Pellicle for EUV photomask using reinforeced graphene membrane
The reinforced graphene membrane pellicle for EUV photomasks addresses issues of transmittance, mechanical stability, and thermal deformation by using a reinforced edge structure, enhancing defect reduction and process efficiency.
Patent Information
- Authority / Receiving Office
- KR · KR
- Patent Type
- Patents
- Current Assignee / Owner
- CHARM GRAPHENE CO LTD
- Filing Date
- 2023-08-25
- Publication Date
- 2026-07-15
AI Technical Summary
Conventional pellicles used in EUV lithography equipment suffer from low transmittance, mechanical instability, and thermal deformation due to the absorption of extreme ultraviolet light, leading to defects in photomask patterns.
A pellicle for EUV photomasks utilizing a reinforced graphene membrane with a reinforcing pad formed on its edge, attached to a pellicle frame, to enhance mechanical stability and minimize damage during the manufacturing process.
The reinforced graphene membrane pellicle reduces defect rates by minimizing damage during attachment and allows for cost-effective, simplified manufacturing processes with improved mechanical stability and control over thickness.
Smart Images

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