Adaptor of handler for testing electronic component

Abstract

The present invention relates to an adapter for a handler for testing electronic components. The adapter of the electronic component test handler according to the present invention has configurations capable of properly gripping electronic components having various manufacturing tolerances and lengths, and properly maintaining the seating state of the electronic components. According to the present invention, electronic components having various manufacturing tolerances and lengths can all be properly seated and gripped in the adapter during the manufacturing process while maintaining the seated position, so the electronic components can be accurately electrically connected to the tester, thereby improving the reliability of the handler.

Description

Technology Field

[0001] The present invention relates to an adapter that can be used in a handler for testing electronic components. Background Technology

[0002] Produced electronic components (e.g., semiconductor devices, substrates, SSDs, etc.) are tested by a tester, then separated into good and defective products, and only the good products are shipped.

[0003] Electronic components can only be tested when electrically connected to a tester; the equipment that supports testing electronic components by electrically connecting them to the tester is an electronic component test handler (hereinafter abbreviated as 'handler').

[0004] Handlers are being proposed and manufactured in conjunction with the development of new electronic components, and various subsequent developments are being carried out for stabilization.

[0005] Recently, the adoption of SSDs (Solid State Drives), large electronic components equipped with various electronic elements, has been expanding.

[0006] When the initial demand for SSDs was low and only small quantities were produced, SSDs were manually electrically connected to and disconnected from testers; however, as demand surged, supporting manual testing became difficult.

[0007] However, since the thickness, structure, and weight of the SSD are different from those of conventional electronic components, conventional handlers could not be applied as they are. Therefore, a handler suitable for supporting the test of large electronic components such as SSDs was developed and proposed in Korean published patents 10-2019-0050483 and 10-2019-0061291.

[0008] SSDs can come in various specifications depending on the types of embedded electronic components or their dedicated applications, and thus a handler is required to support testing of such diverse electronic components. However, since handlers are expensive and large in scale, technology is required to enable a single handler to process the testing of electronic components of various specifications, taking into account production costs and installation space.

[0009] In addition, testing electronic components with different specifications requires replacing parts that match the specifications of the corresponding components, and even if replacement is not necessary, downtime is required to supply new electronic components. Consequently, the utilization rate of handlers and testers decreases, and miscellaneous personnel are lost; therefore, there is a need for a handler that does not require separate downtime during single-cycle operation or continuous operation.

[0010] Meanwhile, for conventional mass-produced semiconductor devices, a test tray capable of holding hundreds or more devices is provided, and a method is adopted in which multiple pickers directly grasp the devices and insert them into the test tray's inserts. In such a system, since the precise positioning of the semiconductor devices is maintained both in the inserts and during the connection process with the tester, a slight decrease in precision was not considered a problem.

[0011] However, electronic components such as SSDs, which contain various electronic elements including semiconductors, are trending toward multi-product, small-batch production to accommodate the diversity of application devices. Furthermore, there are instances where various types of tests must be performed. Since the test sockets of all testers are not located in the same position, it has been necessary to manufacture expensive test trays and equip corresponding handlers for each type of electronic component and tester. Previous research has confirmed that connecting electronic components to test sockets while they are directly gripped by a gripper, without considering these factors, presents significant problems.

[0012] For example, electronic components possess a wide variety of lengths and widths corresponding to their types. Furthermore, due to manufacturing characteristics, it is difficult to produce components of the same type with 100% identical dimensions due to machining errors. However, if electronic components are attempted to be gripped by a gripper without considering these circumstances, the components may be lost due to improper gripping or damaged by excessive pressure. Of course, even if the gripper is adjusted to grip the components properly, it has been confirmed that a disadvantage exists where the components twist or rotate during gripping, making it difficult for the gripped components to make precise contact with the test socket. To improve this, precise control of the drive unit is required, and the drive shaft must be very long to accommodate all electronic components. Additionally, it is necessary to use expensive motors capable of situational torque control to prevent breakage, twisting, and unwanted rotation. However, this is not effective because it requires high production costs along with the enlargement of the equipment. In addition, it is necessary to implement precise contact by enabling auto-teaching to set the accurate gripping position of electronic components by the gripper, which requires truly enormous costs and technical expertise.

[0013] Generally, regardless of the type, the width of an SSD is the same within the range of manufacturing tolerance, but its length varies by type depending on the quantity or size of the mounted electronic components.

[0014] Therefore, the applicant of the present invention has previously proposed an invention (hereinafter referred to as the "prior application technology") in which an adapter is provided to a handler to enable the implementation of a universal handler, as disclosed in patent application No. 10-2020-0073725. The adapter is designed to function as a carrier used to supply electronic components to a tester, thereby adding universality to the handler by enabling it to adapt to many types of electronic components of different sizes.

[0015] The most important point regarding the adapter is as follows.

[0016] First, the adapter must be able to properly grip both ends of any SSD having a width within the error range due to manufacturing tolerances.

[0017] Second, it must be able to grasp all SSDs within the typical length range that an electronic component called an SSD can have (the range from the shortest SSD to the longest SSD).

[0018] Third, a structural feature is required to accurately seat the SSD in the adapter. Here, this structural feature may refer to the components surrounding the adapter, but it is also required for the adapter's own components. If there is a failure in the SSD's seating, it will cause interference with the proper electrical connection between the SSD and the tester in the future.

[0019] Fourth, the position of the SSD seated on the adapter must be maintained accurately. In most cases, the handler is subjected to various operational shocks, and the adapter must be moved while carrying electronic components. However, if the SSD fails to maintain proper seating due to operational shocks or shaking during movement, and a defect occurs, this also ultimately causes a failure in the electrical connection between the SSD and the tester.

[0020] Therefore, continuous research is needed on adapters that take all of the above points into account. The problem to be solved

[0021] The present invention was conceived from consideration of a technology that enables an adapter to properly grip various electronic components regardless of manufacturing tolerances or lengths within an error range.

[0022] Furthermore, the present invention was conceived from consideration of a technology capable of accurately mounting electronic components onto an adapter and continuously maintaining that state appropriately after mounting. means of solving the problem

[0023] The adapter of a handler for testing electronic components according to the present invention comprises: a pair of gripping levers that face each other and move linearly in a direction in which the distance between them narrows or widens, thereby gripping or releasing the rear end portion of an electronic component at both ends; an installation frame installed to enable linear movement of the pair of gripping levers; a gap operating mechanism installed on the installation frame for applying an operating force to the pair of gripping levers to move in a direction in which the distance between them widens; and an operating member that applies a pressure to the pair of gripping levers in a direction in which the distance between them narrows, so that when the operating force applied to the pair of gripping levers by the gap operating mechanism is removed, the pair of gripping levers can move in a direction in which the distance between them narrows; wherein the pair of gripping levers have guide grooves formed on mutually facing surfaces for gripping both ends of the electronic component and guiding movement in the front-rear direction, and the guide grooves are formed to be elongated in the front-rear direction.

[0024] The above gap operating mechanism is installed on the above installation frame to enable linear movement in the forward and backward directions, and the above gap operating mechanism has both ends in contact with the above pair of gripping levers, and when moving linearly backward by an external force, it applies an operating force to the above pair of gripping levers in a direction in which the gap between the above pair of gripping levers widens, and when moving linearly forward as the external force is removed, it has an operating part provided to release the operating force.

[0025] In the above pair of gripping levers, an operating groove is formed on the surface facing each other where contact is made with the operating part, and the operating groove is formed to have an inclined surface in which the depth of the indentation becomes shallower as it extends toward the rear, and the operating part has a protruding part corresponding to the operating groove, so that the gap between the pair of gripping levers changes according to the position of the operating member as the protruding part contacts the inclined surface.

[0026] The above operating member includes elastic members, one side of which is supported by the installation frame and the other side of which is installed to contact the pair of gripping levers.

[0027] The above-described installation frame has at least one positioning projection on each of the left and right sides that can be inserted into the positioning groove of a test hand for moving the adapter.

[0028] A receiving groove is formed in the shear portion of the above-mentioned installation frame to accommodate the shear portion of an electronic component, and support ledges are formed on the left and right walls forming the receiving groove to support both ends of the shear portion of the electronic component, so that the shear portion of the electronic component can be aligned in a structure in which it is inserted between the left and right walls forming the receiving groove and supported by the support ledges.

[0029] A mounting space in which an electronic component including the guide groove and the receiving groove is mounted is open in the front-rear direction.

[0030] The above guide groove has a horizontal maintaining section that maintains the lifespan of an electronic component held in a reclining state, a width increasing section in which the width in the vertical direction increases as it moves forward from the front end of the horizontal maintaining section, and an open section at the rear end of the width increasing section that has a width equal to or greater than the front end of the width increasing section.

[0031] The above adapter further includes a support member having a pair of support protrusions for supporting the bottom of an electronic component; wherein the pair of support protrusions have support ledges formed thereon to prevent downward displacement of the electronic component seated in a recessed position, and the pair of gripping levers have through grooves formed therein through which the support protrusions can pass.

[0032] The above-mentioned installation frame has at least one position fixing groove formed on each of the left and right sides into which position fixing pins of a mounting device for mounting the adapter can be inserted. Effects of the invention

[0033] According to the present invention, the following effects are achieved.

[0034] First, even if there are manufacturing tolerances during the production process, electronic components can be properly gripped and seated in the adapter.

[0035] Second, since electronic components of various lengths can all be properly seated on the adapter, the versatility of the handler can be improved.

[0036] Third, the seating state of the electronic component can be properly maintained due to the close gripping of the gripping lever by the elastic member, and the fact that the electronic component can be supported even during the posture change process by the step structure of the guide groove and support jaw.

[0037] Fourth, the rear end of the electronic component (ED) can be kept precisely flat in the horizontal maintenance section of the guide groove, thereby minimizing the possibility of failure in the electrical connection between the electronic component and the tester, and as a result, the reliability of the handler is improved. Brief explanation of the drawing

[0038] Figure 1 is a reference diagram for explaining the electrical connection structure between an electronic component and a tester. FIG. 2 is a conceptual structural diagram of a handler for testing electronic components to which an adapter according to one embodiment of the present invention is to be applied. Figure 3 is a schematic perspective view of the handler of Figure 2. FIG. 4 is a combined perspective view of an adapter according to a first embodiment of the present invention. Fig. 5 is an exploded perspective view of the adapter of Fig. 4. Figure 6 is an excerpt of the gripping lever applied to the adapter of Figure 4. Figure 7 is a hypothetical excerpt of the guide groove in the gripping lever of Figure 6. Figure 8 is a reference diagram for explaining the operation of the guide groove of Figure 7. Figure 9 is a reference diagram to explain the relationship between the adapter and the test hand of Figure 4. Specific details for implementing the invention

[0039] Preferred embodiments according to the present invention are described with reference to the accompanying drawings, provided that for the sake of brevity, descriptions of redundant or substantially identical components are omitted or compressed as much as possible.

[0040] <전자부품과 테스터의 전기적인 연결에 대한 설명>

[0041] The handler to which the adapter according to the present invention is applied is more appropriately applied in a case where the contact terminal side of an electronic component, such as an SSD, is inserted into the test slit of a tester.

[0042] For example, as shown in FIG. 1, the tester is equipped with a test slit (S), and the electronic component (ED) and the tester are electrically connected by inserting the contact terminal (T) side portion of the electronic component (ED) into the test slit (S).

[0043] <핸들러의 대구성에 대한 개략적인 설명>

[0044] FIG. 2 is a schematic plan view of a handler (HR) in which an adapter for an electronic component test handler according to the present invention (hereinafter abbreviated as 'adapter') can be used, and FIG. 3 is a schematic three-dimensional view of the handler (HR) of FIG. 2.

[0045] The handler (HR) according to the present embodiment includes a connecting part (CP), a stacker part (SP), and a transfer device (TA).

[0046] The connection part (CP) retrieves an electronic component (ED) to be tested from the customer tray and supplies it to the tester, or retrieves an electronic component (ED) that has finished testing from the tester and loads it onto the customer tray. The adapter according to the present invention is used in this connection part (CP).

[0047] The stacker section (SP) stores customer trays brought into the handler (HR) to supply customer trays containing electronic components (ED) to be tested to the connection section (CP), or stores customer trays containing electronic components (ED) that have finished testing after retrieving them from the connection section (CP) before releasing them from the handler. Additionally, the stacker section (SP) supplies the stored customer trays containing electronic components (ED) to be tested to the transfer device (TA), or retrieves customer trays containing electronic components (ED) that have finished testing from the transfer device (TA).

[0048] The transfer device (TA) transfers customer trays between the connection section (CP) and the stacker section (SP). That is, customer trays loaded with electronic components (ED) to be tested are transferred from the stacker section (SP) to the connection section (CP) by the transfer device (TA), and customer trays loaded with electronic components (ED) that have finished testing are transferred from the connection section (CP) to the stacker section (SP) by the transfer device (TA).

[0049] <어댑터가 관계하는 전자부품의 개략적인 흐름에 대한 설명>

[0050] As the handler (HR) has been explained in detail in the prior art, the flow focused on the adapter is described in outline.

[0051] With the adapter seated on the stand, a moving hand (not shown) retrieves an electronic component (ED) from a customer tray (CT) and places it onto the adapter. At this time, an opener (not shown) opens the adapter so that the moving hand can place the electronic component (ED) onto the adapter.

[0052] The adapter with the electronic component (ED) mounted thereon moves from the setting position to the gripping position along with the stand, and is erected by rotation. A test hand (not shown) grasps the erected adapter and moves to electrically connect the electronic component (ED) to the tester. Subsequently, when the test on the electronic component (ED) is completed, the reverse operation is performed to load the tested electronic component (ED) onto the customer tray (CT).

[0053] <제1 실시예에 따른 어댑터에 대한 설명>

[0054] FIG. 4 is an assembled perspective view of an adapter (100) according to a first embodiment of the present invention, and FIG. 5 is an exploded perspective view of the adapter (100) of FIG. 4.

[0055] The adapter (100) includes a pair of gripping levers (111, 112), an installation frame (120), a spacing mechanism (130), elastic members (141 to 144), and a support member (150).

[0056] A pair of gripping levers (111, 112) are provided facing each other and can move linearly in the left and right directions, with the distance between them narrowing or widening as they are guided by guide rods (125, 126) in the installation frame (120). Thus, when the distance between the pair of gripping levers (111, 112) narrows, the pair of gripping levers (111, 112) are in a state where they grip the rear end portion of the reciprocating electronic component (ED) at both ends. And when the distance between the pair of gripping levers (111, 112) widens, the pair of gripping levers (111, 112) are in an open state where they release the gripping of the electronic component (ED). Therefore, for the electronic component (ED) to be seated on the adapter (100) or withdrawn from the adapter (100) by the moving hand, a pair of gripping levers (111, 112) must be in an open state to release the grip of the electronic component (ED).

[0057] As shown in the excerpt of FIG. 6, a pair of gripping levers (111, 112) each have two operating grooves (OG) formed on their opposing surfaces.

[0058] The operating groove (OG) is formed at the contact point between the gripping lever (111, 112) and the gap operating mechanism (130). Two operating grooves (OG) located on each of the same gripping levers (111, 112) are formed side by side in the front-rear direction. Additionally, the operating groove (OG) is formed to have an inclined surface in which the depth of the groove becomes shallower as it extends toward the rear.

[0059] Additionally, as referenced in FIG. 6, a pair of gripping levers (111, 112) have a guide groove (GG) formed on the upper side of the operating groove (OG) on mutually facing surfaces, extending in the front-rear direction. This guide groove (GG) guides the movement of the electronic component (ED) during the process of the electronic component (ED) moving in the front-rear direction (for example, the process of moving an electronic component to be tested to be electrically connected to a tester, or the process of withdrawing an electronic component that has finished testing from the tester and moving it to an adapter). Furthermore, when the pair of gripping levers (111, 112) are gripping both ends of the rear portion of the electronic component (ED), both ends of the electronic component (ED) are inserted into the guide groove (GG) and caught in the up-and-down direction, so the guide groove (GG) also has the function of gripping the electronic component (ED).

[0060] The guide groove (GG) sequentially has a horizontal maintaining section (HM), a width increasing section (WG), a penetration section (TS), and an opening section (OS) in the direction from rear to front, as shown in the virtual excerpt of FIG. 7.

[0061] The horizontal maintaining section (HM) is formed such that its vertical width is narrow enough to be almost equal to the vertical thickness of the electronic component (ED), so that it can properly grip both ends of the electronic component (ED) while maintaining the horizontality of the area where the contact terminal (T) is located at the rear end of the electronic component (ED).

[0062] The width increase section (WG) is formed such that its width increases as it moves forward from the front of the horizontal maintenance section (HM). Accordingly, even if the electronic component (ED) sags due to gravity in an area other than the part adsorbed and gripped by the moving hand during the process of seating, both ends of the electronic component (ED) can be properly gripped by the two gripping levers (111, 112).

[0063] The penetration section (TS) is formed to have a constant width in the front-rear direction at the front of the width increase section (WG), and corresponds to the width in the front-rear direction of the penetration groove (TG) through which the left and right support protrusions of the support member (150) described later can pass.

[0064] The open section (OS) is formed to have a width that is at least equal to or greater than the shear of the width increase section (WG).

[0065] And the guide home (GG) is open in the front and back directions.

[0066] As shown above, the guide groove (GG) having the shape of FIG. 7 contributes to ensuring that the contact terminal (T) side is accurately inserted into the test slit (S) by maintaining the horizontality of the contact terminal (T) side portion, while eliminating potential problems in the adapter (100) gripping the electronic component (ED) even when the electronic component (ED) is bent in a certain direction as shown in the exaggerated drawing of FIG. 8.

[0067] The installation frame (120) is provided to install and support gripping levers (111, 112), spacing operating mechanism (130), elastic members (141 to 146) and support member (150).

[0068] The installation frame (120) has positioning projections (121) protruding to the left and right, respectively, on both the left and right sides of the shear portion.

[0069] The positioning protrusions (121) relate to the positioning groove (SG) formed on the gripping surface of the test hand (400) as shown in the reference diagram of FIG. 9. That is, when the test hand (400) grips the installation frame (120) and ultimately grips the adapter (100), the positioning protrusions (121) are inserted into the positioning groove (SG). Therefore, even if an external force is applied to the adapter (100) in the forward and backward directions while the test hand (400) is gripping the adapter (100), the position of the installation frame (120) is fixed and maintained, so the position of the adapter (100) can be fixed and maintained. It is sufficient to have at least one such positioning protrusion (121). Of course, depending on the implementation, the positioning groove may be formed on the installation frame (120) and the positioning protrusion may be formed on the test hand (400).

[0070] Additionally, the installation frame (120) has guide rods (125, 126) that are long in the left and right directions to guide the linear movement of a pair of gripping levers (111, 112) in the left and right directions. Of course, the gripping levers (111, 112) have through holes (TH) formed therein through which the guide rods (125, 126) are inserted and passed.

[0071] Additionally, a receiving groove (AG) is formed in the front portion of the installation frame (120) to accommodate the front portion of the electronic component (ED). Furthermore, a support ledge (J) is formed on the left and right walls forming the receiving groove (AG) to support both sides of the front portion of the electronic component. Thus, the structure is designed so that both sides of the front portion of the electronic component (ED) are supported by the support ledge (J) and are precisely inserted and aligned between the two walls, thereby ensuring proper seating and maintenance of proper seating of the electronic component (ED). Accordingly, the electronic component (ED) can be properly aligned even in a lying position, and the electronic component (ED) can be properly aligned even in a standing position due to a change in posture.

[0072] Similar to the guide groove (GG), the receiving groove (AG) is also open in the front-rear direction. This means that the mounting space of the adapter (100) on which the electronic component is mounted is open in the front-rear direction. In other words, the mounting space including the guide groove (GG) and the receiving groove (AG) is open in the front-rear direction. Therefore, electronic components (ED) of various lengths can all be mounted across the guide groove (GG) and the receiving groove (AG) without any length constraints.

[0073] The gap operating mechanism (130) is installed on the installation frame (120) and applies operating force to a pair of gripping levers (111, 112) to move in a direction that widens the gap between them. To this end, the gap operating mechanism (130) is installed on the installation frame (120) so that it can move in the forward and backward directions, and includes an operating part (131), a push plate (132), and a transmission rod (133).

[0074] The operating part (131) has two rolling rollers (R) on each of the left and right sides, and the rolling rollers (R) form protruding parts that protrude outward on both the left and right sides.

[0075] Rolling rollers (R) are provided at positions corresponding to the position of the operating groove (OG). Accordingly, the rolling rollers (R) come into contact with the surface forming the operating groove (OG) with a part of them inserted into the operating groove (OG). That is, both ends of the operating part (131) of the gap operating mechanism (130) come into contact with the gripping levers (111, 112) through the rolling rollers (R). Therefore, when the gap operating mechanism (130) moves backward, the rolling rollers (R) come into contact with the inclined surface where the depth of the groove (OG) becomes shallower as it moves, so the gap operating mechanism (130) naturally applies operating force to both gripping levers (111, 112) in a direction that widens the gap between the two gripping levers (111, 112).

[0076] Conversely, when the gap operating mechanism (130) moves forward, as it moves, the rolling rollers (R) come into contact with the inclined surface where the depth of the operating groove (OG) becomes deeper, so the operating force applied to both gripping levers (111, 112) is naturally released.

[0077] The push plate (132) receives an external force applied in the forward direction to the gap operating mechanism (130) by an opener (not shown). That is, the opener supplies a driving force that enables the gap operating mechanism (130) to move backward by applying force backward through the push plate (132), and the gap operating mechanism (130) moves backward by this driving force of the opener.

[0078] The transmission rod (133) has its front end fixedly connected to the push plate (132) and its rear end fixedly connected to the operating part (131), thereby transmitting the external force of the opening device that pushes the push plate (132) backward to the operating part (131).

[0079] The elastic members (141 to 144) are installed such that one side contacts the installation frame (120) and the other side contacts the gripping levers (111, 112). Accordingly, the elastic members (141 to 144) apply elastic force to the pair of gripping levers (111, 112) in a direction that narrows the gap between the pair of gripping levers (111, 112). Accordingly, when the operating force applied to the pair of gripping levers (111, 112) by the gap operating mechanism (130) is removed, the pair of gripping levers (111, 112) move in a direction that narrows the gap between them due to the elastic force of the elastic members (141 to 144), thereby gripping the electronic component (ED). From this perspective, the elastic members (141 to 144) function as operating members that generate and maintain a pressure that allows a pair of gripping levers (111, 112) to grip the electronic component (ED), and further function to close the adapter (100). Of course, motors or cylinders can be considered as operating members, but in order to accommodate all widths of the electronic component within the range of machining error without separate settings, it may be most desirable to configure the operating members with elastic members such as springs.

[0080] The elastic members (141 to 144) determine the spacing between a pair of gripping levers (111, 112) according to their degree of compression. This fact implies that the elastic members (141 to 144) also function as variable elements that vary the gripping width (the width that a pair of gripping levers must be spaced apart to grip electronic components) between a pair of gripping levers (111, 112). In other words, depending on the degree of compression of the elastic members (141 to 144), the gripping levers (111, 112) can grip electronic components (ED) having various widths.

[0081] A support member (150) is provided to prevent downward displacement of an electronic component (ED) that is seated in a reclining position when a pair of gripping levers (111, 112) are in a state where they release the gripping of the electronic component (ED). Accordingly, the support member (150) is provided with support projections protruding upward on both the left and right sides, and a support ledge (151) is formed on these support projections to support the lower end of the electronic component (ED).

[0082] The support member (150) is formed in a shape of approximately 'U' or 'U' and is fixed to the installation frame (120), and the support protrusions at both left and right ends protrude upward to pass through the through groove (FG), and have a support ledge (151) in the upper area of ​​the support protrusions. For reference, in this embodiment, the support member (150) is integrally provided with the installation frame (120), but depending on the implementation, it may be provided so as to be fixed to the installation frame (120) by a fixing means or detached from the installation frame (120).

[0083] The operation of the adapter (100) as described above will be explained.

[0084] As the initial or test-to-test electronic component (ED) is replaced, the operator places an adapter (100) that matches the specifications of the electronic component (ED) to be tested onto the stand. Afterward, when the moving hand intends to place the electronic component (ED) taken from the customer tray onto the adapter (100), the opener pushes the gap-operating mechanism (130) backward. At this time, since the installation frame (120) is fixed to the stand by the position-fixing groove (FG), only the gap-operating mechanism (130) moves backward by the pressure of the opener. During this process, as the rolling roller (R) moves backward while in contact with the inclined surface of the operation groove (OG), force is applied to the gripping levers (111, 112) in the left and right directions, thereby widening the gap between the two gripping levers (111, 112) and opening the adapter (100).

[0085] When the opening of the adapter (100) is completed, the moving hand places the electronic component (ED) onto the adapter (100). At this time, the rear portion of the electronic component (ED) is placed over the support ledge (151) of the support member (151), and the front portion of the electronic component (ED) is placed over the support ledge (J), so that the electronic component (ED) is placed on the adapter (100) while maintaining an accurate horizontal state.

[0086] Afterward, when the moving hand releases the grip on the electronic component (ED) and moves to another position, the opener removes the external force applied to the gap operating mechanism (130). Then, due to the elastic force of the elastic members (141 to 144), the gap between the two gripping levers (111, 112) is narrowed, and the gap operating mechanism (130) is pushed forward. During this process, the left and right ends of the electronic component (ED) are inserted into the guide grooves (GG) of the gripping levers (111, 112), thereby completing the gripping of the electronic component (ED) by the adapter (100). At this time, since the degree of compression / expansion of the elastic members (141 to 144) can naturally vary depending on the left and right width of the electronic component (ED) within the processing error range, the gripping elastic compression

[0087] At this time, due to the shape of the guide groove (GG), the rear end portion of the electronic component (ED) can be kept flat. Also, even if the electronic component (ED) is bent to a certain degree, the electronic component can be properly gripped by the gripping lever (111, 112) through the guide groove (GG). Furthermore, even if there is a wider tolerance in the left and right width of the electronic component (ED), the rear end portion of the electronic component (ED) does not get stuck in the wall forming the receiving groove (AG) because the width of the receiving groove (AG) is sufficiently wide.

[0088] Meanwhile, the adapter (100) that was seated on the stand is set up vertically. At this time, the bottom of the vertically positioned electronic component (ED) is supported by a wall surface where the guide groove (GG) forms a support ledge (J), so the seated state is properly maintained.

[0089] The vertically positioned adapter (100) is gripped by the test hand (400), and during this process, the positioning projection (121) is inserted into the positioning groove (SG). Accordingly, the adapter (100) is gripped by the test hand (400) so that it is positioned at an accurate setting position. Furthermore, since the position of the installation frame (120) can be fixed and maintained even with external forces applied to the adapter (100) in the future, the adapter (100) can ultimately also be fixed and maintained in that position.

[0090] When the test hand (400) moves the adapter (100) toward the tester side and the position between the adapter (100) and the test slit (S) is accurately set, the opening element in the test hand (300) pushes the gap manipulating mechanism (130) slightly to slightly widen the gap between the two gripping levers (111, 112), and in that state, the connecting element in the test hand (400) pushes the electronic component (ED) toward the test socket side so that the rear end portion of the electronic component (ED) with the contact terminal (T) is inserted into the test slit (S) in the test socket.

[0091] Then, when the test is finished, the adapter (100) is operated to secure the electronic component (ED), and then the electronic component (ED) is withdrawn from the test slit (S) by the test hand (400). The withdrawn electronic component (ED) is moved through the reverse process and is ultimately placed on the customer tray (CT).

[0092] As described above, the specific description of the present invention has been made through embodiments with reference to the attached drawings, but since the above-described embodiments are merely preferred examples of the present invention, the present invention should not be understood as being limited only to the above-described embodiments, and the scope of the rights of the present invention should be understood as the claims set forth below and their equivalents. Explanation of the symbols

[0093] 100: Adapter for electronic component test handler 111, 112: Grip lever GG : Guide Home HM: Horizontal maintenance section WG: Width amplification section OS: Open section OG : Control Home TH: Pass-through hole TG: Through groove 120 : Installation frame 121 : Position setting protrusion 125, 126 : Guide pole AG : Receiving home J : Support jaw 130 : Spacing manipulation mechanism 131 : Control section 141 to 144: Elastic members R : Cloud roller

Claims

Claim 1 A pair of gripping levers that face each other and move linearly in a direction in which the distance between them narrows or widens, thereby gripping or releasing the rear portion of an electronic component at both ends; an installation frame installed to enable the pair of gripping levers to move linearly; a gap operating mechanism installed on the installation frame for applying an operating force to the pair of gripping levers to move in a direction in which the distance between them widens; and an operating member that applies a pressure to the pair of gripping levers in a direction in which the distance between them narrows, so that when the operating force applied to the pair of gripping levers by the gap operating mechanism is removed, the pair of gripping levers can move in a direction in which the distance between them narrows. An adapter for an electronic component test handler comprising: a pair of gripping levers having guide grooves formed on mutually facing surfaces for gripping both ends of an electronic component and guiding movement in the front-rear direction; the guide grooves being formed elongated in the front-rear direction; the guide grooves having a horizontal maintaining section with an upper and lower width formed to maintain the horizontality of the contact terminal side portion at the rear end of the electronic component gripped in a reclining state; a width increasing section in which the width in the upper and lower direction widens as it moves forward from the front end of the horizontal maintaining section to allow gripping even when the electronic component is bent; and an open section in front of the width increasing section having a width equal to or greater than that of the front end of the width increasing section. Claim 2 An adapter for an electronic component test handler having: an operating part wherein, in claim 1, the gap operating mechanism is installed on the installation frame to enable linear movement in the forward and backward directions, and both ends of the gap operating mechanism are in contact with the pair of gripping levers, and when moving linearly backward by an external force, an operating force is applied to the pair of gripping levers in a direction in which the gap between the pair of gripping levers widens, and when moving linearly forward as the external force is removed. Claim 3 An adapter for an electronic component test handler according to claim 2, wherein the pair of gripping levers have operating grooves formed on mutually opposing surfaces in a portion that contacts the operating portion, the operating grooves are formed to have an inclined surface in which the depth of the indentation becomes shallower towards the rear, and the operating portion has a protruding portion corresponding to the operating grooves, so that the gap between the pair of gripping levers changes according to the position of the operating portion as the protruding portion contacts the inclined surface. Claim 4 An adapter for a handler for testing electronic components according to claim 1, wherein the operating member comprises elastic members installed such that one side is supported by the installation frame and the other side contacts the pair of gripping levers. Claim 5 The adapter of an electronic component test handler according to claim 1, wherein the mounting frame has at least one positioning projection on each of the left and right sides that can be inserted into a positioning groove of a test hand for moving the adapter. Claim 6 An adapter for an electronic component test handler according to claim 1, wherein a receiving groove is formed in the front portion of the installation frame to accommodate the front portion of the electronic component, and support ledges are formed in the left and right walls forming the receiving groove to support both ends of the front portion of the electronic component, so that the front portion of the electronic component can be aligned in a structure in which it is inserted between the left and right walls forming the receiving groove and supported by the support ledges. Claim 7 An adapter for an electronic component test handler according to claim 6, wherein a mounting space for mounting an electronic component including the guide groove and the receiving groove is open in the front-rear direction. Claim 8 delete Claim 9 An adapter for an electronic component test handler according to claim 1, further comprising: a support member having a pair of support protrusions for supporting the lower end of an electronic component; wherein the pair of support protrusions have support ledges formed thereon to prevent downward displacement of the electronic component seated in a recessed position, and the pair of gripping levers have through grooves formed therein through which the support protrusions can pass. Claim 10 An adapter for an electronic component test handler according to claim 1, wherein the mounting frame has at least one position fixing groove formed on each of the left and right sides into which position fixing pins of a mounting device for mounting the adapter can be inserted.

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