Electrical measurement methods, systems, and kits

TW202630032APending Publication Date: 2026-07-16寶紳電子集團公司
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Patent Information

Application Number
TW114142068
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2024-11-04
Filing Date
2025-10-30
Publication Date
2026-07-16
Patent Text Reader

Abstract

Electrical testing methods, systems, and kits are capable of powering, via a first power supply, an electrical system, performing, via a first electrical device, selective detection of at least two parameters of the electrical system, and detecting, via sensor(s) of a second electrical device, presence and / or flow of a parameter from a second power supply to the electrical system to derive parasitic draw of the electrical system. Memory settings of the electrical system are preserved via the second electrical device while the parasitic draw is derived. User input(s) selecting an electrical element of the electrical system are received via a third electrical device that stores impedance data of electrical elements. The third electrical device determines voltage drop across an electrical path passing through the electrical element, which the third electrical device uses to determine, in combination with the impedance identified by the impedance data, amperage of the electrical element.
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