Reagent for removing oxygen from metal oxyhalide precursors in the thin film deposition process
Oxyphilic reagents effectively deoxygenate metal oxyhalides at lower temperatures, producing high-purity metal or metal nitride films, addressing the challenges of incomplete deoxygenation and contamination in ALD and CVD processes.
Patent Information
- Application Number
- KR1020237034015
- Authority / Receiving Office
- KR · KR
- Patent Type
- Patents
- Priority Date
- 2021-03-05
- Filing Date
- 2022-03-04
- Publication Date
- 2026-08-03
- Estimated Expiration
- 2042-03-04
AI Technical Summary
Existing methods for removing oxygen from metal oxyhalide precursors in ALD and CVD processes face challenges, particularly at temperatures below 500°C, leading to incomplete deoxygenation and contamination of deposited films, which is problematic for applications like Mo films in middle-of-line or backend-of-the-line processes.
The use of oxyphilic reagents, such as Group 14 or Group 15 halides and oxides, to react with metal oxyhalides at lower temperatures (50°C to 500°C) to form metal or metal nitride films with low oxygen content, ensuring complete deoxygenation and purity.
This method achieves high-purity metal or metal nitride films with oxygen impurities below 1% and silicon impurities at 0%, while maintaining deposition temperatures below 500°C, suitable for advanced semiconductor applications.