more sets of inspection assemblies are positioned in the same section of the extension direction of the inspection channel, and each of the one or more sets of inspection assemblies has a multi-point dispersion source and a detector positioned opposite each other along the transverse direction of the extension direction of the inspection channel, and each emits a radiation beam toward the inspection channel at a different time in the circumferential direction of the inspection channel.

[0014] In one embodiment, the one or more sets of inspection assemblies are arranged such that the direction in which each multipoint dispersion source of each set of inspection assemblies irradiates a radiation beam toward the detector is offset from one another.

[0015] In one embodiment, the one or more sets of inspection assemblies include four sets of inspection assemblies, and each of the four sets of inspection assemblies has a multipoint dispersion source positioned on the upper, lower, left, and right sides of the inspection channel, respectively, so as to be able to emit a radiation beam toward the inspection channel along the transverse direction of the extension direction of the inspection channel from the upper, lower, left, and right sides of the inspection channel, respectively.

[0016] In one embodiment, the one or more sets of inspection assemblies are configured to operate simultaneously or in a time series.

[0017] In one embodiment, a plurality of sources of the multipoint dispersion source of each of the one or multiple sets of inspection assemblies emit radiation beams in a time series.

[0018] In one embodiment, the raster of at least one set of inspection assemblies of the one or more sets of inspection assemblies is,

[0019] A first raster positioned adjacent to and parallel to the multi-point dispersion source and maintaining a first distance from the multi-point dispersion source, and / or

[0020] A second raster positioned adjacent to and parallel to the multi-point dispersion source and having a second distance from the multi-point dispersion source that is not equal to a first distance, or positioned adjacent to and parallel to the detector and having a third distance from the multi-point dispersion source, and / or

[0021] It includes a third raster positioned adjacent to and parallel to the detector, having a fourth distance from the multi-point dispersion source that is not equal to the third distance.

[0022] In one embodiment, the raster of at least one set of inspection assemblies among the one or more sets of inspection assemblies comprises a first raster, a second raster, and a third raster, and the first raster, the second raster, and the third raster are parallel to each other.

[0023] One aspect of the present disclosure is a method of performing a CT scan using the static CT device, wherein

[0024] It includes having one or more sets of inspection assemblies operate simultaneously or in a time series to perform inspections on the subject to inspection at different times of the inspection channel, and

[0025] A method for performing a CT scan is provided, wherein multiple point sources of a multi-point dispersion source of each set of inspection assemblies emit radiation beams in a flying spot manner to irradiate a subject at different angles.

[0026] It should be understood that the description in this section is not intended to specify the core or essential features of the embodiments of the present disclosure, nor is it intended to limit the scope of the present disclosure. Other features of the present disclosure will be easily understood through the description below. Brief explanation of the drawing

[0027] The drawings are intended to help better understand the technical solution and are not intended to limit the present disclosure. Herein, Figure 1 shows various arrangement methods of a raster in a shooting device. FIG. 2 shows a method of arranging one or more sets of inspection assemblies according to an embodiment of the present disclosure. FIG. 3 illustrates a method of arranging one or more sets of inspection assemblies according to an embodiment of the present disclosure, wherein one or more sets of inspection assemblies are arranged in the same section. FIG. 4 shows the configuration of a set of inspection assemblies according to an embodiment of the present disclosure, wherein three rasters (G0, G1 and G1) are included, and an example of one raster is also shown. Figure 5 shows absorption T (a), phase f (b) and incineration scattering D The 2D image of (c), and the corresponding linear damping coefficient reconstructed using the FBP algorithm after collecting 360 projections from a full rotation. m (d), decrease in refractive index d (e), and linear diffusion coefficient g (f) shows a slice image in the XY plane of the 3D image. FIG. 6 shows microscopic images (a1-a6) of tissue slices of human mammary gland specimens 1-6 after staining, and linear attenuation coefficients after 3D reconstruction corresponding one-to-one to them. m Slice images (b1-b6) in the XZ plane, refractive index reduction after 3D reconstruction d This shows the slice images (c1-c6) in the XZ plane. Specific details for implementing the invention

[0028] To more clearly explain the purpose, technical methods, and advantages of the present disclosure, embodiments of the present disclosure are described below in detail in conjunction with the drawings. It should be understood that the following description of embodiments is intended to interpret and explain the overall concept of the present disclosure and should not be understood as limiting the scope of the present disclosure. Identical or similar reference numbers in the specification and drawings indicate identical or similar parts or components. For clarity, the drawings are not necessarily drawn to scale, and some well-known parts and configurations may be omitted from the drawings.

[0029] Unless otherwise defined, technical or scientific terms used in this disclosure have the ordinary meanings understood by those skilled in the art to which this disclosure pertains. The terms “first,” “second,” and similar words used in this disclosure are used merely to distinguish different components, not to indicate any order, quantity, or importance. The words “one” or “one” do not exclude the plural. Words such as “comprising” or “comprising” mean that the element or object appearing before such word includes the element or object listed after such word and equivalents thereof, and do not exclude other elements or objects. Words such as “connected” or “connected” are not limited to physical or mechanical connections but may include electrical connections, whether direct or indirect. Terms such as “up,” “down,” “left,” “right,” “upper side,” or “lower side” are used solely to indicate relative positional relationships, and such relative positional relationships may change accordingly when the absolute position of the described object changes. When an element such as a layer, film, region, or substrate is referred to as being "above" or "below" another element, that element may be located directly "above" or "below" the other element, or an intermediate element may exist.

[0030] Figures 1 (a), (b), (c), and (d) show various raster shooting arrangements, where G1, G2, and G3 represent three rasters, and they are each placed between the source and the object or between the object and the detector as shown in Figures 1 (a), (b), (c), and (d).

[0031] In raster imaging technology, the wave and particle properties of X-rays can be utilized simultaneously, and three types of multi-characteristic information—absorption, phase, and small-angle scattering—can be acquired simultaneously. Here, the absorption and phase information are, respectively, the complex refractive index n The imaginary part ofβ and real part d Corresponds to.

[0032]

[0033] Here, linear damping coefficient m is linearly related to the imaginary part β ( l is the wavelength of the X-ray).

[0034]

[0035] absorption T , phase f and incineration scattering D The three characteristic information of is, respectively, the linear damping coefficient m , decrease in refractive index d , and linear diffusion coefficient g It can be regarded as the integral of (here, L is the propagation path of X-rays, and c φ and c D All are constants related to the shooting system).

[0036]

[0037] Considering that X-rays generally have an energy spectrum distribution, the normalized energy spectrum distribution is S(E) Assuming that, mathematical formula (3) can be expressed as follows.

[0038]

[0039] In FIG. 1(a), the role of the raster (G1) is to form a magnetic imaging stripe image in the optical path behind it. When X-rays pass through and interact with the material, this magnetic imaging stripe can cause local distortion and deformation. These deformations are at the micrometer or submicrometer level, and conventional detectors cannot achieve such high resolution. Therefore, the raster (G2) amplifies the corresponding signal and extracts three multi-character images of absorption, phase, and small-angle scattering by observing changes in the intensity of the detector signal. When the focus of the X-ray source is sufficiently small (e.g., in the case of synchrotron radiation or a microfocus X-ray optical engine), only the raster (G1) and the raster (G2) are required, as illustrated in FIG. 1(a) and (c).

[0040] When the focal size of the X-ray source is large (e.g., in the case of a typical X-ray optical engine), the resulting blur effect degrades the imaging effect, so a raster (G0) is added behind the X-ray source. Through the raster (G0), as shown in (b) and (d) of FIG. 1, the radiation beam emitted by the X-ray source is converted into a series of partially interfering linear radiation beams at the micrometer level.

[0041] The specimen (W) may be placed between the raster (G0) and the raster (G1) (Fig. 1 (b)), and may also be placed between the raster (G1) and the raster (G2) (Fig. 1 (c), (d)).

[0042] When the specimen (W) is placed between the raster (G0) and (G1), as shown in (b) of FIG. 1, the phase and small-angle scattering signals obtainable in this configuration are stronger, and the imaging contrast and sensitivity are higher, but there are also disadvantages. The area of ​​the raster (G1) is relatively large, the cost is relatively high, and the X-rays after passing through the specimen (W) must be blocked by the raster (G1) and (G2) to be received by the detector, so the utilization rate of X-rays is low.

[0043] When the test object (W) is placed between the raster (G1) and (G2), as illustrated in Fig. 1 (c) and (d), in this configuration, the raster (G1) is close to the light source, has a small area, and is inexpensive. X-rays passing through the test object (W) are blocked only by the raster (G2), resulting in a higher X-ray utilization rate, but there is also a disadvantage. The acquired phase and small-angle scattering signals are weakened. However, in the case of some strongly scattering materials, it is actually difficult to cause detector signal saturation.

[0044] The absorption image (T above) reflects the attenuation characteristics of the material for X-rays, and the imaginary part of the material's complex refractive index in X-rays. β Corresponds to (complex refractive index) The phase image reflects the refractive effect of the material with respect to X-rays, and the real part of the material's complex refractive index in X-rays Corresponding to, and its beneficial effect is that in the case of materials with weak absorption, phase imaging has higher contrast compared to absorption imaging, and d Is βSince the resolution can be two to three orders of magnitude higher, the phase image can display materials with weak absorption more clearly. Small-angle scattering images reflect the compositional information of the material at the mesoscopic level and are sensitive to differences at the micrometer or submicrometer level, such as porosity and multifibers, thereby overcoming the resolution limitations of absorption imaging. Phase and small-angle scattering images serve as excellent complements to absorption imaging, effectively improving the imaging effect and resolution of the entire specimen (W), and can improve the adaptability and accuracy of the inspection process for different materials.

[0045] Figure 5 shows absorption T (a), phase f (b) and incineration scattering D The 2D image of (c), and the corresponding linear damping coefficient reconstructed using the FBP algorithm after collecting 360 projections from a full rotation. m (d), decrease in refractive index d (e), and linear diffusion coefficient g This represents a slice image in the XY plane of the 3D image of (f). An absorption image reflecting material damping characteristics (linear damping coefficient m Corresponding to), phase image with higher contrast for materials with weak absorption (refractive index reduction of complex refractive index d The (corresponding to) reflects texture information regarding the internal and external composition of the specimen (W). Small-angle scattering image (linear diffusion coefficient) reflecting mesoscopic-level compositional information of the material g (corresponding to) reflects fine compositions such as porosity and multifibers at the micrometer / sub-micrometer level.

[0046] FIG. 6 shows microscopic images (a1-a6) of stained tissue slices of human mammary gland specimens (1-6), and linear attenuation coefficients after three-dimensional reconstruction that correspond one-to-one with them. m Slice images (b1-b6) in the XZ plane, refractive index reduction after 3D reconstruction dThis shows the slice images (c1-c6) in the XZ plane.

[0047] In specimens (1, 2, 4, 5), the arrow indicates a tumor lesion (the part that gets darker in color), in specimen (3), the arrow indicates chest muscle tissue, and in specimen (6), the arrow indicates a necrotic area (the part that gets darker in color).

[0048] Although adipose tissue can be well distinguished in all sample images, the distinction between tumor regions and surrounding fibrous tissue is better in the reconstructed images of phase information, and necrotic areas can also be distinguished. Raster imaging advantageously compensates for the lack of recognition in absorption 2D imaging without raster, and a more comprehensive analysis of the sample can be realized through the combination of the two.

[0049] As illustrated in FIG. 2, according to an embodiment of the present disclosure, a static CT device comprising one or more sets of inspection assemblies is provided. Herein, each set of inspection assemblies comprises: a multipoint dispersion source (S) configured to emit a radiation beam, comprising an array arranged with a plurality of point sources; a detector (DT) facing the multipoint dispersion source (S) to receive the radiation beam emitted by the multipoint dispersion source (S), and the detector (DT) defining an inspection channel together with the multipoint dispersion source (S); and a raster disposed between the multipoint dispersion source (S) and the detector (DT). In the present embodiment, the raster has a periodic configuration. The periodic configuration is configured to diffract the radiation beam passing through the periodic configuration of the raster to form an interference pattern. In an embodiment of the present disclosure, the one or more sets of inspection assemblies may comprise one set, two sets, three sets, four sets, or any other number of inspection assemblies, all of which can perform static CT imaging. Each set of inspection assemblies includes a multipoint dispersion source (S) and a detector (DT). The multi-point dispersion source (S) includes multiple point sources, for example, five point sources, seven point sources, etc. These point sources may be arranged in a row or a line. For example, they may be arranged along a straight line, along a curve, in two rows or two columns, or in other forms. These point sources may emit radiation beams in a time series. The radiation beam may be a conical radiation beam, a fan-shaped beam, a pencil-shaped beam, etc. The shape of the radiation beam may be installed as needed, for example, by installing a suitable collimator to shape the radiation emitted by each point source. That is, in the present disclosure, the multi-point dispersion source (S) may include a suitable collimator. FIG. 2 indicates that each set of inspection assemblies includes rasters (G0, G1, and G2).However, it should be noted that in other embodiments, one or more sets of inspection assemblies may include only one of the rasters (G0, G1, and G2). Here, this means that any one of them has the illustrated corresponding placement location. Additionally, in some embodiments, one or more sets of inspection assemblies may each include different rasters. For example, one set of inspection assemblies may include a raster (G1), another set of inspection assemblies may include a raster (G0), and yet another set of inspection assemblies may include a raster (G2), and so on. Here, these different embodiments are not described further, and those skilled in the art may install them as needed based on the teachings of the present disclosure.

[0050] In one embodiment, the static CT device comprises only one set of inspection assemblies. The inspection assembly comprises: a multipoint dispersion source (S) configured to emit a radiation beam and including an array of multiple point sources; a detector (DT) facing the multipoint dispersion source (S) to receive the radiation beam emitted by the multipoint dispersion source (S), and the detector (DT) defining an inspection channel together with the multipoint dispersion source (S); and a raster disposed between the multipoint dispersion source (S) and the detector (DT). Through the arrangement of the multiple point sources, the multiple point sources can irradiate the object at multiple angles, thereby enabling the construction of a three-dimensional image of at least one tomography layer of the object at multiple angles without moving the object.

[0051] In one embodiment, multiple sets of inspection assemblies are arranged along the extension direction of the inspection channel, for example, one or multiple sets of inspection assemblies are each placed in different sections of the inspection channel. These inspection assemblies are distributed in different sections of the inspection channel, either adjacent to each other or spaced apart from each other, and the object to be inspected passes through the multiple sets of inspection assemblies sequentially as it passes through the inspection channel. In this embodiment, the timing at which each set of inspection assemblies inspects the object to be inspected is different. For example, when the object to be inspected passes through the first set of inspection assemblies, the multi-point dispersion source (S) of the first set of inspection assemblies inspects the object to be inspected from the upper side. As the object to be inspected continues to move along the inspection channel, it passes through the second set of inspection assemblies, and the multi-point dispersion source (S) of the second set of inspection assemblies inspects the object to be inspected from the lower side. As the object to be inspected continues to move along the inspection channel, it passes through the third set of inspection assemblies, and the multi-point dispersion source (S) of the third set of inspection assemblies inspects the object to be inspected, for example, from the left side. When a test object passes through a fourth set of inspection assemblies, a multi-point dispersion source (S) of the fourth set of inspection assemblies inspects the test object, for example, from the right side. A fifth set of inspection assemblies may be installed as needed. A multi-point dispersion source (S) of the fifth set of inspection assemblies inspects the test object from an obliquely upper side. Additional inspection assemblies may be installed as needed. A person skilled in the art may install an appropriate number of inspection assemblies based on the teachings of the present disclosure, taking into account practical needs and cost considerations. Additionally, these inspection assemblies may be arranged sequentially along an inspection channel. Adjacent inspection assemblies may be spaced at predetermined equal intervals from each other, or they may be arranged randomly.To obtain more information about the object, one or more sets of inspection assemblies emit radiation beams toward the object (the object within the inspection channel) at different angles relative to the object along the transverse direction of the extension direction of the inspection channel, that is, along the circumferential direction of the inspection channel. According to the present embodiment, since the multiple sets of inspection assemblies irradiate the object at multiple angles relative to the object, multiple tomographic images of the object can be obtained through computer processing. Since the present disclosure provides a multi-point dispersion source (S), each set of inspection assemblies can obtain images of the object irradiated at multiple angles, thereby acquiring CT images of the object without, for example, needing to rotate the object or the combination of the multi-point dispersion source (S) and detector (DT). In the present embodiment, unlike CT imaging devices in the related art, a raster is installed, so the CT imaging device having the raster can obtain more image information. For example, three-dimensional image information related to the phase of the object and multi-angle image information of small-angle scattering can be obtained. These images can be acquired as the specimen passes through the inspection channel only once. By combining this image information, more accurate information, such as tissue identification and composition determination, can be obtained, particularly for biological samples. This significantly improves inspection accuracy compared to absorption imaging.

[0052] In one embodiment, the static CT device includes four sets of inspection assemblies, and FIG. 2 shows the arrangement of the four sets of inspection assemblies. In FIG. 2a), a multi-point dispersion source (S) irradiates the object from the upper side, in FIG. 2b), a multi-point dispersion source (S) irradiates the object from the left side, in FIG. 2c), a multi-point dispersion source (S) irradiates the object from the lower side, and in FIG. 2d), a multi-point dispersion source (S) irradiates the object from the right side.

[0053] In one embodiment, the four sets of inspection assemblies shown in FIG. 2 are sequentially placed in the inspection channel, for example, along the extension direction of the inspection channel. The four sets of inspection assemblies may be placed adjacent to each other or spaced apart from each other.

[0054] Four sets of inspection assemblies can inspect the object from four orientations: up, down, left, and right. By sequentially emitting from multi-point dispersion sources, a stationary object can be inspected from all directions to obtain more data and a three-dimensional image of the object. In practical applications, three sets of inspection assemblies can inspect a stationary object from, for example, up and down orientations and one lateral orientation, and the obtained data alone is sufficient to construct a three-dimensional image of the object.

[0055] In the above-described embodiment, the multipoint dispersion source (S) of each set of inspection assemblies can be approximated as irradiating the corresponding detector (DT) along the cross-section of the inspection channel. Here, it should be noted that each source of the multipoint dispersion source (S) may emit a conical radiation beam. Meanwhile, the detector (DT) and the corresponding raster may actually be a plane. In this case, irradiating the corresponding detector (DT) along the cross-section of the inspection channel means that, in reality, the radiation beam is distributed in a space having a constant width, but the direction of irradiation generally follows the transverse direction of the inspection channel. Those skilled in the art may arrange each set of inspection assemblies according to the description of the present disclosure. For example, four sets of inspection assemblies each irradiate the object to be inspected from the upper, lower, left, and right sides of the inspection channel. The irradiation directions of the four sets of inspection assemblies are, respectively, approximately from top to bottom, from bottom to top, from left to right, and from right to left. However, the radiation beam of each set of inspection assemblies is not flat but a conical plane. In another embodiment, the shape of the radiation beam is fan-shaped. In this embodiment, the multi-point dispersion source (S) may have a corresponding approximately linear detector (DT) positioned therein.

[0056] In one embodiment, one or more sets of inspection assemblies are placed in the same section of the inspection channel. As illustrated in FIG. 3, in this embodiment, since one or more sets of inspection assemblies are placed within the same section, the multipoint dispersion sources (S) of the two sets of inspection assemblies must be prevented from irradiating each other. In this embodiment, each multipoint dispersion source (S) of one or more sets of inspection assemblies irradiates the object at a different angle to the object. Additionally, one or more sets of inspection assemblies are arranged so that the directions in which each multipoint dispersion source (S) irradiates the radiation beam do not form an angle with each other or overlap. In other words, the multipoint dispersion source (S) of each set of inspection assemblies determines one irradiation plane (an alternative plane as described above) by irradiating the corresponding detector (DT), and the corresponding multiple irradiation planes determined by the one or more sets of inspection assemblies do not overlap and form an angle, so that the opposing radiation beams irradiating each other do not interfere. FIG. 3a) shows, for example, two sets of inspection assemblies arranged on the upper and lower sides. The detector (DT) of one set of inspection assemblies and the multi-point dispersion source (S) of the other set of inspection assemblies are offset from each other at the upper position. The corresponding multi-point dispersion source (S) and detector (DT) are offset from each other at the lower position. The two intersect so that their inspection directions are offset. The inspection assemblies on the left and right sides are similarly offset from each other so that the inspection directions of the two sets of inspection assemblies intersect and are offset. FIG. 3b) shows a different arrangement method. Here, for example, the detector (DT) of one set of inspection assemblies and the multi-point dispersion source (S) of the other set of inspection assemblies are offset from each other at the upper position, opposite to the configuration shown in a), and other settings are similarly arranged in opposite ways, which are not described in detail.Those skilled in the art can derive other arrangement methods to meet different requirements according to the arrangement method shown in this embodiment.

[0057] In one embodiment, one or more sets of inspection assemblies are configured to operate simultaneously. For example, in one embodiment, one or more sets of inspection assemblies are placed in a single section, and when a test object passes through the section, one or more sets of inspection assemblies start operating simultaneously, and each multi-point dispersion source (S) begins emitting a radiation beam to irradiate the test object. At the same time, each detector (DT) receives the radiation signal passing through the test object and each raster and performs an inspection. In this embodiment, the test object passes through one or more sets of inspection assemblies at a time.

[0058] In one embodiment, one or more sets of inspection assemblies are configured to operate in a time series. For example, in one embodiment, along the extension direction of an inspection channel, one or more sets of inspection assemblies are each placed in multiple sections of the inspection channel, and while the object to be inspected moves and passes through these sections, one or more sets of inspection assemblies are configured to sequentially start operation along the forward movement of the object to be inspected.

[0059] In an embodiment of the present disclosure, for each set of inspection assemblies, a plurality of point sources of a multi-point dispersion source (S) generally emit radiation beams in a time series. Since the plurality of point sources of the multi-point dispersion source (S) are arranged in a straight line, the angle at which each point source irradiates the object to be inspected is actually different. Therefore, multi-angle irradiation can be implemented with only one set of inspection assemblies, thereby obtaining multiple tomographic images of the object to be inspected.

[0060] In one embodiment, at least one set of inspection assemblies of one or more sets of inspection assemblies includes a raster (G0). The raster (G0) is positioned adjacent to and parallel to the multipoint dispersion source (S) and is spaced at a first distance from the multipoint dispersion source (S). Due to the presence of the raster (G0), the radiation beam emitted by the multipoint dispersion source (S) is modulated into an interference pattern by the raster (G0).

[0061] In one embodiment, at least one set of inspection assemblies of one or more sets of inspection assemblies includes a raster (G0) and a raster (G1). The raster (G1) is positioned adjacent to and parallel to the multi-point dispersion source (S) and is spaced at a second distance from the multi-point dispersion source (S), and the second distance is not equal to the first distance. That is, there are two rasters in at least one set of inspection assemblies, each being a raster (G0) and a raster (G1). In one embodiment, the raster (G1) is adjacent to the multi-point dispersion source (S). In another embodiment, the raster (G1) is closer to the detector (DT), and the distance from the detector (DT) is a third distance.

[0062] In one embodiment, at least one set of inspection assemblies includes a raster (G2). The raster (G2) is positioned adjacent to and parallel to the detector (DT) and is spaced at a fourth distance from the multi-point dispersion source (DT), the fourth distance being not equal to the third distance. In one embodiment, at least one set of inspection assemblies includes three rasters. Each is a raster (G0), a raster (G1), and a raster (G2). The arrangement of the rasters may refer to a plurality of arrangement methods shown in FIG. 1. The rasters (G0), a raster (G1), and a raster (G2) are parallel to each other.

[0063] FIG. 4 illustrates a method of arranging a set of inspection assemblies for a test object according to one embodiment of the present disclosure. It should be noted that, according to the present embodiment, a person skilled in the art may arrange each set of inspection assemblies of one or more sets of inspection assemblies of the present disclosure as needed. In the present embodiment, three rasters (G0, G1, G2) are installed between a multi-point dispersion source (S) and a detector (DT), and the three rasters (G0, G1, G2) are parallel to each other and parallel to the detector (DT). In FIG. 4, in the oblique path of each radiation beam, the ratio of the gap L between rasters (G0-G1) and the gap D between rasters (G1) and rasters (G2) is the same, and am.

[0064] FIG. 4 further illustrates an implementation of the raster, for example, in the form of an array of slits. In this embodiment, the periodic configuration of the raster is a slit, the periodic direction of the periodic configuration may be the direction of the arrangement of a plurality of slits, and the extension direction of a single sub-configuration (e.g., a slit) of the periodic configuration is perpendicular to the direction of the arrangement of the plurality of slits. According to the present disclosure, the extension direction of a single slit is at a very small angle (e.g., 10) with respect to the inspection channel (the extension direction of which is the direction as illustrated by the movement arrow of the object (W) in FIG. 4, i.e., the z-direction), for example, 10 -4When the arrangement is complete, the interference stripes or moiré stripes generated by the periodic configuration consisting of an array of multiple slits change significantly. Therefore, in the present disclosure, the requirements of the present disclosure can be satisfied simply by installing the extension direction of a single slit at an extremely small angle with respect to the inspection channel. In one embodiment, in FIG. 4, the irradiation direction of the radiation beam is the Y direction, the extension direction of the inspection channel is the Z direction, and the movement direction of the object to be inspected (W) is the Z direction, and for example, the extension direction of a single slit may be transverse to the extension direction of the inspection channel (i.e., perpendicular to the inspection channel). At this time, the arrangement direction of the slits (i.e., the periodic direction of the periodic configuration) is parallel to the extension direction of the inspection channel and is arranged horizontally from left to right in FIG. 4 (Z direction). Here, it should be noted that the irradiation direction of the radiation beam, i.e., the Y direction, represents only the approximate irradiation direction of the radiation beam. This is because the radiation beam may be a conical radiation beam. The fact that the irradiation direction of the conical radiation beam is the Y direction does not mean that all beams are strictly in the Y direction, but rather that the direction of the conical radiation beam is only irradiated along the Y direction. Those skilled in the art will understand the situation as illustrated in FIG. 4. That is, the radiation beam of the point source located to the left of the multi-point dispersion source (S) is irradiated obliquely to the right along the Y direction so that the spread angle can be shaped to cover the detector (DT). The radiation beam of the point source located to the right of the multi-point dispersion source (S) is irradiated obliquely to the left along the Y direction so that the spread angle can be shaped to cover the detector (DT). Other point sources are similarly installed so that the spread angle of the emitted radiation beam satisfies the condition that the radiation beam covers the detector (DT).

[0065] According to one aspect of the present disclosure, a method for performing a CT scan is provided. For example, the CT scan method may be performed using the static CT device described above. In this embodiment, the method comprises the following steps.

[0066] One or multiple sets of inspection assemblies operate simultaneously or in a time series to perform inspections on the subject at different times of the inspection channel.

[0067] Here, multiple point sources of the multi-point dispersion source (S) of each set of inspection assembly emit radiation beams in a flying spot manner to irradiate the object to be inspected at different angles.

[0068] In an embodiment of the present disclosure, the specimen can be moved within the inspection channel, and one or more sets of inspection assemblies can each inspect the specimen at different views to obtain absorption images, small-angle scattering images, and phase images of different tomographic layers of the specimen. By combining these different tomographic images and using an appropriate algorithm by a computer or processor, a three-dimensional image of at least a portion of the specimen is output, and based on this three-dimensional image, the internal composition, tissue, structure, etc. of the specimen can be analyzed to obtain more comprehensive and accurate analysis results.

[0069] It should be understood that steps can be rearranged, added, or deleted using the various forms of processes described above. For example, each step described in the present invention may be executed in parallel, sequentially, or in different orders, and is not limited thereto as long as the technical solution provided in the present invention can realize the expected results.

[0070] In the technical method of the present disclosure, the processing of related user personal information, including collection, storage, use, processing, transmission, provision, and disclosure, all comply with relevant laws and regulations and do not violate public order and good morals.

[0071] The specific embodiments described above do not limit the scope of protection of this disclosure. Those skilled in the art should understand that various modifications, combinations, sub-combinations, and substitutions may be made depending on design requirements and other factors. All modifications, equivalent substitutions, and improvements made within the spirit and principles of this disclosure shall be included within the scope of protection of this disclosure.

Claims

Claim 1 A static CT device comprising one or more sets of inspection assemblies, wherein each set of inspection assemblies comprises: a multipoint dispersion source configured to emit a radiation beam, wherein the multipoint dispersion source comprises an array arranged with multiple point sources; a detector configured to define an inspection channel together with the multipoint dispersion source, wherein the detector is positioned opposite the multipoint dispersion source to receive the radiation beam emitted by the multipoint dispersion source; and a raster disposed between the multipoint dispersion source and the detector, wherein the raster has a periodic configuration, and the periodic configuration is configured to diffract a radiation beam passing through the periodic configuration of the raster to form an interference pattern. Claim 2 In claim 1, the one or multiple sets of inspection assemblies are static CT devices each positioned in different sections in the extension direction of the inspection channel. Claim 3 In paragraph 2, the static CT device wherein the one or multiple sets of inspection assemblies emit a radiation beam toward the inspection channel at different viewing angles relative to the object in the circumferential direction of the inspection channel, along the transverse direction of the extension direction of the inspection channel. Claim 4 In paragraph 3, the one or more sets of inspection assemblies comprise four sets of inspection assemblies, and each of the four sets of inspection assemblies is a static CT device positioned on the upper, lower, left, and right sides of the inspection channel, such that a multipoint dispersion source is capable of emitting a radiation beam toward the inspection channel along a cross-sectional plane in the extension direction of the inspection channel from the upper, lower, left, and right sides of the inspection channel, respectively. Claim 5 A static CT device according to claim 1, wherein the one or more sets of inspection assemblies are arranged in the same section of the extension direction of the inspection channel, and each of the one or more sets of inspection assemblies has a multi-point dispersion source and a detector arranged opposite each other along the transverse direction of the extension direction of the inspection channel, and each emits a radiation beam toward the inspection channel at a different viewpoint in the circumferential direction of the inspection channel. Claim 6 In paragraph 5, the above one or multiple sets of inspection assemblies are static CT devices arranged such that the directions in which each of the multipoint dispersion sources of each set of inspection assemblies irradiates a radiation beam toward the detector are offset from each other. Claim 7 In claim 5, the one or more sets of inspection assemblies comprise four sets of inspection assemblies, and each of the four sets of inspection assemblies is a static CT device positioned on the upper, lower, left, and right sides of the inspection channel such that a multipoint dispersion source is capable of emitting a radiation beam toward the inspection channel along the transverse direction of the extension direction of the inspection channel from the upper, lower, left, and right sides of the inspection channel, respectively. Claim 8 In claim 1, the static CT device configured such that one or more sets of inspection assemblies operate simultaneously or in a time series. Claim 9 In claim 1, the plurality of sources of each of the multipoint dispersion sources of the one or multiple sets of inspection assemblies are static CT devices that emit radiation beams in a time series. Claim 10 A static CT device according to claim 1, wherein at least one set of inspection assemblies of the one or more sets of inspection assemblies comprises a first raster positioned adjacent to and parallel to the multipoint dispersion source and having a first distance from the multipoint dispersion source, and / or a second raster positioned adjacent to and parallel to the multipoint dispersion source and having a second distance from the multipoint dispersion source that is not equal to the first distance, or a third raster positioned adjacent to and parallel to the detector and having a third distance from the multipoint dispersion source, and / or a third raster positioned adjacent to and parallel to the detector and having a fourth distance from the multipoint dispersion source that is not equal to the third distance. Claim 11 In claim 9, the raster of at least one set of inspection assemblies among the one or more sets of inspection assemblies comprises a first raster, a second raster, and a third raster, and the first raster, the second raster, and the third raster are parallel to each other in a static CT device. Claim 12 A method for performing a CT examination using the static CT device of claim 1, comprising having one or more sets of examination assemblies operate simultaneously or in a time series to perform an examination on a subject at different times of an examination channel, wherein multiple point sources of multi-point dispersion sources of each set of examination assemblies emit radiation beams in a flying spot manner to irradiate the subject at different angles.

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