Crispr repair in vitro screen (CRIS) off-target assessment

TW202628120APending Publication Date: 2026-07-01GENENTECH INC
View PDF 0 Cites 0 Cited by

Patent Information

Application Number
TW114133219
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2024-08-29
Filing Date
2025-08-29
Publication Date
2026-07-01
Patent Text Reader

Abstract

Disclosed herein are methods to assess off-target sites resulting from CRISPR Cas nuclease systems wherein the methods require fewer cells than conventional strategies and can provide robust signal reads over noise. Also provided are methods of identifying Cas nuclease off-target cut-sites from the resulting reads using a computational pipeline including an artificial neural network model trained on known on-target and off-target cut-sites for the Cas nuclease.
Need to check novelty before this filing date? Find Prior Art