Method of illumination

TW202630084APending Publication Date: 2026-07-16SYNCELL (TAIWAN) INC
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Patent Information

Application Number
TW114143149
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2024-11-05
Filing Date
2025-11-05
Publication Date
2026-07-16
Patent Text Reader

Abstract

An illumination method for illuminating a sample through a microscope system, comprising: setting information of a plurality of fields of view; acquiring, at a first magnification, a plurality of first images of the fields of view according to the information of the fields of view for correspondingly forming a plurality of first grids when the first images are collectively presented as a whole; selecting a region of interest among a plurality of second images of the fields of view, wherein the second images of the fields of view are the first images of the fields of view defined into a plurality of second grids for simulating observation of the sample at a second magnification, wherein the second magnification is larger than or equal to the first magnification; and illuminating the sample based on the region of interest, at the second magnification.
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