Apparatus and method for processing of substrate

TW202628866APending Publication Date: 2026-07-01WONIK IPS CO LTD
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Patent Information

Application Number
TW114116336
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2024-12-27
Filing Date
2025-04-30
Publication Date
2026-07-01
Patent Text Reader

Abstract

This invention provides a substrate processing apparatus, which may include: a process chamber forming a processing space and a controller for controlling the process chamber. The controller forms a warpage compensation layer on one side of a substrate mounted on a base within the process chamber, wherein a main layer and a buffer layer are alternately stacked at least once, and can control the density of the buffer layer to be lower than the density of the main layer.
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