System and method for automated or semi-automated inspection of electronic assemblies

Abstract

The present invention provides a system for automated or semi-automated inspection of electronic assemblies, comprising at least one image capturing component (42) for capturing images of one or more electronic components of at least one electronic assembly (4) under inspection, at least one database (30) for storing one or more inspection recipes and the images, and one or more processors operating a plurality of modules that include any one or a combination of at least one inspection recipe validation module (211), and at least one inspection recipe optimization module (611). The inspection recipes are each executed by at least one processor for inspection of at least one electronic assembly (4) based on the images. Furthermore, the inspection recipe validation module (211) is configured to validate the inspection recipes. Moreover, the inspection recipe optimization module (611) is configured to optimize the inspection recipes based on the images, associated inspection results of the images, associated inspection verification categories of the images, or a combination thereof. A corresponding method is further described. (Fig. 1)