Pellicle for EUV photomask using reinforeced graphene membrane

The reinforced graphene membrane pellicle for EUV photomasks addresses issues of transmittance, mechanical stability, and thermal deformation by using a reinforced edge structure, enhancing defect reduction and process efficiency.

KR102991414B1Active Publication Date: 2026-07-15CHARM GRAPHENE CO LTD

Patent Information

Authority / Receiving Office
KR · KR
Patent Type
Patents
Current Assignee / Owner
CHARM GRAPHENE CO LTD
Filing Date
2023-08-25
Publication Date
2026-07-15

AI Technical Summary

Technical Problem

Conventional pellicles used in EUV lithography equipment suffer from low transmittance, mechanical instability, and thermal deformation due to the absorption of extreme ultraviolet light, leading to defects in photomask patterns.

Method used

A pellicle for EUV photomasks utilizing a reinforced graphene membrane with a reinforcing pad formed on its edge, attached to a pellicle frame, to enhance mechanical stability and minimize damage during the manufacturing process.

Benefits of technology

The reinforced graphene membrane pellicle reduces defect rates by minimizing damage during attachment and allows for cost-effective, simplified manufacturing processes with improved mechanical stability and control over thickness.

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Abstract

The present invention relates to a pellicle for an EUV photomask using a reinforced graphene membrane, and more specifically, to a pellicle for an EUV photomask using a reinforced graphene membrane in which a graphene membrane having a reinforced pad formed with a reinforced edge is attached to a pellicle frame. The present invention provides a pellicle for an EUV photomask using a reinforced graphene membrane, characterized by comprising: a pellicle frame; a graphene membrane attached to the front or back surface of the pellicle frame; and a reinforcing pad formed on the edge of the graphene membrane.
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