Systems and methods for optimizing plasma generation in an EUV light source

TW202628486APending Publication Date: 2026-07-01ASML NETHERLANDS BV
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Patent Information

Application Number
TW114141555
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2024-10-29
Filing Date
2025-10-28
Publication Date
2026-07-01
Patent Text Reader

Abstract

Systems and methods for initializing an extreme ultraviolet (EUV) source are discussed. The EUV radiation source may include a droplet generator configured to generate a stream of droplets of a target material, a laser source communicatively coupled to a controller. The laser source is configured to generate a first pulsed beam of light, which upon interaction with a droplet, initiates a modification of a shape of the droplet, forming a modified droplet, and generate a second pulsed beam of light configured to substantially evaporate the modified droplet, thereby generating pulses of EUV light. The EUV radiation source comprises a first actuator communicatively coupled to the controller and configured to adjust a width of the second pulsed beam to minimize a variation of energy of the pulses of EUV light.
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