Test handler

Abstract

The present invention relates to a test handler. Specifically, according to one embodiment of the present invention, it includes: a test socket guide; and a working pressure plate, which is used to press an electronic component onto the test socket guide when the electronic component is placed on the test socket guide, so as to electrically connect the electronic component to the test socket guide. The working pressure plate includes: a pressure plate base; a pressure plate cover, which is combined with the pressure plate base and formed with a plate through hole; a pressure head, which is movably disposed in the plate through hole and can advance and retreat toward the electronic component to extend out of or retract into the plate through hole; and a pressure plate elastic component, which elastically supports the pressure head.