Inspection system and method for recognizing the material composition of inspected objects.
TN2025000026A1Undetermined Publication Date: 2026-10-01OBSHHESTVO S OGRANICHENNOJ OTVETSTVENNOSTYU INDIKOM (OOO INDIKOM)
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Patent Information
- Application Number
- TN2025000026P0
- Authority / Receiving Office
- TN · TN
- Patent Type
- Applications
- Current Assignee / Owner
- Filing Date
- 2025-01-29
- Publication Date
- 2026-10-01
Abstract
An invention is proposed, that consists of a device for obtaining a radiographic image in backscattered radiation and a method for determining the material composition of an inspected object. The device contains an x-ray source with a mechanical scanning system, a detection system, a processor unit and a radiographic image display device. The detection system of the system is formed by an array of NaI(TI)-based scintillation spectrometers and has a large total sensitive surface area. Minimization of the array elements number is achieved by coupling of scintillation crystals and photodetectors through a light guide. The material composition is recognized as a result of comparing the measured energy distributions with references and is displayed on the radiographic image by means of pixel colour coding. The technical result achieved with the claimed invention consists in the increase of the radiographic image information content and in significant expansion of its functionality, which allows one, along with obtaining a radiographic image of the inspected object, to identify and display its material composition in the form of a specific image.
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