Mechanisms for control of resolution and throughput for optical instruments, and methods of use thereof

TW202629975APending Publication Date: 2026-07-16VERITY INSTRUMENTS INC
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Patent Information

Application Number
TW115113429
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2024-03-22
Filing Date
2024-12-20
Publication Date
2026-07-16
Patent Text Reader

Abstract

The disclosure provides a system and method of use for improved configurability and control of resolution and throughput of imaging spectrometers useful for monitoring optical signals in semiconductor process tools. In one aspect a resolution and throughput control system for an optical instrument is disclosed. In one example, the resolution and throughput control system includes: (1) a payload, (2) an actuator, and (3) a movement device that alters light input for the optical instrument by controlling movement of the payload along a single axis in response to the actuator. The optical instrument can be, for example, a spectrometer.
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