Flow control methods, equipment and media for spray systems
The flow control method in the spray device optimizes the mixing time of sulfuric acid and hydrogen peroxide to enhance photoresist removal efficiency by controlling inlet and outlet flow rates, achieving efficient and cost-effective substrate processing.
Patent Information
- Application Number
- TW114146296
- Authority / Receiving Office
- TW · TW
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2024-11-29
- Filing Date
- 2025-11-26
- Publication Date
- 2026-08-01
AI Technical Summary
Existing semiconductor substrate processing methods face challenges in ensuring that sulfuric acid and hydrogen peroxide are mixed in a spraying device for a predetermined time to achieve optimal photoresist removal efficiency.
A flow control method is implemented in a spray device to control the inlet flow rate by setting a target outflow rate and predetermined liquid level height, ensuring the mixing duration of sulfuric acid and hydrogen peroxide within the device for a second predetermined time, thereby achieving a better adhesive removal effect on the substrate surface.
The method ensures the formation of carboxylic acid at optimal concentrations and temperatures, enhancing the photoresist removal efficiency while reducing the amount of sulfuric acid used and minimizing process time and costs.