A test pin structure

Abstract

The embodiments of the present utility model relate generally to a test pin structure (100). The test pin structure (100) comprises a main body (101), a first pin leg (103) extending from one end of the main body (101), and a second pin leg (105) extending from another end of the main body (101). A counteracting pin portion (109) is connected to the free end of the first pin leg (103), and a needle pin (107) is disposed at a free end of the counteracting pin portion (109) configured to contact with a chip or device (2). This Utility model reduces minimizes lateral sliding of the needle pin (107), and supports stable, damage-free contact with the chip while maintaining a compact profile suitable for miniaturized test sockets.