Probe, test head comprising the same, and method of manufacturing the test head

Abstract

A test head and a method for manufacturing the test head are disclosed. The test head comprises a probe having a plurality of horizontally stacked, vertically extending metal sheets. A fixed bonding portion is provided between an upper end and a lower end of each metal sheet, wherein the fixed bonding portions of the plurality of metal sheets are joined together along the stacking direction. The upper ends of the plurality of metal sheets are not mutually joined, such that at least two upper ends are configured to upwardly abut a counterpart component. The lower ends of the plurality of metal sheets are also not mutually joined, such that at least two lower ends are configured to downwardly abut a device under test. The present invention reduces probe manufacturing cost and lowers contact end impedance, thereby enabling higher current transmission.

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