SYSTEM AND METHOD FOR DETECTING DEFECTS IN SPECULAR OR SEMI-SPECULAR SURFACES BY PHOTOGRAMMETRIC PROJECTION

MA43424AUndetermined Publication Date: 2018-10-17UNIV DE ZARAGOZA

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Patent Information

Application Number: MA43424
Authority / Receiving Office: MA · MA
Patent Type: Applications
Current Assignee / Owner
Priority Date: 2015-12-07
Filing Date: 2016-12-07
Publication Date: 2018-10-17

Application Information

Patent Timeline

07 Dec 2015

Priority

07 Dec 2016

Application

MA43424

17 Oct 2018

Publication

MA43424A

IPC: G01B11/30

CPC: G01B11/30; G01C11/025; G01C11/14; G01B11/25; G01N21/8806; G01N2021/8829

Inventors: AGUILAR MARTÍN Juan José; SAMPER CARNICER David

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