Test device and test method thereof

TW202627503APending Publication Date: 2026-07-01IND TECH RES INST
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Patent Information

Application Number
TW113151071
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Filing Date
2024-12-27
Publication Date
2026-07-01
Patent Text Reader

Abstract

A test device and a test method thereof are provided. The test device includes a plurality of connection lines, a plurality of first test circuits and a plurality of second test circuits. The plurality of first test circuits respectively generate a plurality of detection signals according to a plurality of first test data, and transmit the plurality of detection signals to the plurality of connection lines respectively. The plurality of second test circuits receive the plurality of detection signals through the plurality of connection lines, and the plurality of second test circuits compare the plurality of second test data with the plurality of detection signals to generate a plurality of test results.
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