Test device and test method thereof
TW202627503APending Publication Date: 2026-07-01IND TECH RES INST
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Patent Information
- Application Number
- TW113151071
- Authority / Receiving Office
- TW · TW
- Patent Type
- Applications
- Current Assignee / Owner
- Filing Date
- 2024-12-27
- Publication Date
- 2026-07-01
Abstract
A test device and a test method thereof are provided. The test device includes a plurality of connection lines, a plurality of first test circuits and a plurality of second test circuits. The plurality of first test circuits respectively generate a plurality of detection signals according to a plurality of first test data, and transmit the plurality of detection signals to the plurality of connection lines respectively. The plurality of second test circuits receive the plurality of detection signals through the plurality of connection lines, and the plurality of second test circuits compare the plurality of second test data with the plurality of detection signals to generate a plurality of test results.
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